IP Library Granted Patent US 10,050,171
Granted Patent B2
US 10,050,171 · App. 15/408,012 · Granted Aug 14, 2018

Photodiode structures

Inventors: John J. Ellis-Monaghan (Grand Isle, VT); Jeffrey P. Gambino (Portland, OR); Mark D. Jaffe (Shelburne, VT); Kirk D. Peterson (Jericho, VT)
Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
H01L31/1872G02B6/12H01L31/028H01L31/02327H01L31/103H01L31/1808H01L31/1864
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Quick Facts
Patent No.
US 10,050,171
App. No.
15/408,012
Granted
Aug 14, 2018
Kind
B2
Abstract

Photodiode structures and methods of manufacture are disclosed. The method includes forming a waveguide structure in a dielectric layer. The method further includes forming a Ge material in proximity to the waveguide structure in a back end of the line (BEOL) metal layer. The method further includes crystallizing the Ge material into a crystalline Ge structure by a low temperature annealing process with a metal layer in contact with the Ge material.

Claims (39)

1. A structure, comprising:

a waveguide structure and metal wiring layers in a dielectric material;

a single crystalline Ge structure formed in the dielectric material and-separated from the waveguide structure in the dielectric material; and

at least one metal filled via in electrical contact with the single crystalline Ge structure; and

lined vias and trenches in the dielectric material, over the single crystalline Ge structure, wherein the lined vias and trenches is a nickel seed layer.

2. The structure of claim 1 , wherein at least one capping layer is between the at least one metal filled via and the single crystalline Ge structure.

3. The structure of claim 1 , wherein the single crystalline Ge structure is adjacent to the waveguide structure.

4. The structure of claim 1 , wherein the single crystalline Ge structure is a photodector above the waveguide structure.

5. The structure of claim 1 , wherein the single crystalline Ge structure is a photodector adjacent the waveguide structure.

6. The structure of claim 1 , wherein further comprising a barrier layer between the single crystalline Ge structure and the waveguide structure.

7. The structure of claim 6 , wherein the barrier layer is nitride.

8. The structure of claim 1 , wherein the single crystalline Ge structure includes nucleation sites.

9. The structure of claim 8 , wherein the nucleation sites include a capping layer which is in direct contact with both the single crystalline Ge structure and the at least one metal filled via.

10. The structure of claim 1 , wherein the lined vias and trenches are filled with metal material.

11. A structure, comprising:

a waveguide structure and metal wiring layers in a dielectric material;

a single crystalline Ge structure formed in the dielectric material and-separated from the waveguide structure in the dielectric material;

at least one metal filled via in electrical contact with the single crystalline Ge structure; and

lined vias and trenches in the dielectric material, over the single crystalline Ge structure, wherein:

the lined vias and trenches is germanides;

the single crystalline Ge structure includes nucleation sites;

the nucleation sites include a capping layer which is in direct contact with both the single crystalline Ge structure and the at least one metal filled via; and

the capping layer is NiGe, using Ni as a seed layer.

12. The structure of claim 1 , further comprising a boundary layer in the single crystalline Ge structure.

13. The structure of claim 6 , wherein:

the single crystalline Ge structure is laterally offset from a center of the waveguide structure; and

the barrier layer separates the single crystalline Ge structure and the waveguide structure from one another such that there is no contact.

14. The structure of claim 13 , wherein the waveguide structure is composed of Si.

15. The structure of claim 13 , further comprising a boundary layer in the single crystalline Ge structure and on a side of the waveguide structure.

16. A structure, comprising:

a waveguide structure and metal wiring layers in a dielectric material;

a single crystalline Ge structure formed in the dielectric material and-separated from the waveguide structure in the dielectric material;

at least one metal filled via in electrical contact with the single crystalline Ge structure; and

a barrier layer between the single crystalline Ge structure and the waveguide structure,

wherein:

the single crystalline Ge structure is laterally offset from a center of the waveguide structure;

the barrier layer separates the single crystalline Ge structure and the waveguide structure from one another such that there is no contact; and

the at least one metal filled via is two metal filled vias in electrical contact with a capping layer of the single crystalline Ge structure, the two metal filled vias being dual damascene structures offset from a center of the waveguide structure such that they do not interfere with light entering the waveguide structure.

17. The structure of claim 1 , wherein the waveguide structure is composed of nitride material.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 17, 2017
From: ELLIS-MONAGHAN, JOHN J.; GAMBINO, JEFFREY P.; JAFFE, MARK D.; PETERSON, KIRK D.
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 040992/0535 →
Continuity (2)
Division 14483584 · Sep 11, 2014
Related Publication 20170125627A1 · May 4, 2017