IP Library › Granted Patent US 10,374,189
Granted Patent B2
US 10,374,189 · App. 15/234,657 · Granted Aug 6, 2019

Opto-electronic element and method for manufacturing the same

Inventor: Dong Chan Kim (Gunpo-si, KR)
Assignee: Samsung Display Co., Ltd.
H01L51/5234H01L27/124H01L27/3276H01L33/42H01L33/62H01L51/5008H01L51/5206H01L51/5215H01L27/322H01L2227/323H01L2251/5346H01L2933/0016H01L2933/0066
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Quick Facts
Patent No.
US 10,374,189
App. No.
15/234,657
Granted
Aug 6, 2019
Kind
B2
Abstract

An opto-electronic element according to an exemplary embodiment of the present disclosure includes a transparent conductive layer including a first material made of a metal and a second material made of a metal halide.

Claims (69)

1. An opto-electronic element comprising:

a transparent conductive layer formed by a reaction of a first material made of a metal and a second material made of a metal halide,

wherein the transparent conductive layer is a single layer,

wherein the metal halide of the second material comprises at least one selected from the group consisting of chloride, bromide and iodide of Group 1 elements, chloride, bromide and iodide of Group 2 elements, Lanthanide halides, Actinide halides, halides of transition metals, and halides of post transition metals, and

wherein the metal of the first material comprises at least one selected from the group consisting of Yb, Tm, Sm, Eu, Gd, La, Ce, Pr, Nd, Pm, Tb, Dy, Ho, Er, Lu, Ac, Th, and Pa.

2. The opto-electronic element of claim 1 , wherein:

a valence electron number of the metal of the first material is equal to or greater than a valence electron number of the metal of the metal halide included in the second material.

3. The opto-electronic element of claim 1 , wherein:

the metal of the first material comprises at least one selected from the group consisting of Group 1 elements, Group 2 elements, Lanthanide elements, Actinide elements, transition metals, and post transition metals.

4. The opto-electronic element of claim 1 , wherein:

the metal halide of the second material comprises at least one selected from the group consisting of YbF 2 , YbF 3 , SmF 2 , SmF 3 , EuF 2 , EuF 3 , TmF 2 , TmF 3 , CuF, TlF, AgF, CdF 2 , HgF 2 , SnF 2 , PbF 2 , BiF 3 , ZnF 2 , MnF 2 , FeF 2 , GeF 2 , CoF 2 , NiF 2 , AlF 3 , ThF 4 , UF 3 , LiCl, NaCl, KCl, RbCl, CsCl, BeCl 2 , MgCl 2 , CaCl 2 , SrCl 2 , BaCl 2 , YbCl 2 , YbCl 3 , SmCl 2 , SmCl 3 , EuCl 2 , EuCl 3 , TmCl 2 , TmCl 3 , CuCl, TlCl, AgCl, CdCl 2 , HgCl 2 , SnCl 2 , PbCl 2 , BiCl 3 , ZnCl 2 , MnCl 2 , FeCl 2 , GeCl 2 , CoCl 2 , NiCl 2 , AlCl 3 , ThCl 4 , UCl 3 , LiBr, NaBr, KBr, RbBr, CsBr, BeBr 2 , MgBr 2 , CaBr 2 , SrBr 2 , BaBr 2 , YbBr 2 , YbBr 3 , SmBr 2 , SmBr 3 , EuBr 2 , EuBr 3 , TmBr 2 , TmBr 3 , CuBr, TlBr, AgBr, CdBr 2 , HgBr 2 , SnBr 2 , PbBr 2 , BiBr 3 , ZnBr 2 , MnBr 2 , FeBr 2 , GeBr 2 , CoBr 2 , NiBr 2 , AlBr 3 , ThBr 4 , UBr 3 , LiI, NaI, KI, RbI, CsI, BeI 2 , MgI 2 , CaI 2 , SrI 2 , BaI 2 , YbI 2 , YbI 3 , SmI 2 , SmI 3 , EuI 2 , EuI 3 , TmI 2 , TmI 3 , CuI, TlI, AgI, CdI 2 , HgI 2 , SnI 2 , PbI 2 , BiI 3 , ZnI 2 , MnI 2 , FeI 2 , GeI 2 , CoI 2 , NiI 2 , AlI 3 , ThI 4 , and UI 3 .

5. The opto-electronic element of claim 1 , wherein:

the transparent conductive layer comprises more of the first material than the second material.

6. The opto-electronic element of claim 1 , wherein:

the transparent conductive layer comprises a same amount of the first material and the second material, or the transparent conductive layer comprises more of the second material than the first material.

7. The opto-electronic element of claim 1 , further comprising:

a metal oxide layer on the transparent conductive layer.

8. The opto-electronic element of claim 7 , wherein:

the metal oxide layer comprises ITO and/or IZO.

9. The opto-electronic element of claim 1 , further comprising:

a first electrode;

an emission layer on the first electrode; and

a second electrode on the emission layer, and

at least one of the first electrode and the second electrode comprises the transparent conductive layer.

10. The opto-electronic element of claim 9 , wherein:

the first electrode is a reflective electrode, and the second electrode comprises the transparent conductive layer.

11. The opto-electronic element of claim 9 , wherein:

the emission layer is to emit white light by a combination of a plurality of emission layers.

12. The opto-electronic element of claim 11 , wherein:

the plurality of emission layers comprises two layers or three layers.

13. The opto-electronic element of claim 12 , wherein:

the plurality of emission layers comprises two layers, and light emitted from the plurality of emission layers is mixed to emit white light.

