IP Library Granted Patent US 9,627,073
Granted Patent B2
US 9,627,073 · App. 15/271,028 · Granted Apr 18, 2017

Systems, methods, and apparatus for memory cells with common source lines

Inventors: Xiaojun Yu (Shanghai, CN); Venkatraman Prabhakar (Pleasanton, CA); Igor G. Kouznetsov (San Francisco, CA); Long Hinh (San Jose, CA); Bo Jin (Cupertino, CA)
Assignee: CYPRESS SEMICONDUCTOR CORPORATION
G11C16/10G11C16/0466G11C16/08G11C16/26
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Quick Facts
Patent No.
US 9,627,073
App. No.
15/271,028
Granted
Apr 18, 2017
Kind
B2
Abstract

Systems, methods, and apparatus are disclosed for implementing memory cells having common source lines. The methods may include receiving a first voltage at a first transistor. The first transistor may be coupled to a second transistor and included in a first memory cell. The methods include receiving a second voltage at a third transistor. The third transistor may be coupled to a fourth transistor and included in a second memory cell. The first and second memory cells may be coupled to a common source line. The methods include receiving a third voltage at a gate of the second transistor and a gate of the fourth transistor that may cause them to operate in cutoff mode. The methods may include receiving a fourth voltage at a gate of the first transistor. The fourth voltage may cause a change in a charge storage layer included in the first transistor.

Claims (16)

1. A system comprising:

a processor;

at least one voltage source; and

a memory array;

wherein:

the processor is configured to provide control signals to the at least one voltage source and the memory array;

the at least one voltage source is configured to generate a plurality of voltages, wherein the plurality of voltages comprises at least one voltage of at least 3.5V; and

the memory array comprises:

a first memory cell comprising a first transistor coupled to a second transistor, wherein the first transistor comprises a memory element; and

a second memory cell comprising a third transistor coupled to a fourth transistor;

wherein, in response to an initiation of a programming operation, the memory array receives at least one of the plurality voltages at each of a drain of the first transistor, a drain of the third transistor, a gate of the second transistor, a gate of the fourth transistor, and a gate of the first transistor, and

wherein receiving the voltages results in a change in one or more electrical characteristics of the memory element.

2. The system of claim 1 , wherein the plurality of voltages further comprises at least one voltage of 1V.

3. The system of claim 1 , wherein the memory array is part of a flash memory.

4. The system of claim 1 , further comprising a control circuitry comprising the at least one voltage source.

5. The system of claim 4 , wherein the control circuitry is configured to provide the plurality of voltages to the memory array.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded May 7, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 049109/0573 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 4, 2019
From: CYPRESS SEMICONDUCTOR CORPORATION
To: LONGITUDE FLASH MEMORY SOLUTIONS LTD.
Reel/Frame 049086/0803 →
PATENT SECURITY AGREEMENT Recorded Apr 25, 2017
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 042326/0396 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 18, 2016
From: PRABHAKAR, VENKATRAMAN; KOUZNETSOV, IGOR; HINH, LONG; YU, XIAOJUN; JIN, BO
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 040048/0027 →
Continuity (4)
Continuation 14618815 · Feb 10, 2015
Continuation 14316615 · Jun 26, 2014
Provisional Application 61910764 · Dec 2, 2013
Related Publication 20170011800A1 · Jan 12, 2017