Detector apparatus and charged particle beam system
There is provided a detector apparatus capable of detecting the position or tilt angle of a sample stage with high resolution and high reliability. The detector apparatus ( 100 ) is operative to detect the position or tilt angle of the sample stage ( 2 ), and has a potentiometer ( 10 ) for detecting the position or tilt angle of the sample stage ( 2 ), an encoder ( 20 ) for detecting the position or tilt angle of the sample stage ( 2 ), and a computing unit ( 30 ) for calculating the position or tilt angle of the sample stage ( 2 ), based both on an output signal from the potentiometer ( 10 ) and on an output signal from the encoder ( 20 ).
1. A detector apparatus comprising:
a potentiometer for detecting the position or tilt angle of a sample stage;
an encoder having higher resolution than the potentiometer and operative to detect the position or tilt angle of the sample stage; and
a computing unit for calculating the position or tilt angle of the sample stage, based both on an output signal from the potentiometer and on an output signal from the encoder,
wherein the output signal from said potentiometer varies according to the position or tilt angle of said sample stage, and
wherein, if the output signal from the potentiometer varies, said computing unit calculates the position or tilt angle of the sample stage based on the output signal from the potentiometer and, if the output signal from the potentiometer does not vary, the computing unit calculates the position or tilt angle of the sample stage by adding an amount of movement or tilt of the sample stage calculated based on the output signal from the encoder to the position or tilt angle of the sample stage calculated based on the output signal from the potentiometer.
2. A detector apparatus as set forth in claim 1 , wherein said sample stage is for use in a charged particle beam system.
3. A charged particle beam system including a detector apparatus as set forth in claim 1 .