IP Library Granted Patent US 10,221,487
Granted Patent B2
US 10,221,487 · App. 15/314,808 · Granted Mar 5, 2019

Metal foil for electromagnetic shielding, electromagnetic shielding material and shielded cable

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Quick Facts
Patent No.
US 10,221,487
App. No.
15/314,808
Granted
Mar 5, 2019
Kind
B2
Abstract

A metal foil for electromagnetic shielding 10 , comprising a base 1 consisting of a metal foil, an underlayer 2 including Ni formed on one or both surfaces of the base, and a Sn—Ni alloy layer 3 formed on a surface of the underlayer, wherein the Sn—Ni alloy layer includes 20 to 80 weight % of Sn, and when a total deposition amount of Sn is represented by T Sn [μg/dm 2 ], a percentage of Sn in the Sn—Ni alloy is represented by A Sn [weight %], a total deposition amount of Ni is represented by T Ni [μg/dm 2 ], and a percentage of Ni in the Sn—Ni alloy is represented by A Ni [weight %], T Sn : 500 to 91000 μg/dm 2 , T Ni : 2200 to 236000 μg/dm 2 , 170000=>{T Ni −T Sn ×(A Ni /A Sn )}=>1700.

Claims (7)

1. A metal foil for electromagnetic shielding, comprising a base consisting of a metal foil, an underlayer including Ni formed on one or both surfaces of the base, and a Sn—Ni alloy layer including 2 weight % or less of constituent elements of the base to Sn—Ni formed on a surface of the underlayer, wherein a pure Sn layer is not present at the surface of the Sn—Ni alloy layer, when the surface of the Sn—Ni alloy layer is observed by SEM, the surface of the Sn—Ni alloy layer has no plurality of aciculate or columnar protrusions having an average diameter of 0.1 to 2.0 μm that is an average value of diameters of minimum circles surrounding convex parts of the respective protrusions, the Sn—Ni alloy layer includes 20 to 80 weight % of Sn, and when a total deposition amount of Sn is represented by T sn [μg/dm 2 ], the percentage of Sn in the Sn—Ni alloy is represented by A Sn [weight %], a total deposition amount of Ni is represented by T Ni [μg/dm 2 ], and the percentage of Ni in the Sn—Ni alloy is represented by A Ni [weight % ],T Sn : 500 to 91000 μg/dm 2 , T Ni : 2200 to 236000 μg/dm 2 , 170000 =>{T Ni −T sn ×(A Ni /A sn )}=>1700.

2. The metal foil for electromagnetic shielding according to any claim 1 , wherein the base is gold, silver, platinum, stainless steel, iron, nickel, zinc, copper, a copper alloy, aluminum or an aluminum alloy.

3. The metal foil for electromagnetic shielding according to claim 1 , wherein the base is aluminum or an aluminum alloy, and a Zn layer is formed between the base and the underlayer.

4. An electromagnetic shielding material, comprising a resin layer laminated on one surface of the metal foil for electromagnetic shielding according to claim 1 .

5. The electromagnetic shielding material according to claim 4 , wherein the resin layer is a resin film.

6. A shielded cable shielded by the electromagnetic shielding material according to claim 4 .

7. A shielded cable shielded by the electromagnetic shielding material according to claim 5 .

Assignments (2)
CHANGE OF ADDRESS Recorded Aug 11, 2021
From: JX NIPPON MINING & METALS CORPORATION
To: JX NIPPON MINING & METALS CORPORATION
Reel/Frame 057160/0114 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 30, 2017
From: TANAKA, KOICHIRO
To: JX NIPPON MINING & METALS CORPORATION
Reel/Frame 041802/0012 →