Systems and methods for extraction of electrical specifications from prelayout simulations

1. A method, comprising:

extracting, via a processor, one or more electrical specifications from a prelayout simulation of an integrated circuit design, wherein extracting the one or more electrical specifications comprises:

determining a first slope associated with a risetime of a toggling waveform output by a toggling node of the integrated circuit design and a second slope associated with a falltime of the toggling waveform;

determining a net sum of currents flowing through the toggling node; and

determining a resistance specification for the toggling node based at least in part on the first slope, the second slope, and the net sum of currents; and

generating a physical layout of one or more components of an integrated circuit based at least in part on the one or more extracted electrical specifications, wherein the physical layout comprises a floorplan, a routing of wires, or both; and

fabricating the integrated circuit based at least in part on the physical layout.

2. The method of claim 1 , wherein extracting the one or more electrical specifications comprises extracting a net effective capacitance specification based at least in part on the net sum of currents.

3. The method of claim 1 , wherein determining the first slope of the risetime comprises determining an amount of time for the toggling waveform to reach 90% of a maximum value of the toggling waveform.

4. The method of claim 1 , wherein determining the second slope of the falltime comprises determining an amount of time for the toggling waveform to reach 10% of a maximum value of the toggling waveform.

5. The method of claim 1 , wherein determining the net sum of currents flowing through the toggling node comprises summing the currents flowing into and out of the toggling node.

6. The method of claim 1 , wherein determining the resistance specification of the toggling node comprises using a final slope equation configured to determine the resistance specification of the toggling node.

7. The method of claim 6 , wherein the final slope equation incorporates a first parameter associated with a capacitance guardband percentage, a second parameter associated with a postlayout slope degradation ratio guardband, or a combination thereof.

8. A system, comprising:

a design system comprising a processor, wherein the design system is configured to:

extract one or more electrical specifications from a prelayout simulation of an integrated circuit design, wherein the one or more electrical specifications comprises a resistance specification for a static node of the integrated circuit design, wherein the static node is configured to maintain a voltage value within a threshold, and wherein extracting the one or more electrical specifications comprises:

determining a net sum of currents flowing through the static node;

determining a voltage drop budget for one or more peak currents, one or more analog current sources, or a combination thereof for the static node, wherein the voltage drop budget is less than the threshold; and

determining the resistance specification for the static node based at least in part on the net sum of currents and the voltage drop budget; and

generate an electronic design of a physical layout of an Integrated Circuit (IC) based at least in part on one or more the extracted electrical specifications; and

a fabrication system configured to produce the IC based at least in part on the electronic design.

9. The system of claim 8 , wherein the physical layout comprises a floorplan or a routing of wires for a field programmable gate array (FPGA).

10. The system of claim 8 , wherein the integrated circuit comprises one or more circuit blocks, one or more wires, one or more metal tracks, one or more wiring tracks, or a combination thereof.

11. The system of claim 8 , wherein the static node configured to maintain the voltage value within the threshold in response to a current flowing through the static node, wherein the current exceeds a current threshold.

12. The system of claim 8 , wherein extracting the one or more electrical specifications comprises determining a miller capacitance requirements of the static node in response to the static node being coupled to a high frequency node via miller coupling, wherein the high frequency node is configured to electrically couple to a transistor toggling above a user defined frequency threshold.

13. The system of claim 8 , wherein extracting the one or more electrical specifications comprises determining a resistance specification of a constant current source node based at least in part on an average current, a rms current, a peak current, or a combination thereof of the constant current source node.

14. The system of claim 8 , wherein extracting the one or more electrical specifications comprises determining the resistance specification based on a transistor sizing, one or more component pin capacitances, or a combination thereof.

15. The system of claim 8 , wherein determining the net sum of currents flowing through the static node comprises summing the currents flowing into and out of the static node.

16. The system of claim 8 , wherein the static node is a node configured to electrically couple to two or more circuit components and to be driven by a driver, wherein the driver is an inverter, a buffer, or a combination thereof.

17. The system of claim 8 , wherein the static node is configured to electrically couple to one or more passive circuit elements, wherein the passive circuit elements comprise one or more precision resistors, one or more precision diodes, one or more capacitors, one or more inductors, one or more diodes, or any combination thereof.

18. A tangible, non-transitory, computer-readable medium, comprising instructions to:

extract, via a processor, one or more electrical specifications from a prelayout simulation of an integrated circuit design, wherein extracting the one or more electrical specifications comprises:

determining a first total net charge of one or more nodes of the integrated circuit design during a risetime of a toggling waveform;

determining a second total net charge of the one or more nodes during a falltime of the toggling waveform; and

determining a capacitance specification associated with the one or more nodes based at least in part on the first total net charge and the second total net charge; and

generate an electronic design of a physical layout of an Integrated Circuit (IC) based at least in part on the one or more extracted electrical specification, wherein the physical layout comprises a floorplan, a routing of wires, or a combination thereof; and

fabricate the IC based at least in part on the electronic design.

19. The computer-readable medium of claim 18 , wherein determining the first total net charge comprises:

determining a third total net charge of current flowing out of the one or more nodes during the risetime;

determining a fourth total net charge of current flowing into the one or more nodes during the risetime; and

obtaining a maximum charge from the third total net charge and the fourth total net charge.

20. The computer-readable medium of claim 18 , wherein determining the second total net charge comprises:

determining a fifth total net charge of current flowing out of the one or more nodes during the falltime;

determining a sixth total net charge of current flowing into the one or more nodes during the falltime; and

obtaining a maximum charge from the fifth total net charge and the sixth total net charge.