IP Library Granted Patent US 10,222,201
Granted Patent B2
US 10,222,201 · App. 15/210,576 · Granted Mar 5, 2019

Visual depth measurement gage

Inventors: Steven Taffet (South Windsor, CT); Anton Banks (Manchester, CT)
Assignee: United Technologies Corporation
G01B11/22B23K9/1274B23K31/02B23K31/125G01B11/026G01B11/0608
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Quick Facts
Patent No.
US 10,222,201
App. No.
15/210,576
Granted
Mar 5, 2019
Kind
B2
Abstract

Systems and methods for depth measurement are described herein. A depth measurement device may comprise a first light source configured to direct a first beam of light, a second light source configured to direct a second beam of light, and a mirror. The mirror may be for viewing at least one of the first beam of light and the second beam of light. The depth measurement device may further comprise a housing. The depth measurement device may further comprise an eyepiece. The first beam of light and the second beam of light may be configured to intersect at a desired location. The eyepiece may be configured to maintain a consistent line-of-sight between the eyepiece, the mirror, and the desired location. In various embodiments, the second beam of light may be oriented at an acute angle with respect to the first beam of light.

Claims (35)

1. A depth measurement device comprising:

a first light source configured to direct a first beam of light;

a second light source configured to direct a second beam of light;

a mirror for viewing at least one of the first beam of light and the second beam of light;

wherein the first beam of light and the second beam of light are configured to intersect at a desired distance from the first and second light sources; and

the depth measurement device indicates a position of an object surface relative to the desired distance based upon a distance between a first location of the object surface intersected by the first light beam and a second location of the object surface intersected by the second light beam.

2. The depth measurement device of claim 1 , wherein the second beam of light is oriented at an acute angle with respect to the first beam of light.

3. The depth measurement device of claim 1 , further comprising a housing and an eyepiece coupled to the housing.

4. The depth measurement device of claim 3 , wherein the desired distance corresponds to a distance between the housing and an internal feature.

5. The depth measurement device of claim 4 , wherein at least one of the internal feature, the first beam of light, or the second beam of light are viewable through the eyepiece via the mirror.

6. The depth measurement device of claim 4 , wherein the depth measurement device is configured to indicate that the internal feature is located at the desired distance in response to the first beam of light and the second beam of light coinciding at the internal feature.

7. The depth measurement device of claim 4 , further comprising a third light source for illuminating at least the internal feature.

8. The depth measurement device of claim 1 , wherein the mirror comprises a visible marking for indicating a relative location of the first beam of light with respect to the second beam of light.

9. A depth measurement device comprising:

a first light source configured to direct a first beam of light towards an internal feature;

a second light source configured to direct a second beam of light towards the internal feature; and

a mirror for viewing at least a portion of the first beam of light and the second beam of light;

wherein the first beam of light and the second beam of light are configured to intersect at a desired distance from the first and second light sources; and

the depth measurement device indicates a position of an object surface relative to the desired distance based upon a distance between a first location of the internal feature intersected by the first light beam and a second location of the internal feature intersected by the second light beam.

10. The depth measurement device of claim 9 , wherein the mirror comprises a visible marking for indicating a relative location of the first beam of light with respect to the second beam of light.

11. The depth measurement device of claim 10 , wherein the location of the internal feature is indicated in response to the relative location of the first beam of light with respect to the second beam of light.

12. The depth measurement device of claim 9 , further comprising a housing, at least one of the first light source, the second light source, and the mirror being coupled to the housing.

13. The depth measurement device of claim 12 , further comprising an eyepiece for viewing the mirror.

14. The depth measurement device of claim 12 , wherein the housing comprises a transparent surface comprising a visible marking for indicating a relative location of the first beam of light with respect to the second beam of light.

15. The depth measurement device of claim 14 , wherein the first beam of light and the second beam of light pass through the transparent surface.

16. The depth measurement device of claim 9 , wherein at least one of the first light source and the second light source comprise a laser source.

17. A method of measuring an internal feature of a member comprising:

placing a depth measurement device over an opening of the member, the internal feature being visible via the opening;

directing a first beam of light towards an internal feature, the first beam of light being generated by a first light source coupled to the depth measurement device;

directing a second beam of light towards the internal feature, the second beam of light being generated by a second light source coupled to the depth measurement device;

directing the first beam of light and the second beam of light to intersect at a desired distance from the first and second light sources,

reflecting, by a mirror, at least a portion of the first beam of light and the second beam of light; and

indicating a position of the internal feature relative to the desired distance based upon a distance between the first light beam and the second light beam at a surface of the internal feature.

18. The method of claim 17 , further comprising:

determining if the first beam of light and the second beam of light intersect at the internal feature.

Assignments (5)
CHANGE OF NAME Recorded Jul 27, 2023
From: RAYTHEON TECHNOLOGIES CORPORATION
To: RTX CORPORATION
Reel/Frame 064714/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE AND REMOVE PATENT APPLICATION NUMBER 11886281 AND ADD PATENT APPLICATION NUMBER 14846874. TO CORRECT THE RECEIVING PARTY ADDRESS PREVIOUSLY RECORDED AT REEL: 054062 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF ADDRESS. Recorded Mar 4, 2021
From: UNITED TECHNOLOGIES CORPORATION
To: RAYTHEON TECHNOLOGIES CORPORATION
Reel/Frame 055659/0001 →
CHANGE OF NAME Recorded Sep 4, 2020
From: UNITED TECHNOLOGIES CORPORATION
To: RAYTHEON TECHNOLOGIES CORPORATION
Reel/Frame 054062/0001 →
CHANGE OF NAME Recorded Jun 15, 2020
From: UNITED TECHNOLOGIES CORPORATION
To: RAYTHEON TECHNOLOGIES CORPORATION
Reel/Frame 052945/0194 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2016
From: TAFFET, STEVEN; BANKS, ANTON
To: UNITED TECHNOLOGIES CORPORATION
Reel/Frame 039161/0538 →
Continuity (1)
Related Publication 20180017378A1 · Jan 18, 2018