IP Library Granted Patent US 10,002,970
Granted Patent B2
US 10,002,970 · App. 15/137,087 · Granted Jun 19, 2018

Semiconductor device, manufacturing method of the same, or display device including the same

Inventors: Junichi Koezuka (Tochigi, JP); Masami Jintyou (Tochigi, JP); Yoshiaki Oikawa (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L29/78648G02F1/1368G02F1/13624G06F3/044G06F3/0416H01L27/1225H01L27/1251H01L29/42384H01L29/49H01L29/4908H01L29/78645H01L29/78687G06F2203/04103
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Quick Facts
Patent No.
US 10,002,970
App. No.
15/137,087
Granted
Jun 19, 2018
Kind
B2
Abstract

To provide a novel semiconductor device including an oxide semiconductor film. The semiconductor device includes a first transistor and a second transistor. The first transistor includes a first gate electrode, a first insulating film over the first gate electrode, a first oxide semiconductor film over the first insulating film, a source electrode electrically connected to the first oxide semiconductor film, a drain electrode electrically connected to the first oxide semiconductor film, a second insulating film over the first oxide semiconductor film, a second oxide semiconductor film functioning as a second gate electrode, over the second insulating film, and a third insulating film over the second oxide semiconductor film. The second transistor includes a third oxide semiconductor film including a channel region, a source region, and a drain region over the second insulating film, a fourth insulating film over the channel region, a third gate electrode over the fourth insulating film, and the third insulating film over the source region and the drain region.

Claims (75)

1. A semiconductor device comprising:

a first transistor; and

a second transistor,

wherein the first transistor includes:

a first gate electrode;

a first insulating film over the first gate electrode;

a first oxide semiconductor film over the first insulating film;

a source electrode electrically connected to the first oxide semiconductor film;

a drain electrode electrically connected to the first oxide semiconductor film;

a second insulating film over the first oxide semiconductor film;

a second oxide semiconductor film functioning as a second gate electrode, over the second insulating film; and

a third insulating film over the second oxide semiconductor film,

wherein the second transistor includes:

a third oxide semiconductor film over the second insulating film, the third oxide semiconductor film including a channel region, a source region, and a drain region;

a fourth insulating film over the channel region;

a third gate electrode over the fourth insulating film; and

the third insulating film over the source region and the drain region.

2. The semiconductor device according to claim 1 ,

wherein the first oxide semiconductor film, the second oxide semiconductor film, and the third oxide semiconductor film each include In, M, and Zn, and

wherein M is Al, Ga, Y, or Sn.

3. The semiconductor device according to claim 1 ,

wherein at least one of the first oxide semiconductor film, the second oxide semiconductor film, and the third oxide semiconductor film includes a multilayer structure.

4. The semiconductor device according to claim 1 ,

wherein at least one of the first oxide semiconductor film, the second oxide semiconductor film, and the third oxide semiconductor film includes a crystal part, and

wherein the crystal part has c-axis alignment.

5. The semiconductor device according to claim 1 ,

wherein the first gate electrode and the second gate electrode are electrically connected to each other.

6. The semiconductor device according to claim 1 ,

wherein the second transistor further includes:

a source electrode electrically connected to the source region; and

a drain electrode electrically connected to the drain region.

7. The semiconductor device according to claim 1 ,

wherein the third insulating film includes one of or both hydrogen and nitrogen.

8. An electronic device comprising:

the semiconductor device according to claim 1 ; and

one of an operation key and a battery.

9. A display device comprising:

a driver circuit portion; and

a pixel portion,

wherein the driver circuit portion includes a first transistor, the first transistor including:

a first gate electrode;

a first insulating film over the first gate electrode;

a first oxide semiconductor film over the first insulating film;

a source electrode electrically connected to the first oxide semiconductor film;

a drain electrode electrically connected to the first oxide semiconductor film;

a second insulating film over the first oxide semiconductor film;

a second oxide semiconductor film functioning as a second gate electrode, over the second insulating film; and

a third insulating film over the second oxide semiconductor film, and

wherein the pixel portion includes a second transistor, the second transistor including:

a third oxide semiconductor film over the second insulating film, the third oxide semiconductor film including a channel region, a source region, and a drain region;

a fourth insulating film over the channel region;

a third gate electrode over the fourth insulating film; and

the third insulating film over the source region and the drain region.

10. The display device according to claim 9 ,

wherein the first oxide semiconductor film, the second oxide semiconductor film, and the third oxide semiconductor film each include In, M, and Zn, and

wherein M is Al, Ga, Y, or Sn.

11. The display device according to claim 9 ,

wherein at least one of the first oxide semiconductor film, the second oxide semiconductor film, and the third oxide semiconductor film includes a multilayer structure.

12. The display device according to claim 9 ,

wherein at least one of the first oxide semiconductor film, the second oxide semiconductor film, and the third oxide semiconductor film includes a crystal part, and

wherein the crystal part has c-axis alignment.

13. The display device according to claim 9 ,

wherein the first gate electrode and the second gate electrode are electrically connected to each other.

14. The display device according to claim 9 ,

wherein the second transistor further includes:

a source electrode electrically connected to the source region; and

a drain electrode electrically connected to the drain region.

15. The display device according to claim 9 ,

wherein the third insulating film includes one of or both hydrogen and nitrogen.

16. A display module comprising:

the display device according to claim 9 ; and

a touch sensor.

17. An electronic device comprising:

the display device according to claim 9 ; and

one of an operation key and a battery.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 30, 2016
From: KOEZUKA, JUNICHI; JINTYOU, MASAMI; OIKAWA, YOSHIAKI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 038744/0956 →
Priority Claims (1)
JP 2015-093133 · Apr 30, 2015 · national
Continuity (1)
Related Publication 20160322395A1 · Nov 3, 2016