Reception circuit

1. A reception circuit comprising:

a skew calculation circuit that calculates, based on first sampled values and second sampled values, a skew between data and a strobe signal, the first sampled values being obtained by sampling the data at a cycle one half of or shorter than one half of a cycle of the strobe signal with using an N-phase clock (N represents an integer of 2 or larger), the second sampled values being obtained by sampling the strobe signal at the cycle one half of or shorter than one half of the cycle of the strobe signal with using the N-phase clock; and

a sampling timing correction circuit that corrects sampling timings of the data based on the skew calculated by the skew calculation circuit.

2. The reception circuit of claim 1 , wherein

the skew calculation circuit includes:

an edge timing calculation circuit that calculates edge timings of the data and the strobe signal respectively based on the first and second sampled values; and

an edge timing difference circuit that calculates a difference between the edge timings of the data and the strobe signal, and wherein

the skew calculation circuit sets the difference between the edge timings as the skew.

3. The reception circuit of claim 2 , wherein

the edge timing calculation circuit sets the sampling timings where the first sampled value of the data changes between 0 and 1 as the edge timings of the data, and

the edge timing calculation circuit sets the sampling timings where the second sampled value of the strobe signal changes between 0 and 1 as the edge timings of the strobe signal.

4. The reception circuit of claim 2 , further comprising:

a data determination circuit that determines whether the data is 0 or 1 based on the first sampled values obtained in the sampling timings after the correction.

5. The reception circuit of claim 4 , further comprising:

an intermediate timing calculation circuit that calculates an intermediate timing between the edge timings of the strobe signal, wherein

the sampling timing correction circuit shifts the intermediate timing by the skew; and

the data determination circuit selects the first sampled value obtained in the shifted intermediate timing as the value of the data.

6. The reception circuit of claim 5 , wherein

the intermediate timing is a substantially central timing between a rising edge timing and a falling edge timing of the strobe signal.

7. The reception circuit of claim 1 , further comprising:

a first oversampling circuit that samples, at a cycle one half of or shorter than one half of a cycle of the strobe signal, the data based on the N-phase clock; and

a second oversampling circuit that samples, at a cycle one half of or shorter than one half of a cycle of the strobe signal, the strobe signal based on the N-phase clock.

8. The reception circuit of claim 7 , wherein

the first oversampling circuit includes:

a first latch circuit that latches the data based on a clock in a first phase of the N-phase clock; and

a second latch circuit that latches the data based on a clock in a second phase of the N-phase clock, and

the second oversampling circuit includes:

a third latch circuit that latches the strobe signal based on the clock in the first phase of the N-phase clock; and

a fourth latch circuit that latches the strobe signal based on the clock in the second phase of the N-phase clock.

9. The reception circuit of claim 1 , further comprising:

a controller receives the data and the strobe signal from a NAND memory.

10. The reception circuit of claim 9 , wherein the strobe signal is generated based on a read enable signal output from the controller.

11. A reception circuit comprising:

a correct timing calculation circuit that calculates, based on first sampled values and second sampled values, a correct timing of sampling timings of a test pattern relative to a sampling timing of a strobe signal when the test pattern and the strobe signal are sampled, the first sampled values being obtained by sampling the test pattern at a cycle one half of or shorter than one half of a cycle of the strobe signal with using an N-phase clock (N represents an integer of 2 or larger), the second sampled values being obtained by sampling the strobe signal at the cycle one half of or shorter than one half of the cycle of the strobe signal with using the N-phase clock; and

a sampling timing setting circuit that sets sampling timing of data received together with the strobe signal based on the correct timing calculated by the correct timing calculation circuit.

12. The reception circuit of claim 11 , further comprising:

a selection circuit that sets the sampling timing of the test pattern corresponding to the correct timing in a data window and selects a sampling value within the data window as a value of the data.

13. The reception circuit of claim 11 , further comprising:

a comparison circuit that compares a sampling value obtained by repeatedly inputting of the test pattern with an expectation value for individual sampling timings.

14. The reception circuit of claim 12 , further comprising:

an intermediate timing calculation circuit that calculates an intermediate timing between edge timings of the strobe signal; and

an intermediate timing shift circuit that shifts the calculated intermediate timing such that the intermediate timing falls within the data window; wherein

the selection circuit selects a sampling value obtained in the shifted intermediate timing as the value of the data.

15. The reception circuit of claim 14 , wherein

the intermediate timing shift circuit shifts a central timing between the edge timings of the strobe signal such that the central timing between the edge timings of the strobe signal coincides with a central timing within the data window, and

the selection circuit selects the first sampled value obtained in the central timing of the strobe signal as the value of the data.

16. The reception circuit of claim 11 , further comprising:

a first oversampling circuit that samples, at a cycle one half of or shorter than one half of a cycle of the strobe signal, the data based on the N-phase clock; and

a second oversampling circuit that samples, at a cycle one half of or shorter than one half of a cycle of the strobe signal, the strobe signal based on the N-phase clock.

17. The reception circuit of claim 16 , wherein

the first oversampling circuit includes:

a first latch circuit that latches the data based on a clock in a first phase of the N-phase clock; and

a second latch circuit that latches the data based on a clock in a second phase of the N-phase clock, and

the second oversampling circuit includes:

a third latch circuit that latches the strobe signal based on the clock in the first phase of the N-phase clock; and

a fourth latch circuit that latches the strobe signal based on the clock in the second phase of the N-phase clock.

18. The reception circuit of claim 12 , further comprising:

a controller receives the data and the strobe signal from a NAND memory.

19. The reception circuit of claim 18 , wherein the strobe signal is generated based on a read enable signal output from the controller.

20. The reception circuit of claim 18 , wherein

the test pattern is stored in a first area of the NAND memory specified by a first address, and the data is stored in a second area of the NAND memory specified by a second address,

the controller reads the test pattern from the NAND memory by specifying the first address,

the controller calculates the correct timing of the test pattern from a received result of the test pattern,

the controller reads the test pattern from the NAND memory by specifying the second address, and

the controller corrects the sampling timing of the data based on the correct timing of the test pattern.