14. The opto-electronic element of claim 12 , wherein:

the plurality of emission layers comprises three layers, and the plurality of emission layers are to respectively emit red light, green light, and blue light; or blue light, yellow light, and blue light.

15. The opto-electronic element of claim 12 , further comprising:

a charge generation layer between the plurality of emission layers.

16. The opto-electronic element of claim 9 , wherein:

at least one of the first electrode and the second electrode comprises a lower region comprising more of the first material than the second material, and an upper region comprising more of the second material than the first material.

17. The opto-electronic element of claim 16 , wherein:

in the at least one of the first electrode and the second electrode, an amount of the first material increases from an upper side to a lower side, and an amount of the second material increases from the lower side to the upper side.

18. The opto-electronic element of claim 16 , further comprising:

a metal oxide layer on the upper region, and the metal oxide layer comprises ITO and/or IZO.

19. A method for manufacturing an opto-electronic element, the method comprising:

forming a transparent conductive layer by a reaction of a first material made of a metal and a second material made of a metal halide,

wherein the transparent conductive layer is a single layer,

wherein the metal halide of the second material comprises at least one selected from the group consisting of chloride, bromide and iodide of Group 1 elements, chloride, bromide and iodide of Group 2 elements, Lanthanide halides, Actinide halides, halides of transition metals, and halides of post transition metals, and

wherein the metal of the first material comprises at least one selected from the group consisting of Yb, Tm, Sm, Eu, Gd, La, Ce, Pr, Nd, Pm, Tb, Dy, Ho, Er, Lu, Ac, Th, and Pa.

20. The method of claim 19 , wherein:

the metal halide of the second material comprises at least one selected from the group consisting of YbF 2 , YbF 3 , SmF 2 , SmF 3 , EuF 2 , EuF 3 , TmF 2 , TmF 3 , CuF, TlF, AgF, CdF 2 , HgF 2 , SnF 2 , PbF 2 , BiF 3 , ZnF 2 , MnF 2 , FeF 2 , GeF 2 , CoF 2 , NiF 2 , AlF 3 , ThF 4 , UF 3 , LiCl, NaCl, KCl, RbCl, CsCl, BeCl 2 , MgCl 2 , CaCl 2 , SrCl 2 , BaCl 2 , YbCl 2 , YbCl 3 , SmCl 2 , SmCl 3 , EuCl 2 , EuCl 3 , TmCl 2 , TmCl 3 , CuCl, TlCl, AgCl, CdCl 2 , HgCl 2 , SnCl 2 , PbCl 2 , BiCl 3 , ZnCl 2 , MnCl 2 , FeCl 2 , GeCl 2 , CoCl 2 , NiCl 2 , AlCl 3 , ThCl 4 , UCl 3 , LiBr, NaBr, KBr, RbBr, CsBr, BeBr 2 , MgBr 2 , CaBr 2 , SrBr 2 , BaBr 2 , YbBr 2 , YbBr 3 , SmBr 2 , SmBr 3 , EuBr 2 , EuBr 3 , TmBr 2 , TmBr 3 , CuBr, TlBr, AgBr, CdBr 2 , HgBr 2 , SnBr 2 , PbBr 2 , BiBr 3 , ZnBr 2 , MnBr 2 , FeBr 2 , GeBr 2 , CoBr 2 , NiBr 2 , AlBr 3 , ThBr 4 , UBr 3 , LiI, NaI, KI, RbI, CsI, BeI 2 , MgI 2 , CaI 2 , SrI 2 , BaI 2 , YbI 2 , YbI 3 , SmI 2 , SmI 3 , EuI 2 , EuI 3 , TmI 2 , TmI 3 , CuI, TlI, AgI, CdI 2 , HgI 2 , SnI 2 , PbI 2 , BiI 3 , ZnI 2 , MnI 2 , FeI 2 , GeI 2 , CoI 2 , NiI 2 , AlI 3 , ThI 4 , and UI 3 .

21. The method of claim 19 , further comprising:

forming a first electrode;

forming an emission layer on the first electrode; and

forming a second electrode on the emission layer,

wherein at least one of the forming of the first electrode and the forming of the second electrode comprises depositing a lower layer comprising the first material and an upper layer comprising the second material on the lower layer, diffusing the first material and the second material, and forming the transparent conductive layer.

22. The method of claim 21 , wherein:

during the forming of the transparent conductive layer, the metals included in the first material and the second material are substituted with each other.

23. The method of claim 22 , wherein:

the first material is distributed more than the second material in a lower side of the transparent conductive layer.

24. The method of claim 21 , further comprising:

forming a metal oxide layer on the transparent conductive layer.

25. The method of claim 21 , wherein:

at least one of the forming of the first electrode and the forming of the second electrode utilizes a solution method, a thermal evaporation method, a physical vapor deposition method, and/or a chemical vapor deposition method.

26. The method of claim 21 , wherein:

the first electrode is a reflective electrode, and the second electrode comprises the transparent conductive layer.

27. The method of claim 19 , further comprising:

forming a first electrode;

forming an emission layer on the first electrode; and

forming a second electrode on the emission layer, and

at least one of the forming of the first electrode and the forming of the second electrode comprises co-depositing the first material and the second material to form the transparent conductive layer.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE ADDRESS AND COUNTRY CODE PREVIOUSLY RECORDED AT REEL: 039410 FRAME: 0659. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Sep 19, 2016
From: KIM, DONG CHAN
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 040076/0063 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 11, 2016
From: KIM, DONG CHAN
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 039410/0659 →
Priority Claims (1)
KR 10-2015-0163056 · Nov 20, 2015 · national
Continuity (1)
Related Publication 20170148953A1 · May 25, 2017