IP Library Granted Patent US 10,192,715
Granted Patent B2
US 10,192,715 · App. 15/134,422 · Granted Jan 29, 2019

Measurement of the electric current profile of particle clusters in gases and in a vacuum

Inventor: Uwe Renner (Leipzig, DE)
H01J37/244G01N27/622H01J49/0095H01J49/025H01J49/26H01J2237/24405H01J2237/24535
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Quick Facts
Patent No.
US 10,192,715
App. No.
15/134,422
Granted
Jan 29, 2019
Kind
B2
Abstract

The invention relates to the measurement of current profiles of free-flying ion or electron clusters which impinge on a detector electrode of a Faraday detector. The detector electrode here consists of a large number of structural elements in a bipolar arrangement, where neighboring structural elements have opposite polarities and structural elements with the same polarity are electrically connected, and a voltage is applied between neighboring structural elements so that before ions or electrons impinge on the detection electrode, they are essentially deflected onto the structural elements with one of the two polarities. If the current profiles on the structural elements of the two polarities are measured separately and subtracted from each other, a current profile which corresponds to the pure ion or electron current profile is obtained without using a screen grid.

Claims (29)

1. A Faraday detector to measure the electric current profile of clusters of electrically charged particles, comprising:

a detector electrode having structural elements in a bipolar arrangement of two groups, where neighboring structural elements have opposite polarities and structural elements with the same polarity are electrically connected, and bordering a gas-filled or evacuated space;

at least one voltage supply which is connected with the two groups of structural elements and supplies the two groups of structural elements simultaneously with different electric potentials such that charged particles originating from the space are substantially all deflected onto one of the two groups of structural elements having one polarity; and

a set of measurement electronics which is configured to separately measure current profiles at the structural elements of both polarities and to generate a differential signal by subtracting the current profiles to leave only a particle current profile.

2. The Faraday detector according to claim 1 , wherein the detector electrode is a bipolar line grid.

3. The Faraday detector according to claim 1 , wherein the detector electrode has a pixel-like structure or a mosaic structure.

4. The Faraday detector according to claim 1 , wherein the detector electrode has a structure of concentric circles or spirals or a labyrinthine structure.

5. The Faraday detector according to claim 1 , wherein the detector electrode is planar.

6. The Faraday detector according to claim 1 , wherein the structural elements are arranged on a support.

7. The Faraday detector according to claim 6 , wherein the support has an insulating or high-resistance conducting surface.

8. The Faraday detector according to claim 1 , wherein the structural elements of the detector electrode are mechanically unsupported.

9. The Faraday detector according to claim 1 , wherein the measurement electronics comprises current-to-voltage converters and a differential amplifier connected to the current-to-voltage converters for generating the differential signal.

10. The Faraday detector according to claim 1 , wherein the measurement electronics comprises two analog-to-digital converters for converting the current profiles into two separate digital data streams, from which the differential signal is generated by a digital circuit.

11. The Faraday detector according to claim 1 , wherein the width and separation of the structural elements are less than 1000 μm.

12. The Faraday detector according to claim 11 , wherein the width and separation of the structural elements is between 50 and 250 μm.

13. A ion mobility spectrometer, comprising a Faraday detector according to claim 1 .

14. A mass spectrometer, comprising a secondary-electron multiplier for generating electrons and a Faraday detector according to claim 1 for detecting the electrons generated in the secondary-electron multiplier.

15. The mass spectrometer according to claim 14 , wherein the secondary-electron multiplier is a multichannel plate.

16. The mass spectrometer according to claim 15 , wherein the mass spectrometer is a time-of-flight mass spectrometer.

17. A method for the measurement of the electric current profile of free-flying clusters of electrically charged particles which impinge on a Faraday detector electrode, wherein:

the detector electrode comprises a number of structural elements in a bipolar arrangement, where neighboring structural elements have opposite polarities and all structural elements of the same polarity are connected together;

a voltage is simultaneously applied between the two groups of structured elements of different polarities so that shortly before the incoming particles impinge, they are substantially all deflected in such a way that they hit only one of the two groups of structural elements having one polarity;

current profiles at the structural elements of both polarities are each measured separately; and the two current profiles are subtracted from each other, where the image current profiles which are formed in both groups of structural elements in practically the same way are subtracted from each other and a current profile is obtained which corresponds to a pure particle current.

18. The method according to claim 17 , wherein a weighting is carried out when the two current profiles are subtracted by applying a weighting factor to one of the two current profiles prior to the subtraction, the weighting factor being selected to minimize distortion in a resulting current profile.

19. The method according to claim 17 , wherein the free-flying particle clusters are ions in a mobility spectrometer.

20. The method according to claim 17 , wherein the free-flying particle clusters are electrons which are generated by ions in a multichannel plate in a mass spectrometer.

21. The method according to claim 17 , wherein the detector electrode is a bipolar line grid.

22. The method according to claim 17 , wherein the detector electrode is a pixel-like structure or a mosaic structure.

23. The method according to claim 17 , wherein the detector electrode has a structure of concentric circles, concentric spirals or a labyrinthine structure.

Assignments (5)
NUNC PRO TUNC ASSIGNMENT Recorded Feb 18, 2022
From: BRUKER OPTIK GMBH
To: BRUKER OPTICS GMBH & CO. KG
Reel/Frame 059049/0058 →
CORRECTIVE ASSIGNMENT TO CORRECT THE THE PATENT NUMBER 7411268 WITH PATENT NUMBER 7511268 PREVIOUSLY RECORDED AT REEL: 050308 FRAME: 0867. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Sep 11, 2019
From: BRUKER DALTONIK GMBH
To: BRUKER OPTIK GMBH
Reel/Frame 050800/0721 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 9, 2019
From: BRUKER DALTONIK GMBH
To: BRUKER OPTIK GMBH
Reel/Frame 050308/0867 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 28, 2016
From: RENNER, UWE
To: BRUKER DALTONIK, GMBH
Reel/Frame 038403/0840 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 28, 2016
From: RENNER, UWE
To: BRUKER DALTONIK, GMBH
Reel/Frame 038405/0858 →
Priority Claims (1)
DE 10 2015 106 418 · Apr 27, 2015 · national
Continuity (1)
Related Publication 20160314932A1 · Oct 27, 2016