IP Library Granted Patent US 9,660,062
Granted Patent B2
US 9,660,062 · App. 15/133,657 · Granted May 23, 2017

Bidirectional HEMT and an electronic package including the bidirectional HEMT

Inventors: Balaji Padmanabhan (Tempe, AZ); Prasad Venkatraman (Gilbert, AZ); Chun-Li Liu (Mesa, AZ); Peter Moens (Erwetegem, BE)
Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
H01L29/747H01L23/4952H01L23/49524H01L23/49541H01L23/49562H01L23/49575H01L24/40H01L25/115H01L27/088H01L27/0883H01L29/205H01L29/404H01L29/4238H01L29/742H01L29/7416H01L29/7786H01L29/7787H03K17/6874H01L2224/0603H01L2224/40245H01L2224/48247H03K2017/6878H03K2217/0009H03K2217/0018
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,660,062
App. No.
15/133,657
Granted
May 23, 2017
Kind
B2
Abstract

An electronic device can include a bidirectional HEMT. In an aspect, a packaged electronic device can include the bidirectional HEMT can be part of a die having a die substrate connection that is configured to be at a fixed voltage, electrically connected to drain/source or source/drain depending on current flow through the bidirectional HEMT, or electrically float. In another aspect, the electronic device can include Kelvin connections on both the drain/source and source/drain side of the circuit. In a further embodiment, a circuit can include the bidirectional HEMT, switch transistors, and diodes with breakdown voltages to limit voltage swings at the drain/source and source/drain of the switch transistors.

Claims (63)

1. A circuit, comprising:

a first transistor including a source and a drain;

a bidirectional HEMT including a drain/source and a source/drain;

a second transistor including a source and a drain;

a first diode having an anode and a cathode; and

a second diode having an anode and a cathode,

wherein:

the drain of the first transistor is coupled to the drain/source of the bidirectional HEMT transistor;

the source/drain of the bidirectional HEMT transistor is coupled to the drain of the second transistor;

the cathode of the first diode is coupled to the source of the first transistor;

the anode of the first diode is coupled to the anode of the second diode; and

the cathode of the second diode is coupled to the source of the second transistor; and

wherein a die substrate of a die that includes the bidirectional HEMT is configured to be at a fixed voltage, switched between the sources of the first and second transistors depending on desired current flow through the circuit, or electrically float.

2. The circuit of claim 1 , wherein the bidirectional HEMT includes a first gate coupled to the cathode of the first diode, and a second gate coupled to the cathode of the second diode.

3. The circuit of claim 1 , wherein the bidirectional HEMT is a depletion mode transistor.

4. The circuit of claim 1 , wherein the first and second transistors are enhancement mode transistors.

5. The circuit of claim 1 , wherein the first and second transistors are Si MOSFETs.

6. The circuit of claim 1 , wherein the bidirectional HEMT and first and second transistors are parts of a same die.

7. The circuit of claim 1 , wherein the bidirectional HEMT is on a different die as compared to the first and second diodes.

8. The circuit of claim 1 , wherein each of the first and second diodes has a breakdown voltage sufficient to support a nominal designed voltage difference between the source of the first transistor and the source of the second transistor.

9. A packaged electronic device, comprising:

a bidirectional circuit including:

a bidirectional HEMT including a drain/source and a source/drain;

a drain/source bond pad;

a first Kelvin bond pad, wherein the drain/source of the bidirectional HEMT, the drain/source bond pad, and first Kelvin bond pad are spaced apart from one another;

a source/drain bond pad; and

a second Kelvin bond pad, wherein the source/drain of the bidirectional HEMT, the source/drain bond pad, and second Kelvin bond pad are spaced apart from one another;

a drain/source package lead that is electrically connected to the drain/source bond pad via a first connector;

a first Kelvin package lead that is electrically connected to the first Kelvin bond pad via a second connector, wherein the first Kelvin package lead is spaced apart from the drain/source package lead;

a source/drain package lead that is electrically connected to the source/drain bond pad via a third connector; and

a second Kelvin package lead that is electrically connected to the second Kelvin bond pad via a fourth connector, wherein the second Kelvin package lead is spaced apart from the source/drain package lead.

