IP Library Granted Patent US 10,076,042
Granted Patent B2
US 10,076,042 · App. 15/341,378 · Granted Sep 11, 2018

Devices and methods for solder flow control in three-dimensional microstructures

Inventors: David W. Sherrer (Cary, NC); James R. Reid (Billerica, MA)
Assignee: NUVOTRONICS, INC
H05K3/341B81C1/00357H01L24/26H01L24/83H05K1/111H05K1/181H05K3/4007B81C2201/019H01L2224/26175H01L2224/291H01L2224/3015H01L2224/32227H01L2224/83191H01L2224/83815H01L2924/12042H05K3/321H05K3/34H05K2201/10674H05K2201/10787H05K2201/10984H05K2203/0465H05K2203/1173Y02P70/611
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,076,042
App. No.
15/341,378
Granted
Sep 11, 2018
Kind
B2
Abstract

Structures, materials, and methods to control the spread of a solder material or other flowable conductive material in electronic and/or electromagnetic devices are provided.

Claims (35)

1. An electronic microstructure, comprising:

a plurality of layers of a metal and one or more layers of a material that is non-wetting to one or more of a metallic solder and a conductive epoxy;

a mounting surface disposed at and including a selected one of the plurality of layers of metal;

a wick stop structure formed of one or more of the plurality of layers of the non-wetting material, disposed away from the mounting surface and within the microstructure, the wick stop structure configured to deter a flow of one or more of the metallic solder and the conductive epoxy from the mounting surface to a location on the microstructure beyond the location of the wick stop structure.

2. The electronic microstructure of claim 1 , wherein the material that is non-wetting comprises one or more of an insulating material, a dielectric, plated nickel, and a metal oxide.

3. The electronic microstructure of claim 1 , comprising a stop pad at the mounting surface, the stop pad formed of one or more of the plurality of layers, for establishing the thickness of the metallic solder or conductive epoxy.

4. The electronic microstructure of claim 3 , comprising a mechanical anchor disposed within the microstructure and attached to the stop pad, the anchor formed of one or more layers of the material that is non-wetting.

5. The electronic microstructure of claim 1 , comprising one or more of a circuit board, hybrid circuit, and a semiconductor device operatively coupled to the mounting surface.

6. The electronic microstructure of claim 1 , wherein the wick stop structure comprises a shelf which extends outwardly away from a surface of the microstructure at which the shelf is located.

7. The electronic microstructure according to claim 6 , wherein the shelf circumscribes a portion of the microstructure.

8. The electronic microstructure according to claim 1 , wherein the wick stop structure circumscribes a portion of the microstructure.

9. The electronic microstructure according to claim 1 , wherein the wick stop structure is recessed within the microstructure.

10. The electronic microstructure according to claim 1 , wherein the mounting surface comprises mounting feet to provide a G-S-G termination.

11. The electronic microstructure according to claim 10 , wherein the mounting feet protrude from the mounting surface.

12. The electronic microstructure according to claim 1 , wherein the microstructure comprises a coaxial microstructure.

13. The electronic microstructure according to claim 1 , wherein the microstructure comprises a coaxial microstructure having a center conductor and wherein the wick stop structure supports the center conductor.

14. The electronic microstructure according to claim 1 , comprising a chip flip-chip mounted to the mounting surface.

15. The electronic microstructure according to claim 1 , comprising a surface mount component mounted to the mounting surface.

16. A method of forming the electronic microstructure of claim 1 , comprising

depositing the plurality of layers of metal and the one or more layers of a material that is non-wetting over a substrate, thereby forming the electronic microstructure of claim 1 above the substrate.

17. The method of claim 16 , wherein the material that is non-wetting comprises one or more of an insulating material, a dielectric, plated nickel, and a metal oxide.

18. The method of claim 16 , wherein the microstructure comprises a stop pad at the mounting surface, the stop pad formed of one or more of the plurality of layers, for establishing the thickness of the metallic solder or conductive epoxy.

19. The method of claim 18 , wherein the microstructure comprises a mechanical anchor disposed within the microstructure and attached to the stop pad, the anchor formed of one or more layers of the material that is non-wetting.

20. The method of claim 16 , comprising operatively coupling one or more of a circuit board, hybrid circuit, and a semiconductor device to the mounting surface.

21. The method of claim 16 , wherein the wick stop structure comprises a shelf which extends outwardly away from a surface of the microstructure at which the shelf is located.

22. The method of claim 21 , wherein the shelf comprises a portion disposed within the microstructure.

23. The method of claim 16 , wherein the wick stop structure circumscribes a portion of the microstructure.

24. The method of claim 16 , wherein the wick stop structure is recessed within the microstructure.

25. The method of claim 16 , wherein the mounting surface comprises mounting feet to provide a G-S-G termination.

26. The method of claim 25 , wherein the wick stop structure is disposed proximate the mounting feet that protrude from the mounting surface.

27. The method of claim 16 , wherein the microstructure comprises a coaxial microstructure.

28. The method of claim 16 , wherein the microstructure comprises a coaxial microstructure having a center conductor and wherein the wick stop structure supports the center conductor.

29. The method of claim 16 , comprising flip-chip mounting a chip to the mounting surface.

30. The method of claim 16 , comprising mounting a surface mount component to the mounting surface.

31. The method of claim 16 , comprising providing the wick stop structure as a coating by atomic layer deposition.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Jul 30, 2025
From: ALTER DOMUS (US) LLC
To: CUBIC CORPORATION; CUBIC DIGITAL SOLUTIONS LLC; NUVOTRONICS, INC.
Reel/Frame 072281/0176 →
RELEASE OF SECURITY INTEREST AT REEL/FRAME 056393/0281 Recorded Jul 28, 2025
From: BARCLAYS BANK PLC, AS ADMINISTRATIVE AGENT
To: CUBIC CORPORATION; CUBIC DEFENSE APPLICATIONS, INC.; CUBIC DIGITAL SOLUTIONS LLC (FORMERLY PIXIA CORP.)
Reel/Frame 072282/0124 →
FIRST LIEN SECURITY AGREEMENT Recorded May 26, 2021
From: CUBIC CORPORATION; PIXIA CORP.; NUVOTRONICS, INC.
To: BARCLAYS BANK PLC
Reel/Frame 056393/0281 →
SECOND LIEN SECURITY AGREEMENT Recorded May 26, 2021
From: CUBIC CORPORATION; PIXIA CORP.; NUVOTRONICS, INC.
To: ALTER DOMUS (US) LLC
Reel/Frame 056393/0314 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE INSIDE THE ASSIGNMENT DOCUMENTATION PREVIOUSLY RECORDED AT REEL: 048698 FRAME: 0301. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 10, 2019
From: NUVOTRONICS, INC.
To: CUBIC CORPORATION
Reel/Frame 048843/0801 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2019
From: NUVOTRONICS, INC.
To: CUBIC CORPORATION
Reel/Frame 048698/0301 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 14, 2018
From: SHERRER, DAVID W; REID, JAMES R, JR
To: NUVOTRONICS, INC
Reel/Frame 045208/0384 →
Continuity (4)
Continuation 14494716 · Sep 24, 2014
Division 13488991 · Jun 5, 2012
Provisional Application 61493516 · Jun 5, 2011
Related Publication 20170055348A1 · Feb 23, 2017