Pressure sensor device and method for testing the pressure sensor device

1. A method for testing a pressure sensor device comprising a first pressure sensor and a second pressure sensor, the method comprising:

providing the first and second pressure sensors, the first and second pressure sensors having at least one parameter that is different with respect to each other;

determining, using a signal processing device, a first capacitance relationship between the first and second pressure sensors and first and second reference capacitors;

determining, using the signal processing device, a second capacitance relationship between the first and second pressure sensors and the first and second reference capacitors;

determining, using the signal processing device, a fault detection signal based on a difference between the first and second capacitance relationships;

detecting, using the signal processing device, that the difference is outside a predetermined limit using the fault detection signal; and

providing the fault detection signal to indicate that the pressure sensor device has failed, wherein the method eliminates the need for the first and second pressure sensors to be matched by using the at least one different parameter to provide a consistent known relationship between the capacitances of the first and second pressure sensors.

2. The method of claim 1 , wherein the parameter further comprises the first pressure sensor being more sensitive to pressure changes than the second pressure sensor.

3. The method of claim 1 , wherein determining a first capacitance relationship further comprises determining a difference capacitance using the first and second pressure sensors and the first and second reference capacitors.

4. The method of claim 1 , wherein the second capacitance relationship further comprises determining a common mode capacitance using the first and second pressure sensors and the first and second reference capacitors.

5. The method of claim 1 , wherein the method for testing is characterized as being a self-diagnostic test.

6. The method of claim 1 , wherein the first capacitance relationship further comprises determining a first temperature coefficient and the second capacitance relationship further comprises determining a second temperature coefficient.

7. The method of claim 1 , wherein the parameter comprises the first pressure sensor having a dimension that is larger than a corresponding dimension of the second pressure sensor.

8. A method for testing a pressure sensor device comprising a first pressure sensor and a second pressure sensor, the method comprising:

providing the first and second pressure sensors, the first and second pressure sensors having at least one parameter that is different with respect to each other;

determining, using a signal processing device, a first relationship using the first and second pressure sensors and first and second reference capacitors;

detecting, using the signal processing device, that the first relationship is outside a predetermined limit; and

indicating, using the signal processing device, that the pressure sensor device has failed, wherein the method eliminates the need for the first and second pressure sensors to be matched by using the at least one different parameter to provide a consistent known relationship between the capacitances of the first and second pressure sensors.

9. The method of claim 8 , wherein determining a first relationship further comprises determining a temperature coefficient offset between the first and second pressure sensors.

10. The method of claim 9 , wherein determining a temperature coefficient offset further comprises:

determining a first offset at a first temperature;

determining a second offset at a second temperature different than the first temperature; and

calculating the temperature coefficient offset using the first and second offsets.

11. The method of claim 10 , wherein the first and second offsets are determined during manufacture of the pressure sensor device.

12. The method of claim 8 , further comprising:

determining a second relationship between the first and second pressure sensors,

wherein the step of detecting further comprises detecting that a difference between the first relationship and the second relationship is outside a predetermined limit.

13. The method of claim 12 , wherein the first relationship is characterized as being a capacitance difference and the second relationship is characterized as being a common mode capacitance.

14. The method of claim 8 , wherein the method for testing is a self-diagnostic method for testing.

15. The method of claim 8 , wherein the first and second reference capacitors are matched with respect to each other.

16. A pressure sensor device, comprising:

a first pressure sensing capacitor having a first capacitance value; and

a second pressure sensing capacitor having a second capacitance value, wherein at least one parameter of the first pressure sensing capacitor is different from that of the second pressure sensing capacitor so that the second capacitance value is different from the first capacitance value in response to exposure to a same pressure.

17. The pressure sensor device of claim 16 , wherein the first and second pressure sensing capacitors are micro-electro-mechanical systems (MEMS) cells.

18. The pressure sensor device of claim 16 , wherein the first pressure sensing capacitor has a dimension that is different from a corresponding dimension of the second pressure sensing capacitor.

19. The pressure sensor device of claim 16 , wherein the first and second pressure sensing capacitors are implemented on an integrated circuit device.

20. The pressure sensor device of claim 16 , further comprising first and second reference capacitors, the first and second reference capacitors are substantially matched with respect to each other.