10. The packaged electronic device of claim 9 , further comprising a die substrate package lead, wherein the bidirectional HEMT is part of a die that includes a die substrate, wherein the die substrate is conductively attached to the die substrate package lead.

11. The packaged electronic device of claim 9 , further comprising a fifth package lead and a sixth package lead, wherein:

the bidirectional HEMT circuit further includes:

a first transistor including a first gate coupled to a first gate bond pad, wherein the first transistor is coupled between the drain/source package lead and the drain/source bond pad of the bidirectional HEMT; and

a second transistor including a second gate coupled to a second gate bond pad, wherein the second transistor coupled between the source/drain package lead and the source/drain bond pad of the bidirectional HEMT;

the first gate package lead is electrically connected to the first gate bond pad via a fifth connector; and

the second gate package lead is electrically connected to the second gate bond pad via a sixth connector.

12. The packaged electronic device of claim 9 , wherein:

the bidirectional HEMT circuit includes:

a first transistor coupled between the drain/source package lead and the drain/source bond pad of the bidirectional HEMT; and

a second transistor coupled between the source/drain package lead and the source/drain bond pad of the bidirectional HEMT;

the bidirectional HEMT and the first and second transistors are parts of different die;

the die of the first transistor is mounted over the die of the bidirectional HEMT; and

the die of the second transistor is mounted over the die of the bidirectional HEMT.

13. The packaged electronic device of claim 9 , wherein:

the bidirectional HEMT circuit includes:

a first transistor coupled between the drain/source package lead and the drain/source bond pad of the bidirectional HEMT; and

a second transistor coupled between the source/drain package lead and the source/drain bond pad of the bidirectional HEMT;

the bidirectional HEMT and the first and second transistors are parts of a same die.

14. A packaged electronic device, comprising:

a bidirectional HEMT circuit and including a bidirectional HEMT over a die substrate of a die and including a drain/source and a source/drain;

a drain/source package lead coupled to a drain/source of the bidirectional HEMT;

a source/drain package lead coupled to a source/drain of the bidirectional HEMT;

a die substrate package lead coupled to the die substrate of the die; and

the die substrate package lead is configured to be at a fixed voltage, electrically connected to a drain/source or a source/drain of the bidirectional HEMT circuit depending on current flow through the bidirectional HEMT circuit, or electrically float.

15. The packaged electronic device of claim 14 , further comprising a drain/source bond pad of the bidirectional HEMT coupled to the drain/source package lead, and a source/drain bond pad of the bidirectional HEMT coupled to the source/drain package lead.

16. The packaged electronic device of claim 15 , further comprising a first gate package lead and a second gate package lead, wherein the bidirectional HEMT circuit further comprises:

a first transistor coupled between the drain/source package lead and the drain/source bond pad of the bidirectional HEMT, wherein the first transistor has a first gate coupled to a first gate bond pad; and

a second transistor coupled between the source/drain package lead and the source/drain bond pad of the bidirectional HEMT, wherein the second transistor has a second gate coupled to a second gate bond pad.

17. The packaged electronic device of claim 16 , wherein the bidirectional HEMT, the first transistor, and the second transistor are on the same die.

18. The packaged electronic device of claim 16 , wherein the bidirectional HEMT, the first transistor, and the second transistor are on different die.

19. The packaged electronic device of claim 15 , wherein the packaged electronic device does not include a Kelvin package lead.

Assignments (4)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 041187, FRAME 0295 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064151/0203 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 27, 2017
From: LIU, CHUN-LI
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 041384/0257 →
SECURITY INTEREST Recorded Dec 23, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 041187/0295 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 6, 2016
From: VENKATRAMAN, PRASAD; MOENS, PETER; PADMANABHAN, BALAJI
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 038813/0438 →
Continuity (3)
Provisional Application 62154705 · Apr 30, 2015
Provisional Application 62154775 · Apr 30, 2015
Related Publication 20160322485A1 · Nov 3, 2016