IP Library Granted Patent US 9,570,605
Granted Patent B1
US 9,570,605 · App. 15/150,225 · Granted Feb 14, 2017

Semiconductor device having a plurality of source lines being laid in both X and Y directions

Inventor: Steven Thomas Peake (Stockport, GB)
Assignee: NXP B.V.
H01L29/7813H01L27/0207H01L29/1083H01L29/66734
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Quick Facts
Patent No.
US 9,570,605
App. No.
15/150,225
Granted
Feb 14, 2017
Kind
B1
Abstract

A device is disclosed. The device includes a semiconductor substrate, a plurality of source lines formed on a surface of the semiconductor substrate. The plurality of source lines are laid in both X and Y directions. The device further includes a plurality of gate lines laid out over source lines in X direction in the plurality of source lines, a source contact line that connects source lines in the plurality of source lines that are terminating in Y direction, a gate contact line that connects the plurality of gate lines and a drain contact.

Claims (15)

1. A device comprising:

a semiconductor substrate;

a plurality of source lines formed on a surface of the semiconductor substrate, wherein the plurality of source lines are laid in both X and Y directions;

a plurality of gate lines laid out over source lines in X direction in the plurality of source lines;

a source contact line that connects source lines in the plurality of source lines that are terminating in Y direction;

a gate contact line that connects the plurality of gate lines; and

a drain contact.

2. The device of claim 1 , wherein the surface of the semiconductor substrate includes an epitaxial layer.

3. The device of claim 2 , wherein top surface of the epitaxial layer includes a p-type body implant.

4. The device of claim 1 , wherein n-type layers run along the source lines in the plurality of source lines in Y direction.

5. The device of claim 1 , wherein the gate lines protrude the surface of the semiconductor surface.

6. The device of claim 1 , further including an isolation layer between the source layer and the gate layer.

7. The device of claim 6 , wherein the isolation layer exists only in X direction.

8. The device of claim 1 , wherein a distance between individual source lines in the plurality of source lines is user defined based for desired electrical characteristics of the device.

9. The device of claim 1 , further includes an isolation layer buried in trenches to cover buried parts of the plurality of source lines.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 13, 2017
From: NXP B.V.
To: NEXPERIA B.V.
Reel/Frame 041002/0454 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 9, 2016
From: PEAKE, STEVEN THOMAS
To: NXP B.V.
Reel/Frame 038645/0297 →