Magnetoresistive element and magnetic memory
A magnetoresistive element according to an embodiment includes a stack structure, the stack structure including: a first magnetic layer containing Mn and at least one element of Ga, Ge, or Al; a second magnetic layer; a first nonmagnetic layer disposed between the first magnetic layer and the second magnetic layer; a third magnetic layer disposed between the first magnetic layer and the first nonmagnetic layer; and a second nonmagnetic layer disposed between the first magnetic layer and the third magnetic layer, the second nonmagnetic layer containing at least one element of Mg, Ba, Ca, C, Sr, Sc, Y, Gd, Tb, Dy, Ce, Ho, Yb, Er, or B.
1. A magnetic memory comprising:
a magnetoresistive element comprising:
a first magnetic layer comprising Mn and at least one element selected from the group consisting of Ca, Ge, and Al;
a second magnetic layer;
a first nonmagnetic layer disposed between the first magnetic layer and the second magnetic layer;
a third magnetic layer disposed between the first magnetic layer and the first nonmagnetic layer; and
a second nonmagnetic layer disposed between the first magnetic layer and the third magnetic layer, wherein the second nonmagnetic layer is in contact with the first magnetic layer and the third magnetic layer, and wherein the second nonmagnetic layer comprises an alloy layer comprising at least one element selected from the group consisting of Mg, Ba, Ca, C, Sr, Sc, Y, Gd, Tb, Dy, Ce, Ho, Yb, Er, and B;
a first wiring electrically connected to the first magnetic layer of the magnetoresistive element; and
a second wiring electrically connected to the second magnetic layer of the magnetoresistive element.
2. The memory according to claim 1 , wherein the second magnetic layer comprises Mn and at least one element selected from the group consisting of Ga, Ge, and Al.
3. The memory according to claim 2 , wherein:
the second magnetic layer comprises a first magnetic portion and a second magnetic portion, the first magnetic portion being disposed between the first nonmagnetic layer and the second magnetic portion; and
the first magnetic portion has a higher spin polarizability than the second magnetic portion.
4. The memory according to claim 1 , further comprising:
a fourth magnetic layer disposed between the first nonmagnetic layer and the second magnetic layer; and
a third nonmagnetic layer disposed between the fourth magnetic layer and the second magnetic layer.
5. The memory according to claim 1 , wherein the third magnetic layer has a higher spin polarizability than the first magnetic layer.
6. A magnetic memory, comprising:
a magnetoresistive element comprising:
a first magnetic layer comprising Mn and at least one element selected from the group consisting of Ga, Ge, and Al;
a second magnetic layer;
a first nonmagnetic layer disposed between the first magnetic layer and the second magnetic layer;
a third magnetic layer disposed between the first magnetic layer and the first nonmagnetic layer; and
a second nonmagnetic layer disposed between the first magnetic layer and the third magnetic layer, wherein the second nonmagnetic layer comprises boron and at least one element selected from the group consisting of Mg, Ba, Ca, C, Sr, Sc, Y, Gd, Tb, Dy, Ce, Ho, Yb, and Er;
a first wiring electrically connected to the first magnetic layer of the magnetoresistive element; and
a second wiring electrically connected to the second magnetic layer of the magnetoresistive element.
7. The memory according to claim 6 , wherein the second magnetic layer comprises Mn and at least one element selected from the group consisting of Ga, Ge, and Al.
8. The memory according to claim 7 , wherein:
the second magnetic layer comprises a first magnetic portion and a second magnetic portion, the first magnetic portion being disposed between the first nonmagnetic layer and the second magnetic portion; and
the first magnetic portion has a higher spin polarizability than the second magnetic portion.
9. The memory according to claim 6 , further comprising:
a fourth magnetic layer disposed between the first nonmagnetic layer and the second magnetic layer; and
a third nonmagnetic layer disposed between the fourth magnetic layer and the second magnetic layer.
10. The memory according to claim 6 , wherein the third magnetic layer has a higher spin polarizability than the first magnetic layer.
