IP Library Granted Patent US 9,793,469
Granted Patent B2
US 9,793,469 · App. 15/259,408 · Granted Oct 17, 2017

Magnetoresistive element and magnetic memory

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Quick Facts
Patent No.
US 9,793,469
App. No.
15/259,408
Granted
Oct 17, 2017
Kind
B2
Abstract

A magnetoresistive element according to an embodiment includes: a first magnetic layer; a second magnetic layer; a first nonmagnetic layer disposed between the first magnetic layer and the second magnetic layer; a third magnetic layer disposed between the first magnetic layer and the first nonmagnetic layer; and a layer having an amorphous structure, the layer containing two or more elements that are contained in the first magnetic layer, the layer being disposed between the first magnetic layer and the third magnetic layer.

Claims (53)

1. A magnetoresistive element comprising:

a first magnetic layer;

a second magnetic layer;

a first nonmagnetic layer disposed between the first magnetic layer and the second magnetic layer;

a third magnetic layer disposed between the first magnetic layer and the first nonmagnetic layer; and

a layer having an amorphous structure, the layer containing two or more elements that are contained in the first magnetic layer, the layer being disposed between the first magnetic layer and the third magnetic layer,

wherein the first magnetic layer contains Mn and at least one element of Al, Ge, or Ga.

2. The magnetoresistive element according to claim 1 , wherein the layer has a thickness of 0.1 nm or more and 5 nm or less.

3. The magnetoresistive element according to claim 1 , further comprising a fourth magnetic layer disposed between the second magnetic layer and the first nonmagnetic layer.

4. A magnetic memory comprising:

the magnetoresistive element according to claim 1 ;

a first wiring electrically connected to the first magnetic layer of the magnetoresistive element; and

a second wiring electrically connected to the second magnetic layer of the magnetoresistive element.

5. The magnetoresistive element according to claim 1 , wherein the first magnetic layer contains at least Mn and Al.

6. The magnetoresistive element according to claim 1 , wherein the first magnetic layer contains at least Mn and Ge.

7. The magnetoresistive element according to claim 1 , wherein the first magnetic layer contains at least Mn and Ga.

8. A magnetoresistive element comprising:

a first magnetic layer:

a second magnetic layer;

a first nonmagnetic layer disposed between the first magnetic layer and the second magnetic layer;

a third magnetic layer disposed between the first magnetic layer and the first nonmagnetic layer; and

a layer having an amorphous structure, the layer containing two or more elements that are contained in the first magnetic layer, the layer being disposed between the first magnetic layer and the third magnetic layer,

wherein the first magnetic layer contains Mn, Ga, and at least one element of Al, Ge, Ir, Cr, Co, Pt, Ru, Pd, Rh, Ni, Fe, Re, Au, Cu, B, C, P, Gd, Tb, or Dy.

9. The magnetoresistive element according to claim 8 , wherein the layer has a thickness of 0.1 nm or more and 5 nm or less.

10. The magnetoresistive element according to claim 8 , further comprising a fourth magnetic layer disposed between the second magnetic layer and the first nonmagnetic layer.

11. A magnetic memory comprising:

the magnetoresistive element according to claim 8 ;

a first wiring electrically connected to the first magnetic layer of the magnetoresistive element; and

a second wiring electrically connected to the second magnetic layer of the magnetoresistive element.

12. A magnetoresistive element comprising:

a first magnetic layer;

a second magnetic layer;

a first nonmagnetic layer disposed between the first magnetic layer and the second magnetic layer; and

a layer having an amorphous structure, the layer containing two or more elements that are contained in the first magnetic layer, the layer being disposed between the first magnetic layer and the first nonmagnetic layer,

wherein the first magnetic layer contains Mn and at least one element of AL, Ge, or Ga.

13. The magnetoresistive element according to claim 12 , wherein the layer has a thickness of 0.1 nm or more and 1 nm or less.

14. The magnetoresistive element according to claim 12 , further comprising a fourth magnetic layer disposed between the second magnetic layer and the first nonmagnetic layer.

15. A magnetic memory comprising:

the magnetoresistive element according to claim 12 ;

a first wiring electrically connected to the first magnetic layer of the magnetoresistive element; and

a second wiring electrically connected to the second magnetic layer of the magnetoresistive element.

16. A magnetoresistive element comprising:

a first magnetic layer:

a second magnetic layer;

a first nonmagnetic layer disposed between the first magnetic layer and the second magnetic layer; and

a layer having an amorphous structure, the layer containing two or more elements that are contained in the first magnetic layer, the layer being disposed between the first magnetic layer and the first nonmagnetic layer,

wherein the first magnetic layer contains Mn, Ga, and at least one element of Al, Ge, Ir, Cr, Co, Pt, Ru, Pd, Rh, Ni, Fe, Re, Au, Cu, B, C, P, Gd, Tb, or Dy.

17. The magnetoresistive element according to claim 16 , wherein the layer has a thickness of 0.1 nm or more and 1 nm or less.

18. The magnetoresistive element according to claim 16 , further comprising a fourth magnetic layer disposed between the second magnetic layer and the first nonmagnetic layer.

19. A magnetic memory comprising:

the magnetoresistive element according to claim 16 ;

a first wiring electrically connected to the first magnetic layer of the magnetoresistive element; and

a second wiring electrically connected to the second magnetic layer of the magnetoresistive element.

Assignments (4)
DE-MERGER Recorded Dec 12, 2019
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051260/0291 →
MERGER Recorded Dec 12, 2019
From: TOSHIBA MEMORY CORPORATION; K.K PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051262/0776 →
CHANGE OF NAME AND ADDRESS Recorded Dec 12, 2019
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 051262/0881 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 9, 2016
From: KATO, YUSHI; DAIBOU, TADAOMI; OHSAWA, YUICHI; OMINE, SHUMPEI; HASE, NAOKI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 040699/0255 →