IP Library › Granted Patent US 9,799,619
Granted Patent B2
US 9,799,619 · App. 15/209,298 · Granted Oct 24, 2017

Electronic device having a redistribution area

Inventors: Jeonggi Jin (Seoul, KR); Kyu-Ha Lee (Yongin-si, KR); Jinho Chun (Seoul, KR); Byunglyul Park (Seoul, KR); Jinho An (Seoul, KR)
Assignee: Samsung Electronics Co., Ltd.
H01L24/09H01L21/78H01L23/3171H01L24/08H01L25/117H01L25/50H01L2224/0231H01L2224/0233H01L2224/0401H01L2224/08059H01L2224/08111H01L2225/0652H01L2225/06541
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Quick Facts
Patent No.
US 9,799,619
App. No.
15/209,298
Granted
Oct 24, 2017
Kind
B2
Abstract

An electronic device includes an upper insulating layer on a substrate. An upper redistribution structure is embedded in the upper insulating layer. The upper redistribution structure includes an upper contact portion, an upper pad portion, and an upper line portion between the upper contact portion and the upper pad portion. A passivation layer is on the upper insulating layer and the upper redistribution structure. An upper opening is configured to pass through the passivation layer and expose the upper pad portion. Vertical thicknesses of the upper pad portion and the upper contact portion are greater than a vertical thickness of the upper line portion.

Claims (68)

1. An electronic device, comprising:

an upper insulating layer on a substrate;

an upper redistribution structure embedded in the upper insulating layer, wherein the upper redistribution structure comprises an upper contact portion, an upper pad portion, and an upper line portion between the upper contact portion and the upper pad portion;

a passivation layer on the upper insulating layer and the upper redistribution structure; and

an upper opening configured to pass through the passivation layer and expose the upper pad portion,

wherein vertical thicknesses of the upper pad portion and the upper contact portion are greater than a vertical thickness of the upper line portion; and

wherein the upper redistribution structure comprises a first conductive material layer and a second conductive material layer;

wherein the first conductive material layer covers a lower surface and lateral surfaces of the second conductive material layer; and

wherein an upper surface of the first conductive material layer is substantially coplanar with an upper surface of the second conductive material layer.

2. The electronic device of claim 1 , wherein:

the upper insulating layer has an upper contact opening, an upper line recess, and an upper pad opening;

the upper contact opening and the upper pad opening pass through the upper insulating layer; and

the upper line recess connects an upper portion of the upper contact opening to an upper portion of the upper pad opening.

3. The electronic device of claim 2 , wherein:

the upper contact portion is in the upper contact opening;

the upper pad portion is in the upper pad opening; and

the upper line portion is in the upper line recess.

4. The electronic device of claim 1 , wherein upper surfaces of the first and second conductive material layers are lower than an upper surface of the upper insulating layer relative to the substrate.

5. The electronic device of claim 1 , wherein the upper insulating layer is formed of a photosensitive polyimide material.

6. The electronic device of claim 1 , further comprising:

a lower insulating layer between the upper insulating layer and the substrate; and

a lower redistribution structure in the lower insulating layer and comprising a lower contact portion, a lower pad portion, and a lower line portion disposed between the lower contact portion and the lower pad portion.

7. The electronic device of claim 6 , wherein:

the lower insulating layer comprises a lower contact opening, a lower line recess, and a lower pad recess;

the lower contact opening passes through the lower insulating layer;

the lower line recess and the lower pad recess do not pass through the lower insulating layer;

the lower contact portion is in the lower contact opening;

the lower pad portion is in the lower pad recess; and

the lower line portion is in the lower line recess.

8. The electronic device of claim 6 , wherein the lower contact portion has a greater vertical thickness than the lower line portion and the lower pad portion.

9. The electronic device of claim 1 , further comprising a connection pattern on the upper pad portion exposed by the upper opening.

10. The electronic device of claim 1 , wherein an upper surface of the upper contact portion, an upper surface of the upper pad portion, and an upper surface of the upper line portion are substantially coplanar with each other.

11. An electronic device, comprising:

a semiconductor chip;

a molding pattern on lateral surfaces of the semiconductor chip;

a redistribution area configured to cover the semiconductor chip and the molding pattern; and

a connection pattern on the redistribution area,

wherein the redistribution area comprises:

an upper insulating layer configured to cover the semiconductor chip and the molding pattern;

a passivation layer on the upper insulating layer; and

an upper redistribution structure in the upper insulating layer,

the upper redistribution structure comprises an upper contact portion, an upper pad portion, and an upper line portion between the upper contact portion and the upper pad portion,

the upper redistribution structure comprises a first upper conductive material layer and a second upper conductive material layer,

the first upper conductive material layer covers a lower surface and lateral surfaces of the second upper conductive material layer; and

wherein an upper surface of the first upper conductive material layer is substantially coplanar with an upper surface of the second upper conductive material layer.

12. The electronic device of claim 11 , wherein the connection pattern is on the upper pad portion of the upper redistribution structure and overlaps the molding pattern.

13. The electronic device of claim 11 , wherein the upper pad portion has a greater vertical thickness than the upper line portion.

14. The electronic device of claim 11 , further comprising a lower redistribution structure disposed under the upper redistribution structure,

wherein the lower redistribution structure comprises a lower contact portion, a lower pad portion, and a lower line portion between the lower contact portion and the lower pad portion.

15. The electronic device of claim 14 , wherein:

the lower pad portion has a same vertical thickness as the lower line portion; and

the upper pad portion has a greater vertical thickness than the upper line portion.

16. An electronic device, comprising:

a substrate;

a lower insulating layer on the substrate;

a lower redistribution structure in the lower insulating layer;

an upper insulating layer on the lower insulating layer; and

an upper redistribution structure in the upper insulating layer, the upper redistribution structure comprising an upper contact portion, an upper pad portion, and an upper line portion that connects the upper contact portion to the upper pad portion, the upper contact portion extending through the upper insulating layer to contact the lower redistribution structure;

wherein the upper redistribution structure comprises a first conductive material layer and a second conductive material layer, and

wherein the first conductive material layer extends from a lower surface of the second conductive material layer to an upper surface of the second conductive material layer to cover whole side surfaces of the second conductive material layer.

17. The electronic device of claim 16 , wherein a vertical thickness of the upper contact portion is greater than a vertical thickness of the upper line portion, and a vertical thickness of the upper pad portion is greater than the vertical thickness of the upper line portion.

18. The electronic device of claim 17 , wherein an upper surface of the upper redistribution structure is lower than an upper surface of the upper insulating layer relative to the substrate; and

wherein an upper surface of the lower redistribution structure is lower than an upper surface of the lower insulating layer relative to the substrate.

19. The electronic device of claim 18 , further comprising:

a passivation layer on the upper insulating layer; and

a connection pattern that extends through an opening in the passivation layer to contact the upper pad portion.

20. The electronic device of claim 19 , wherein a planar area of the upper pad portion is greater than a planar area of the upper contact portion; and

wherein the planar area of the upper pad portion is greater than a planar area of a bottom of the connection pattern that contacts the upper pad portion.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 13, 2016
From: JIN, JEONGGI; LEE, KYU-HA; CHUN, JINHO; PARK, BYUNGLYUL; AN, JINHO
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 039331/0759 →
Priority Claims (1)
KR 10-2015-0118173 · Aug 21, 2015 · national
Continuity (1)
Related Publication 20170053882A1 · Feb 23, 2017