IP Library › Granted Patent US 10,325,940
Granted Patent B2
US 10,325,940 · App. 15/347,967 · Granted Jun 18, 2019

Vehicle, display device and manufacturing method for a semiconductor device

Inventors: Toru Takayama (Kanagawa, JP); Junya Maruyama (Kanagawa, JP); Yuugo Goto (Kanagawa, JP); Hideaki Kuwabara (Kanagawa, JP); Shunpei Yamazaki (Tokyo, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/1266B60R1/00B60R11/0229B60R11/04H01L21/6835H01L21/76251H01L27/1218H01L27/3244B60R2011/004B60R2300/202B60R2300/802H01L2221/6835H01L2221/68318H01L2221/68363H01L2221/68386H01L2227/323H01L2227/326
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Quick Facts
Patent No.
US 10,325,940
App. No.
15/347,967
Granted
Jun 18, 2019
Kind
B2
Abstract

To provide a semiconductor device in which a layer to be peeled is attached to a base having a curved surface, and a method of manufacturing the same, and more particularly, a display having a curved surface, and more specifically a light-emitting device having a light emitting element attached to a base with a curved surface. A layer to be peeled, which contains a light emitting element furnished to a substrate using a laminate of a first material layer which is a metallic layer or nitride layer, and a second material layer which is an oxide layer, is transferred onto a film, and then the film and the layer to be peeled are curved, to thereby produce a display having a curved surface.

Claims (28)

1. A method for manufacturing a semiconductor device comprising a transistor, the transistor comprising a semiconductor layer, a source electrode, and a drain electrode, the method comprising:

forming a separation layer over a substrate;

forming a peeled layer comprising the transistor over the separation layer; and

irradiating the separation layer with a laser light to separate the peeled layer from the substrate,

wherein the peeled layer is capable of curving in a first direction,

wherein a scan direction of the laser light and a direction of a channel length of the transistor which is a direction from one of the source electrode and the drain electrode to the other of the source electrode and the drain electrode are each a second direction, and

wherein the first direction is perpendicular to the second direction.

2. The method according to claim 1 , wherein the separation layer is formed of an amorphous silicon or a polysilicon.

3. The method according to claim 1 , wherein the separation layer is formed by a sputtering method or a plasma CVD method so as to put a large amount of hydrogen into the separation layer.

4. The method according to claim 1 , wherein the substrate is a glass substrate or a quartz substrate.

5. The method according to claim 1 , wherein elements included in the peeled layer are formed at 410° C. or below.

6. The method according to claim 1 , wherein a shape of the laser light is linear or rectangular.

7. The method according to claim 1 , wherein the laser light is irradiated to a back surface of the separation layer through the substrate.

8. A method for manufacturing a semiconductor device comprising a transistor, the transistor comprising a semiconductor layer, a source electrode, and a drain electrode, the method comprising:

forming a separation layer over a substrate;

forming a peeled layer comprising the transistor over the separation layer;

irradiating the separation layer with a laser light to separate the peeled layer from the substrate; and

transferring the peeled layer to an object,

wherein the peeled layer is capable of curving in a first direction,

wherein a scan direction of the laser light and a direction of a channel length of the transistor which is a direction from one of the source electrode and the drain electrode to the other of the source electrode and the drain electrode are each a second direction, and

wherein the first direction is perpendicular to the second direction.

9. The method according to claim 8 , wherein the separation layer is formed of an amorphous silicon or a polysilicon.

10. The method according to claim 8 , wherein the separation layer is formed by a sputtering method or a plasma CVD method so as to put a large amount of hydrogen into the separation layer.

11. The method according to claim 8 , wherein the substrate is a glass substrate or a quartz substrate.

12. The method according to claim 8 , wherein elements included in the peeled layer are formed at 410° C. or below.

13. The method according to claim 8 , wherein a shape of the laser light is linear or rectangular.

14. The method according to claim 8 , wherein the laser light is irradiated to a back surface of the separation layer through the substrate.

15. The method according to claim 8 , wherein the object has a curved surface.

Priority Claims (1)
JP 2001-367412 · Nov 30, 2001 · national
Continuity (4)
Continuation 14457140 · Aug 12, 2014
Continuation 11877934 · Oct 24, 2007
Division 10303080 · Nov 25, 2002
Related Publication 20170125454A1 · May 4, 2017
Cited By (1)
US 12,691,528