Nanoscale optical tomography with cathodoluminescence spectroscopy
In one aspect, a cathodoluminescence (CL) spectroscopic tomography device includes a sample stage to support a sample. An electron beam source scans an electron beam over the sample to yield light emission by the sample. A reflective element directs the light emission by the sample to a light detector. A controller controls operation of the sample stage, the electron beam source, and the light detector. In one aspect, a CL spectroscopic tomography device includes an electron beam source which directs an electron beam at an object to yield an emission by the object. A detector detects the emission. A controller receives information from the detector related to the detected emission. The controller derives a two-dimensional (2D) CL map from the information related to the detected emission, and derives a three-dimensional (3D) CL tomogram from the 2D CL map.
1. A cathodoluminescence (CL) spectroscopic tomography device, comprising:
a sample stage configured to support a sample;
an electron beam source configured to scan an electron beam over the sample to yield light emission by the sample;
a light detector;
a reflective element configured to direct the light emission by the sample to the light detector; and
a controller coupled to the sample stage, the electron beam source, and the light detector to control operation of the sample stage, the electron beam source, and the light detector, wherein the controller is configured to derive a plurality of two-dimensional (2D) CL maps of the sample from the light emission, the 2D CL maps oriented at different angles relative to an axis through the sample, the controller is configured to derive the 2D CL maps by filtering in a frequency domain, the filtering includes a ramp filter and a low pass filter, and the controller is configured to derive a three-dimensional (3D) CL tomogram of the sample from the plurality of 2D CL maps using filtered back projection.
2. The device of claim 1 , wherein the scan of the electron beam over the sample is a line scan, and wherein the controller is configured to derive the 2D CL maps of the sample from the light emission yielded during the line scan.
3. The device of claim 1 , wherein the sample is symmetric about the axis.
4. The device of claim 1 , wherein a number of the angles is four or more.
5. A method, comprising:
controlling a detector to measure intensity of emissions from an object resulting from an electron beam scanned across the object;
receiving from the detector information related to the measured intensity;
deriving from the received information a plurality of two-dimensional (2D) cathodoluminescence (CL) maps; and
deriving from the 2D CL maps a three-dimensional (3D) CL map,
wherein deriving the 2D CL maps comprises using line scan information of a line lying along a plane of the object to derive a 2D CL map of the object over an area of the object at the plane, wherein deriving the 2D CL maps includes filtering in a frequency domain, and the filtering includes a ramp filter and a low pass filter, wherein deriving the 3D CL map comprises using filtered back projection.
6. The method of claim 5 , wherein the information related to the measured intensity is information related to intensity measured during line scans of the object.
7. The method of claim 5 , further comprising controlling an electron beam source to scan the electron beam over the object.
8. The device of claim 1 , wherein the controller is configured to derive the 3D CL tomogram of the sample by summing the 2D CL maps oriented at the different angles.
9. The method of claim 5 , wherein deriving the 3D CL map includes summing the 2D CL maps.