Apparatus and method for contamination identification
Method and apparatus for identifying a contaminant on a substrate. Identification of a contaminant removed from a substrate can be useful in identifying and eliminating or reducing the source of the contamination and tailoring the removal method to minimize the potential for substrate damage. The methods and apparatus for identification of the contaminant provide liberation of molecules of the contaminant from the surface of the substrate, accounting for different geometries and substrate materials, sample preparation, and chemical analysis of the contaminant.
1. A method of analyzing contaminants on the surface of a photomask, comprising the steps of:
directing electromagnetic waves toward the photomask having a contaminating particulate disposed thereon, the electromagnetic waves having a wavelength that is substantially the same as a local maximum of the absorption spectrum of the photomask;
generating a first temperature increase in the photomask with the electromagnetic waves;
inducing a second temperature increase in the contaminant due to the first temperature increase in the photomask;
producing a thermal decomposition of the contaminant from the surface of the photomask; and
analyzing the composition of the contaminant.
2. The method of claim 1 , wherein the electromagnetic waves are laser light.
3. The method of claim 2 , wherein the laser wavelength is above 8 micrometers.
4. The method of claim 1 , wherein the photomask includes at least one thin film layer.
5. The method of claim 4 , wherein the at least one thin film layer is patterned and includes void areas under which respective portions of the photomask are exposed.
6. The method of claim 1 , further comprising maintaining a temperature of the photomask below a threshold temperature to prevent damage thereto.
7. The method of claim 1 , wherein the photomask includes at least two materials and the wavelength of the electromagnetic waves is substantially the same as a local maximum of the absorption spectrum of the photomask.
8. The method of claim 1 , wherein the step of analyzing the composition of the contaminant utilizes spectroscopy.
9. The method of claim 1 , wherein the step of analyzing the composition of the contaminant utilizes mass spectroscopy.
10. A method of mitigating the effects of contaminants on the surface of a substrate, comprising the steps of:
directing electromagnetic waves toward the substrate having a contaminating particulate disposed thereon, the electromagnetic waves having a wavelength that is substantially the same as a local maximum of the absorption spectrum of the substrate;
generating a first temperature increase in the substrate with the electromagnetic waves;
inducing a second temperature increase in the contaminant due to the first temperature increase in the substrate;
producing a thermal decomposition of the contaminating particulate from the surface of the substrate; and
analyzing the contaminating particulate.
11. The method of claim 10 , further comprising maintaining a temperature of the substrate below a threshold temperature to prevent damage thereto.
12. The method of claim 10 , wherein the step of analyzing the composition of the contaminant utilizes spectroscopy.
13. The method of claim 10 , wherein the step of analyzing the composition of the contaminant utilizes mass spectroscopy.