IP Library › Granted Patent US 10,170,715
Granted Patent B2
US 10,170,715 · App. 15/418,254 · Granted Jan 1, 2019

Method for producing a vertical organic field-effect transistor, and vertical organic field-effect transistor

Inventors: Hans Kleemann (Dresden, DE); Gregor Schwartz (Dresden, DE)
Assignee: Novaled GmbH
H01L51/057H01L51/0016H01L51/0017H01L51/105H01L51/0004
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,170,715
App. No.
15/418,254
Granted
Jan 1, 2019
Kind
B2
Abstract

The invention relates to a method for producing a vertical organic field-effect transistor, in which a vertical organic field-effect transistor with a layer arrangement is produced on a substrate, said layer arrangement including transistor electrodes, namely a first electrode ( 23; 24 ), a second electrode ( 23; 24 ) and a third electrode ( 32 ), electrically insulating layers ( 25; 34 ) and an organic semiconductor layer ( 28 ). In addition, a vertical organic field-effect transistor is provided, which includes a layer arrangement with transistor electrodes on a substrate ( 21 ).

Claims (13)

1. Method for producing a vertical organic field-effect transistor, in which a vertical organic field-effect transistor with a layer arrangement is produced on a substrate, said layer arrangement comprising transistor electrodes, namely a first electrode, a second electrode and a third electrode, electrically insulating layers and an organic semiconductor layer, wherein the method comprises the following steps:

providing a substrate,

depositing a selectively adhesive layer on the substrate;

producing a partial layer structure of the vertical organic field-effect transistor, which comprises at least one of the transistor electrodes and at least one of the electrically insulating layers, which adhere to the selectively adhesive layer in a respective direct contact region; and

producing at least one organic semiconductor layer, by at least one organic semiconductor material being adhesively deposited on the partial layer structure and the selectively adhesive layer preventing an adhesive deposition of the at least one organic semiconductor material outside of the partial layer structure; and

producing a residual partial layer structure of the vertical organic field-effect transistor.

2. Method according to claim 1 , wherein the partial layer structure is produced with the first electrode.

3. Method according to claim 2 , wherein the organic semiconductor layer is adhesively deposited on the first electrode, the second electrode and the at least one electrically insulating layer.

4. Method according to claim 1 , wherein in producing the partial layer structure the at least one transistor electrodes and the at least one electrically insulating layer are structured.

5. Method according to claim 4 , wherein the structuring is implemented as a plasma-assisted etching, in which case a plasma application also covers a surface of the selectively adhesive layer outside of the partial layer structure.

6. Method according to claim 1 , wherein a layer made from the at least one organic semiconductor material, which is not adhesively deposited outside the partial layer structure during production of the semiconductor layer, makes a contact angle of greater than 21±2 degrees with a surface of the selectively adhesive layer.

7. Method according to claim 6 , wherein the layer made from the at least one organic semiconductor material is formed as a non-closed layer.

8. Method according to claim 1 , wherein the selectively adhesive layer is made from an electrically insulating material.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 6, 2017
From: KLEEMANN, HANS; SCHWARTZ, GREGOR
To: NOVALED GMBH
Reel/Frame 041877/0935 →
Priority Claims (1)
EP 16153391 · Jan 29, 2016 · regional
Continuity (1)
Related Publication 20170222166A1 · Aug 3, 2017