IP Library Granted Patent US 10,077,188
Granted Patent B2
US 10,077,188 · App. 15/405,603 · Granted Sep 18, 2018

Manufacturing method of MEMS chip

Inventors: Dan Dai (Jiangsu, CN); Xinwei Zhang (Jiangsu, CN); Guoping Zhou (Jiangsu, CN); Changfeng Xia (Jiangsu, CN)
Assignee: CSMC TECHNOLOGIES FAB1 CO., LTD.
B81C1/00825B81C2201/0167B81C2201/053
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Quick Facts
Patent No.
US 10,077,188
App. No.
15/405,603
Granted
Sep 18, 2018
Kind
B2
Abstract

A method of manufacturing a MEMS chip includes: providing a silicon substrate layer, the silicon substrate layer comprising a front surface configured to perform a MEMS process and a rear surface opposite to the front surface; growing a first oxidation layer mainly made of SiO 2 on the rear surface of the silicon substrate layer by performing a thermal oxidation process; and depositing a first thin film layer mainly made of silicon nitride on the first oxidation layer by performing a low pressure chemical vapor deposition process.

Claims (10)

1. A method of manufacturing a MEMS chip, comprising:

providing a silicon substrate layer, the silicon substrate layer comprising a front surface for a MEMS process and a rear surface opposite to the front surface;

growing a first oxidation layer mainly made of SiO 2 on the rear surface of the silicon substrate layer by performing a thermal oxidation process;

depositing a first thin film layer mainly made of silicon nitride on the first oxidation layer by performing a low pressure chemical vapor deposition process;

growing a second oxidation layer mainly made of SiO 2 on the front surface of the silicon substrate layer by performing a thermal oxidation process;

wherein a ratio of a thickness of the first oxidation layer to a thickness of the first thin film layer ranges from 3 to 4.

2. The method according to claim 1 , wherein the thickness of the first oxidation layer is 400 nm, the thickness of the first thin film layer is 100 nm, a thickness of the second oxidation layer is 100 nm.

3. The method according to claim 1 , further comprising:

depositing a second thin film layer mainly made of silicon nitride on the second oxidation layer by performing a low pressure chemical vapor deposition process, wherein the second oxidation layer has the same thickness as that of the first oxidation layer, the second thin film layer has the same thickness as that of the first thin film layer.

4. The method of claim 1 , wherein the silicon substrate layer is high purity silicon.

Assignments (1)
MERGER Recorded Apr 29, 2019
From: CSMC TECHNOLOGIES FAB1 CO., LTD.
To: CSMC TECHNOLOGIES FAB2 CO., LTD.
Reel/Frame 049018/0616 →
Priority Claims (1)
CN 2012 1 0234964 · Jul 6, 2012 · national
Continuity (2)
Division 14411537
Related Publication 20170121175A1 · May 4, 2017