HARDWARE STRESS INDICATORS BASED ON ACCUMULATED STRESS VALUES
In one embodiment, a method comprises determining, at a plurality of instances in time, a value of at least one stress characteristic of a hardware resource; determining an accumulated stress value of the hardware resource, the accumulated stress value comprising the sum of a plurality of incremental stress values, an incremental stress value determined based on the value of the at least one stress characteristic at a particular instance in time; and generating a first stress indicator in response to a determination that the accumulated stress value of the hardware resource is greater than a first threshold stress value associated with the hardware resource.
1 . A system comprising:
a plurality of hardware resources, the plurality of hardware resources comprising at least one processor core; and
platform logic to:
determine, at a plurality of instances in time, a value of at least one stress characteristic of a hardware resource of the plurality of hardware resources;
determine an accumulated stress value of the hardware resource, the accumulated stress value comprising the sum of a plurality of incremental stress values, an incremental stress value determined based on the value of the at least one stress characteristic at a particular instance in time; and
generate a first stress indicator in response to a determination that the accumulated stress value of the hardware resource is greater than a first threshold stress value associated with the hardware resource.
2 . The system of claim 1 , the platform logic further to determine whether a stress accumulation rate of the hardware resource is greater than a threshold stress accumulation rate of the hardware resource.
3 . The system of claim 1 , wherein the at least one stress characteristic comprises a voltage applied to the hardware resource.
4 . The system of claim 1 , wherein the at least one stress characteristic comprises a temperature of the hardware resource.
5 . The system of claim 1 , the platform logic further to store the accumulated stress value in a non-volatile memory of a computing platform comprising the hardware resource.
6 . The system of claim 5 , wherein the hardware resource is a processor core and the non-volatile memory is located on the same die as the processor core.
7 . The system of claim 1 , the platform logic further to communicate a second stress indicator in response to a determination that the accumulated stress value of the hardware resource is greater than a second threshold stress value associated with the hardware resource.
8 . The system of claim 1 , further comprising workload orchestration logic to assign one or more of the plurality of hardware resources to a workload based at least in part on the accumulated stress value of the hardware resource.
9 . The system of claim 1 , further comprising workload orchestration logic to migrate a workload from a first set of one or more of the plurality of hardware resources to a second set of one or more of the plurality of hardware resources based at least in part on the accumulated stress value of the hardware resource.
10 . The system of claim 1 , further comprising workload orchestration logic to perform wear leveling of the plurality of hardware resources based at least in part on the accumulated stress value of the hardware resource.
11 . The system of claim 1 , wherein the hardware resource is a processor core.
12 . The system of claim 1 , wherein the hardware resource is an uncore comprising logic on a central processing unit that has a voltage domain that is separate from a voltage domain of a processor core of the at least one processor core.
13 . The system of claim 1 , wherein the platform logic is further to:
apply a plurality of voltages to the hardware resource to determine a minimum operating voltage that allows a test sequence to execute error free; and
adjust the first threshold stress value based on the determined minimum operating voltage.
14 . The system of claim 1 , wherein the platform logic is further to select a pooled resource comprising a plurality of different types of hardware resources based on an accumulated stress value of at least one hardware resource of each type of the different types of hardware resources.
15 . A method comprising:
determining, at a plurality of instances in time, a value of at least one stress characteristic of a hardware resource;
determining an accumulated stress value of the hardware resource, the accumulated stress value comprising the sum of a plurality of incremental stress values, an incremental stress value determined based on the value of the at least one stress characteristic at a particular instance in time; and
generating a first stress indicator in response to a determination that the accumulated stress value of the hardware resource is greater than a first threshold stress value associated with the hardware resource.
16 . The method of claim 15 , further comprising determining whether a stress accumulation rate of the hardware resource is greater than a threshold stress accumulation rate of the hardware resource.
17 . The method of claim 15 , wherein the at least one stress characteristic comprises a voltage applied to the hardware resource and a temperature of the hardware resource.
18 . The method of claim 15 , further comprising storing the accumulated stress value in a non-volatile memory located on the same die as the hardware resource.
19 . The method of claim 15 , further comprising communicating a second stress indicator in response to a determination that the accumulated stress value of the hardware resource is greater than a second threshold stress value associated with the hardware resource.
20 . The method of claim 15 , further comprising assigning one or more of a plurality of hardware resources to a workload based at least in part on the accumulated stress value of the hardware resource.
21 . The method of claim 15 , further comprising:
applying a plurality of voltages to the hardware resource to determine a minimum operating voltage that allows a test sequence to execute error free; and
adjusting the first threshold stress value based on the determined minimum operating voltage.
22 . At least one machine readable storage medium having instructions stored thereon, the instructions when executed by a machine to cause the machine to:
determine, at a plurality of instances in time, a value of at least one stress characteristic of a hardware resource;
determine an accumulated stress value of the hardware resource, the accumulated stress value comprising the sum of a plurality of incremental stress values, an incremental stress value determined based on the value of the at least one stress characteristic at a particular instance in time; and
generate a first stress indicator in response to a determination that the accumulated stress value of the hardware resource is greater than a first threshold stress value associated with the hardware resource.
23 . The at least one medium of claim 22 , the instructions when executed by the machine to further cause the machine to determine whether a stress accumulation rate of the hardware resource is greater than a threshold stress accumulation rate of the hardware resource.
24 . The at least one medium of claim 22 , the instructions when executed by the machine to further cause the machine to communicate a second stress indicator in response to a determination that the accumulated stress value of the hardware resource is greater than a second threshold stress value associated with the hardware resource.
25 . The at least one medium of claim 22 , the instructions when executed by the machine to further cause the machine to assign one or more of a plurality of hardware resources to a workload based at least in part on the accumulated stress value of the hardware resource.