IP Library Granted Patent US 9,739,832
Granted Patent B2
US 9,739,832 · App. 15/205,527 · Granted Aug 22, 2017

Test messaging demodulate and modulate on separate power pads

Inventor: Lee D. Whetsel (Parker, TX)
Assignee: Texas Instruments Incorporated
G01R31/31723G01R31/2851G01R31/2884G01R31/3177G01R31/31721G01R31/31917G01R31/31919
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,739,832
App. No.
15/205,527
Granted
Aug 22, 2017
Kind
B2
Abstract

The present disclosure describes a novel method and apparatus for using a device's power and ground terminals as a test and/or debug interface for the device. According to the present disclosure, messages are modulated over DC voltages applied to the power terminals of a device to input test/debug messages to the device and output test/debug messages from the device. The present disclosure advantageously allows a device to be tested and/or debugged without the device having any shared or dedicated test or debug interface terminals.

Claims (12)

1. An integrated circuit comprising:

A. a first power pad, a second power pad, and a ground pad;

B. functional circuitry having functional input and output leads and having a first power lead, a second power lead, and a ground lead coupled to the power and ground pads;

C. test circuitry having test leads connected to the functional circuitry and having a first device test lead and a second device test lead extending from the test circuitry, the first and second device test leads being free of the functional input and output leads;

D. input test messaging and control circuitry having a test input lead and a test circuitry lead connected to the first device test lead;

E. output test messaging and control circuitry having a test output lead and a test circuitry lead connected to the second device test lead;

F. demodulation circuitry having an input coupled to the first power pad and an output coupled to the test input lead of the input test messaging and control circuitry;

G. modulation circuitry having an output coupled to the second power pad and an input coupled to the test output lead of the output test messaging and control circuitry;

H. first filter circuitry connecting the first power pad to the first power input lead between the input of the demodulation circuitry and the first power lead; and

I. second filter circuitry connecting the second power pad to the second power input lead between the output of the modulation circuitry and the second power lead.

2. The integrated circuit of claim 1 including a capacitor connecting the input of the demodulation circuitry to the first power terminal.

3. The integrated circuit of claim 1 including a capacitor connecting the output of the modulation circuitry to the second power terminal.

Continuity (9)
Division 14599849 · Jan 19, 2015
Division 13941844 · Jul 15, 2013
Division 12955513 · Nov 29, 2010
Division 12434312 · May 1, 2009
Division 11854327 · Sep 12, 2007
Provisional Application 60825476 · Sep 13, 2006
Provisional Application 60825481 · Sep 13, 2006
Provisional Application 60825488 · Sep 13, 2006
Related Publication 20160320453A1 · Nov 3, 2016