Systems and methods for machine control
A region of space may be monitored for the presence or absence of one or more control objects, and object attributes and changes thereto may be interpreted as control information provided as input to a machine or application. In some embodiments, the region is monitored using a combination of scanning and image-based sensing.
1. A computer implemented method for conducting machine control, the method comprising:
scanning a region of space, the scanning including:
directing at least two emission cycles, including a first emission cycle from a first hardware type and a second emission cycle from a second hardware type, to form at least two scan patterns that scan from an emission region to the region of space, a first scan pattern of the at least two scan patterns being different from a second scan pattern of the at least two scan patterns;
detecting a reflectance from the first scan pattern; and
determining that the detected reflectance from the first scan pattern indicates a presence of an object in the region of space;
determining a first object attribute set of one or more object attributes of the object for the first scan pattern;
determining a second object attribute set of one or more object attributes of the object for is the second scan pattern;
analyzing the first object attribute set and the second object attribute set to determine a control portion of the object;
directing a third emission cycle from hardware of the second hardware type to form the second scan pattern to determine a third object attribute set of one or more object attributes of the object;
comparing the second object attribute set and the third object attribute set to determine control information; and
responding to the determined control information according to response criteria.
2. The computer implemented method according to claim 1 ,
wherein the second object attribute set and the third object attribute set comprises attributes of the control portion of the object, and
wherein the comparing of the second object attribute set and the third object attribute set includes comparing control portion attributes selected from the second object attribute set with control portion attributes selected from the third object attribute set.
3. The computer implemented method according to claim 1 , wherein the response criteria includes determining whether to respond to the control information.
4. The computer implemented method according to claim 3 , wherein the second scan pattern is more refined than the first scan pattern.
5. The computer implemented method according to claim 4 , wherein the second scan pattern captures surface detail about the object.
6. The computer implemented method according to claim 5 , wherein the determining of the first object attribute set and the determining of the second object attribute set include determining control-portion attributes based at least in part on captured surface detail about the object.
7. The computer implemented method according to claim 1 , wherein the determining of the first object attribute set includes identifying a presence of a hand in the region of space.
8. The computer implemented method according to claim 7 , wherein the analyzing of the first object attribute set and the second object attribute set to determine the control portion of the object includes identifying a fingertip of the identified hand.
9. The computer implemented method of claim 8 , wherein the comparing of the second object attribute set and the third object attribute set to determine the control information includes identifying a movement of the identified fingertip.
10. The computer implemented method of claim 1 ,
wherein the first scan pattern is configured to provide sequential emissions from emitters of the emission region in a binary manner such that each of the emitters is turned on and off one at a time, and
wherein the second scan pattern is configured to provide simultaneously overlapping emissions from the emitters.
11. The computer implemented method of claim 1 ,
wherein the first scan pattern is configured to provide emissions from emitters of the emission region in a first order, and
wherein the second scan pattern is configured to provide emissions from other emitters of the emission region in a second order, which is different from the first order.
12. The computer implemented method of claim 1 ,
wherein the first scan pattern is configured to provide emissions from the emission region at a first rate, and
wherein the second scan pattern is configured to provide emissions from the emission region at a second rate, which is different from the first rate.
13. The computer implemented method of claim 1 , wherein the directing of the at least two emission cycles includes varying a first power state of a first light emitter at least partially in concurrence with varying a second power state of a second light emitter.
14. The computer implemented method of claim 1 , wherein the directing of the at least two emission cycles includes extinguishing a first light emitter completely before activating a second light emitter.
15. The computer implemented method of claim 1 , wherein the emission region includes a first emission point and a second emission point rotationally pivotable about one or more axes having an origin point within the emission region.
16. The computer implemented method of claim 15 , wherein the first emission point is the same as the second emission point.
17. A non-transitory computer readable storage medium impressed with computer program instructions for conducting machine control, the instructions, when executed on a processor, implement a method comprising:
scanning a region of space, the scanning including:
directing at least two emission cycles, including a first emission cycle from a first hardware type and a second emission cycle from a second hardware type, to form at least two scan patterns that scan from an emission region to the region of space, a first scan pattern of the at least two scan patterns being different from a second scan pattern of the at least two scan patterns;
detecting a reflectance from the first scan pattern; and
determining that the detected reflectance from the first scan pattern indicates a presence of an object in the region of space;
determining a first object attribute set of one or more object attributes of the object for the first scan pattern;
determining a second object attribute set of one or more object attributes of the object for the second scan pattern;
analyzing the first object attribute set and the second object attribute set to determine a control portion of the object;
directing a third emission cycle from hardware of the second hardware type to form the second scan pattern to determine a third object attribute set of one or more object attributes of the object;
comparing the second object attribute set and the third object attribute set to determine control information; and
responding to the determined control information according to response criteria.
18. A system including one or more processors coupled to memory, the memory loaded with computer instructions for conducting machine control, the instructions, when executed on the processors, implement actions comprising:
scanning a region of space, the scanning including:
directing at least two emission cycles, including a first emission cycle from a first hardware type and a second emission cycle from a second hardware type, to form at least two scan patterns that scan from an emission region to the region of space, a first scan pattern of the at least two scan patterns being different from a second scan pattern of the at least two scan patterns;
detecting a reflectance from the first scan pattern; and
determining that the detected reflectance from the first scan pattern indicates a presence of an object in the region of space;
determining a first object attribute set of one or more object attributes of the object for the first scan pattern;
determining a second object attribute set of one or more object attributes of the object for the second scan pattern;
analyzing the first object attribute set and the second object attribute set to determine a control portion of the object;
directing a third emission cycle from hardware of the second hardware type to form the second scan pattern to determine a third object attribute set of one or more object attributes of the object;
comparing the second object attribute set and the third object attribute set to determine control information; and
responding to the determined control information according to response criteria.