IP Library Granted Patent US 9,691,717
Granted Patent B2
US 9,691,717 · App. 15/264,757 · Granted Jun 27, 2017

Fabricating process for package substrate

Inventor: Dyi-Chung Hu (Hsinchu, TW)
H01L23/562H01L21/486H01L21/4853H01L21/4857H01L21/563H01L21/566H01L21/568H01L21/78H01L23/3135H01L23/49822H01L23/49827H01L23/49838H01L24/16H01L2224/16227H01L2924/3511
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Quick Facts
Patent No.
US 9,691,717
App. No.
15/264,757
Granted
Jun 27, 2017
Kind
B2
Abstract

A core substrate is prepared first, a bottom redistribution layer RDL 1 is formed. Any warpage of the RDL 1 is suppressed by the core substrate. In a later process, warpage is further suppressed by a molding compound encapsulating the core substrate. A plurality of metal pillars are formed passing through the core substrate longitudinally; a top redistribution layer RDL 2 is then formed on a top surface of the metal pillars.

Claims (42)

1. A fabricating process for package substrate, comprising a fabricating process to prepare a plurality of semi-products according to the following steps:

preparing a core substrate;

forming a bottom redistribution layer RDL 1 on a bottom surface of the core substrate; wherein the RDL 1 has a bottom redistribution circuitry embedded in bottom dielectric layers; the bottom redistribution circuitry has a plurality of first top metal pads and a plurality of first bottom metal pads;

thinning from top of the core substrate;

forming a plurality of holes from top of the core substrate;

filling metal in each of the holes to form a plurality of metal pillars passing through the core substrate; and

obtaining a plurality of semi-products through singulating.

2. A fabricating process for package substrate as claimed in claim 1 , further comprising:

preparing a temporary carrier with a release layer configured on a top surface of the temporary carrier;

arranging the plurality of semi-products on a top surface of the release layer; wherein each semi-product is placed with the metal pillars configured away from the release layer;

encapsulating the semi-products with a molding compound wrapping at least four lateral sides of the semi-products;

forming a top redistribution layer RDL 2 on a top surface of the plurality of metal pillars; wherein the top redistribution layer RDL 2 has a top redistribution circuitry embedded in top dielectric layers; the top redistribution circuitry has a plurality of second top metal pads, and has a plurality of second bottom metal pads; wherein each of the metal pillars has a top surface electrically coupled to a corresponding second bottom metal pad;

removing the temporary carrier; and

forming a plurality of bottom openings from bottom of the bottom dielectric layer to expose a bottom surface of each first bottom metal pad.

3. A fabricating process for package substrate as claimed in claim 2 , further comprising:

configuring at least one chip on a bottom surface of the plurality of first bottom metal pads.

4. A fabricating process for package substrate as claimed in claim 3 , further comprising:

filling an underfill material in a space between the chip and the bottom surface of the bottom dielectric layer.

5. A fabricating process for package substrate as claimed in claim 4 , further comprising:

applying a molding compound to encapsulate the chip or chips.

6. A fabricating process for package substrate as claimed in claim 5 , further comprising:

planting a plurality of solder balls, each on a top surface of a corresponding second top metal pad.

7. A fabricating process for package substrate as claimed in claim 6 , further comprising:

obtaining a plurality of chip package units through singulating a previous product.

8. A fabricating process for package substrate, comprising:

preparing a core substrate;

forming a bottom redistribution layer RDL 1 on a bottom surface of the core substrate; wherein the RDL 1 has a bottom redistribution circuitry embedded in bottom dielectric layers; the bottom redistribution circuitry has a plurality of first top metal pads and a plurality of first bottom metal pads;

thinning from top of the core substrate;

forming a plurality of holes from top of the core substrate;

filling metal in each of the holes to form a plurality of metal pillars passing through the core substrate;

forming a top redistribution layer RDL 2 on a top surface of the plurality of metal pillars; wherein the top redistribution layer RDL 2 has a top redistribution circuitry embedded in top dielectric layers; the top redistribution circuitry has a plurality of second top metal pads, and has a plurality of second bottom metal pads; wherein each of the metal pillars has a top surface electrically coupled to a corresponding second bottom metal pad; and

forming a plurality of bottom openings from bottom of the bottom dielectric layer to expose a bottom surface of each first bottom metal pad.

9. A fabricating process for package substrate as claimed in claim 8 , further comprising:

configuring at least one chip on a bottom surface of the plurality of first bottom metal pads.

10. A fabricating process for package substrate as claimed in claim 9 , further comprising:

filling an underfill material in a space between the chip and the bottom surface of the bottom dielectric layer.

11. A fabricating process for package substrate as claimed in claim 10 , further comprising:

applying a molding compound to encapsulate the chip or chips.

12. A fabricating process for package substrate as claimed in claim 11 , further comprising:

planting a plurality of solder balls, each on a top surface of a corresponding second top metal pad.

13. A fabricating process for package substrate as claimed in claim 12 , further comprising:

obtaining a plurality of chip package units through singulating.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 6, 2026
From: HU, DYI-CHUNG
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED
Reel/Frame 075543/0195 →
Continuity (2)
Provisional Application 62219747 · Sep 17, 2015
Related Publication 20170084548A1 · Mar 23, 2017