11. A magnetic memory, comprising:
a magnetoresistive element comprising:
a first magnetic layer comprising Mn and at least one element selected from the group consisting of Ga, Ge, and Al;
a second magnetic layer;
a first nonmagnetic layer disposed between the first magnetic layer and the second magnetic layer;
a third magnetic layer disposed between the first magnetic layer and the first nonmagnetic layer; and
a second nonmagnetic layer disposed between the first magnetic layer and the third magnetic layer, wherein the second nonmagnetic layer comprises nitrogen and at least one element selected from the group consisting of Mg, Ba, Ca, C, B, Sr, Sc, Y, Gd, Tb, Dy, Ce, Ho, Yb, and Er;
a first wiring electrically connected to the first magnetic layer of the magnetoresistive element; and
a second wiring electrically connected to the second magnetic layer of the magnetoresistive element.
12. The memory according to claim 11 , wherein the third magnetic layer has a higher spin polarizability than the first magnetic layer.
13. A magnetic memory, comprising:
a magnetoresistive element comprising:
a first magnetic layer comprising Mn and at least one element selected from the group consisting of Ga, Ge, and Al;
a second magnetic layer;
a first nonmagnetic layer disposed between the first magnetic layer and the second magnetic layer;
a third magnetic layer disposed between the first magnetic layer and the first nonmagnetic layer; and
a second nonmagnetic layer disposed between the first magnetic layer and the third magnetic layer, wherein the second nonmagnetic layer comprises carbon and at least one element selected from the group consisting of Mg, Ba, Ca, B, Sr, Sc, Y, Gd, Tb, Dy, Ce, Ho, Yb, and Er;
a first wiring electrically connected to the first magnetic layer of the magnetoresistive element; and
a second wiring electrically connected to the second magnetic layer of the magnetoresistive element.
14. The memory according to claim 13 , wherein the third magnetic layer has a higher spin polarizability than the first magnetic layer.
15. A magnetic memory, comprising:
a magnetoresistive element comprising:
a first magnetic layer comprising Mn and at least one element selected from the group consisting of Ga, Ge, and Al;
a second magnetic layer;
a first nonmagnetic layer disposed between the first magnetic layer and the second magnetic layer;
a third magnetic layer disposed between the first magnetic layer and the first nonmagnetic layer; and
a second nonmagnetic layer disposed between the first magnetic layer and the third magnetic layer, wherein the second nonmagnetic layer comprises at least one element selected from the group consisting of Mg, Ba, Ca, C, Sr, Sc, Y, Gd, Tb, Dy, Ce, Ho, Yb, Er, and B;
a first wiring electrically connected to the first magnetic layer of the magnetoresistive element; and
a second wiring electrically connected to the second magnetic layer of the magnetoresistive element,
wherein:
the second nonmagnetic layer comprises a first portion and a second portion disposed between the first portion and the third magnetic layer;
the first portion comprises at least one element selected from the group consisting of Mg, Ba, Ca, C, Sr, Sc, Y, Gd, Tb, Dy, Ce, Ho, Yb, Er, and B; and
the second portion comprises at least one element selected from the group consisting of Ta, Ti, W, Nb, V, Cr, and Hf.
16. A magnetic memory comprising: a magnetoresistive element including: a first magnetic layer comprising Mn and at least one element selected from the group consisting of Ga, Ge, and Al; a second magnetic layer; a first nonmagnetic layer disposed between the first magnetic layer and the second magnetic layer; a third magnetic layer disposed between the first magnetic layer and the first nonmagnetic layer, wherein the third magnetic layer has a higher spin polarizability than the first magnetic layer; and a second nonmagnetic layer disposed between the first magnetic layer and the third magnetic layer, wherein the second nonmagnetic layer is in contact with the first magnetic layer and the third magnetic layer, and wherein the second nonmagnetic layer comprises a metal layer comprising Mg; a first wiring electrically connected to the first magnetic layer of the magnetoresistive element; and a second wiring electrically connected to the second magnetic layer of the magnetoresistive element.
17. The memory according to claim 16 , wherein the second magnetic layer comprises Mn and at least one element selected from the group consisting of Ga, Ge, and Al.
18. The memory according to claim 17 , wherein:
the second magnetic layer comprises a first magnetic portion and a second magnetic portion, the first magnetic portion being disposed between the first nonmagnetic layer and the second magnetic portion; and
the first magnetic portion has a higher spin polarizability than the second magnetic portion.
19. The memory according to claim 16 , further comprising:
a fourth magnetic layer disposed between the first nonmagnetic layer and the second magnetic layer; and
a third nonmagnetic layer disposed between the fourth magnetic layer and the second magnetic layer.