Die stacks with one or more bond via arrays of wire bond wires and with one or more arrays of bump interconnects
An apparatus relating generally to a die stack is disclosed. In such an apparatus, a substrate is included. A first bond via array includes first wires each of a first length extending from a first surface of the substrate. An array of bump interconnects is disposed on the first surface. A die is interconnected to the substrate via the array of bump interconnects. A second bond via array includes second wires each of a second length different than the first length extending from a second surface of the die.
1. An apparatus, comprising:
a substrate;
a first bond via array with first wire bond wires (“first wires”) each of a first length extending from base bonding structures thereof on a first surface of the substrate;
an array of bump interconnects disposed on the first surface of the substrate;
a package interconnected to the substrate via the array of bump interconnects coupled to a first surface of the package;
a second bond via array with second wire bond wires (“second wires”) each of a second length different than the first length extending from a second surface of the package opposite the first surface of the package;
a first surface of each of a first die and a second die is coupled to each of the first bond via array and the second bond via array;
a heat sink covering the first die, the second die, and the package; and
a thermal paste disposed to couple a second surface opposite the first surface of each of the first die and the second die to an interior surface of the heat sink.
2. The apparatus according to claim 1 , wherein the second bond via array is disposed interior to the first bond via array and the first length is greater than the second length.
3. The apparatus according to claim 1 , wherein the array of bump interconnects is disposed within the first bond via array.
4. The apparatus according to claim 1 , wherein:
the second length is less than the first length for coupling the first surface of each of the first die and the second die to each of the first bond via array and the second bond via array; and
the first surface of each of the first die and the second die partially extend over the second surface of the package respectively from opposite sides of the package.
5. The apparatus according to claim 1 , wherein the substrate is an interposer.
6. An apparatus, comprising:
a substrate;
a bond via array with wire bond wires (“wires”) extending from a first surface of the substrate;
a first array of bump interconnects disposed on the first surface of the substrate;
a first surface of a package interconnected to the substrate via the first array of bump interconnects;
a second array of bump interconnects disposed on a second surface of the package opposite the first surface of the package;
wherein the wires of the bond via array are of a length;
wherein the second array of bump interconnects are of a height less than the length for coupling a first surface of each of a first die and a second die to the bond via array and the second array of bump interconnects;
a heat sink covering the first die, the second die, and the package; and
a thermal paste disposed to couple a second surface opposite the first surface of each of the first die and the second die to an interior surface of the heat sink.
7. The apparatus according to claim 6 , wherein the first surface of each of the first die and the second die partially extend over the second surface of the package respectively from opposite sides of the package.
8. The apparatus according to claim 6 , wherein the second array of bump interconnects is disposed interior to the bond via array.
9. The apparatus according to claim 6 , wherein the first array of bump interconnects is disposed within the bond via array.
10. The apparatus according to claim 6 , wherein the substrate is an interposer.
11. An apparatus, comprising:
a first substrate;
a first bond via array with first wire bond wires (“first wires”) each of a first length extending from a first surface of the first substrate;
an array of bump interconnects disposed on the first surface of the first substrate;
a second substrate interconnected to the first substrate via the array of bump interconnects coupled to a first surface of the second substrate; and
a second bond via array with second wire bond wires (“second wires”) each of a second length different than the first length extending from a second surface of the second substrate opposite the first surface of the second substrate.
12. The apparatus according to claim 11 , wherein the second bond via array is disposed interior to the first bond via array and the first length is greater than the second length.
13. The apparatus according to claim 11 , wherein the array of bump interconnects is disposed within the first bond via array.
14. The apparatus according to claim 11 , wherein:
the second length is less than the first length for coupling a first surface of each of a first die and a second die to each of the first bond via array and the second bond via array; and
the first surface of each of the first die and the second die partially extend over the second surface of the second substrate respectively from opposite sides of the second substrate.
15. The apparatus according to claim 12 , further comprising:
a heat sink covering the first die, the second die, and the second substrate; and
a thermal paste disposed to couple a second surface opposite the first surface of each of the first die and the second die to an interior surface of the heat sink.
16. The apparatus according to claim 11 , wherein the first substrate is an interposer.