Buffer layer film-forming method and buffer layer
A method for film-forming a buffer layer to be used for a solar cell, the buffer layer being disposed between a light absorbing layer and a transparent conductive film. Specifically, in this buffer layer film-forming method, a solution is formed into a mist, the solution containing zinc and almuminum as metal raw materials of the buffer layer. Then, a substrate disposed in the atmosphere is heated. Then, the mist of the solution is sprayed to the substrate being heated.
1. A method for film-forming a buffer layer to be used for a solar cell, the buffer layer being disposed between a light absorbing layer and a transparent conductive film comprising:
(A) forming a solution containing zinc and aluminum as metal raw materials of the buffer layer into a mist by applying an ultrasonic wave to said solution,
(B) heating a substrate disposed in an atmosphere within a chamber, and
(C) spraying a mist of said solution atomized in said step (A) to said substrate in said step (B),
wherein the buffer layer has a resistivity that is 10Ω·cm or greater.
2. The method for film-forming a buffer layer according to claim 1 further comprising the step of:
(D) supplying ozone to said substrate in said step (B).
3. The method for film-forming a buffer layer according to claim 1 , wherein said solution contains ammonia.
4. The method for film-forming a buffer layer according to claim 1 , wherein said solution contains a metal compound having zinc and aluminum, and said metal compound is a β-diketone compound.
5. The method for firm-forming a buffer layer according to claim 1 , wherein transmittance exceeding 80% is achieved when irradiating the buffer layer with light of a wavelength of between 1500 nm to 1700 nm.
6. A buffer layer to be used for a solar cell, the buffer layer being disposed between a light absorbing layer and a transparent conductive film,
wherein said buffer layer is a Zn 1-x Al x O film containing zinc and aluminum, provided that 0<x<1; and
wherein the buffer layer has a resistivity that is 10Ω·cm or greater.