IP Library Granted Patent US 10,504,725
Granted Patent B2
US 10,504,725 · App. 15/298,005 · Granted Dec 10, 2019

Material selective regrowth structure and method

Inventor: Edwin L. Piner (New Braunfels, TX)
Assignee: The Texas State University-San Marcos
H01L21/02647H01L21/0243H01L21/0254H01L21/02389H01L21/02458H01L21/02639H01L29/0665
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Quick Facts
Patent No.
US 10,504,725
App. No.
15/298,005
Granted
Dec 10, 2019
Kind
B2
Abstract

The disclosure relates to a method for creating a nanoscale structure. The method includes forming a window in a semiconductor structure, the semiconductor structure comprising a substrate, a first semiconductor layer, and a mask layer; depositing a second semiconductor layer within the window such that a gap remains between the second semiconductor and a portion of the window; and regrowing the first semiconductor layer such that the first semiconductor layer fills the gap.

Claims (14)

1. A nanoscale structure comprising:

a substrate;

a first semiconductor layer on top of the substrate; and

a second semiconductor layer deposited within a window formed in the substrate and the first semiconductor layer such that a gap exists between the second semiconductor and a portion of the first semiconductor layer/and or the substrate, wherein the gap is filled by a regrown first semiconductor layer.

2. The structure of claim 1 , wherein the regrown first semiconductor layer overgrows the second semiconductor layer.

3. The structure of claim 1 , wherein the first semiconductor layer is covered by the regrown first semiconductor layer.

4. The structure of claim 1 , wherein the second semiconductor layer comprises a sidewall that is non-vertical.

5. The structure of claim 4 , wherein the gap is concave.

6. The structure of claim 4 , wherein the gap is convex.

7. The structure of claim 3 , further comprising a third semiconductor layer on the regrown first semiconductor layer.

8. The structure of claim 7 , wherein the third semiconductor layer comprises a different material than the second semiconductor layer.

9. The structure of claim 7 , wherein the third semiconductor layer is a different size than the second semiconductor layer.

10. The structure of claim 7 , wherein the third semiconductor layer is a different shape than the second semiconductor layer.

11. The structure of claim 1 , wherein the first semiconductor layer comprises a different material than the regrown first semiconductor layer.

Assignments (2)
CONFIRMATORY LICENSE Recorded May 10, 2017
From: TEXAS STATE UNIVERSITY
To: NAVY, SECRETARY OF THE UNITED STATES OF AMERICA
Reel/Frame 042522/0607 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 19, 2016
From: PINER, EDWIN L.
To: THE TEXAS STATE UNIVERSITY-SAN MARCOS
Reel/Frame 040067/0548 →
Continuity (2)
Continuation PCTUS2014035423 · Apr 25, 2014
Related Publication 20170040169A1 · Feb 9, 2017