Method and apparatus for reading RRAM cell
The present disclosure relates to a method and apparatus for performing a read operation of an RRAM cell, which applies a non-zero bias voltage to unselected bit-lines and select-lines to increase a read current window without damaging corresponding access transistors. In some embodiments, the method may be performed by activating a word-line coupled to a row of RRAM cells comprising a selected RRAM device by applying a first read voltage to the word-line. A second read voltage is applied to a bit-line coupled to a first electrode of the selected RRAM device. One or more non-zero bias voltages are applied to bit-lines and select-lines coupled to RRAM cells, within the row of RRAM cells, having unselected RRAM devices.
1. A method of operating an RRAM array, comprising:
performing a read operation of a selected RRAM device, by:
activating a word-line coupled to a row of RRAM cells within an RRAM array by applying a first read voltage to the word-line, wherein the row of RRAM cells comprises the selected RRAM device;
applying a second read voltage to a bit-line coupled to a first electrode of the selected RRAM device; and
applying one or more non-zero bias voltages to bit-lines and select-lines coupled to RRAM cells, within the row of RRAM cells, which have unselected RRAM devices.
2. The method of claim 1 , wherein the first read voltage is larger than the one or more non-zero bias voltages.
3. The method of claim 1 , wherein the first read voltage is approximately equal to 1.4 volts.
4. The method of claim 1 , wherein the one or more non-zero bias voltages is approximately equal to the second read voltage.
5. The method of claim 1 , further comprising:
applying a third read voltage to a select-line operably coupled to a second electrode of the selected RRAM device, wherein the second read voltage is larger than the third read voltage.
6. The method of claim 5 , wherein the third read voltage may be equal to a drain supply voltage.
7. The method of claim 1 , further comprising:
not applying the one or more non-zero bias voltages to the bit-lines and the select-lines coupled to the RRAM cells, within the row of RRAM cells, which have the unselected RRAM devices, during a set operation and a reset operation.
8. The method of claim 1 , further comprising:
performing a set operation on the selected RRAM device, wherein performing the set operation comprises:
activating the word-line coupled to the row of RRAM cells within the RRAM array by applying a first set voltage to the word-line; and
applying a second set voltage to the bit-line coupled to the first electrode of the selected RRAM device.
9. The method of claim 8 , wherein the first read voltage is larger than the first set voltage.
10. The method of claim 8 , further comprising:
applying a third set voltage, which is smaller than the second set voltage, to a select-line operably coupled to a second electrode of the selected RRAM device, wherein a difference between the first read voltage and the one or more non-zero bias voltages is approximately equal to a difference between the first set voltage and the third set voltage.
11. A method of operating an RRAM array, comprising:
performing a read operation of a selected RRAM device, by:
applying a first non-zero voltage to a word-line coupled to a row of RRAM cells within an RRAM array, wherein the row of RRAM cells comprises the selected RRAM device;
applying a second non-zero voltage to a bit-line coupled to a first electrode of the selected RRAM device;
applying a substantially zero voltage to a select-line operably coupled to a second electrode of the selected RRAM device; and
applying a non-zero bias voltage to bit-lines and select-lines coupled to RRAM cells, within the row of RRAM cells, which have unselected RRAM devices.
12. The method of claim 11 , wherein the first non-zero voltage is larger than the non-zero bias voltage.
13. The method of claim 11 , wherein the second non-zero voltage is approximately equal to the non-zero bias voltage.
14. The method of claim 11 , further comprising:
not applying the non-zero bias voltage to the bit-lines and the select-lines operably coupled to the unselected RRAM devices during a set operation or a reset operation.
15. The method of claim 11 , further comprising:
performing a set operation of the selected RRAM device, wherein performing the set operation comprises applying a first non-zero set voltage to the word-line coupled to the row of RRAM cells; and
wherein the first non-zero voltage is larger than the first non-zero set voltage.
16. The method of claim 15 , wherein performing the set operation further comprises:
applying a second non-zero set voltage to the bit-line coupled to the first electrode of the selected RRAM device; and
applying a substantially zero set voltage to the select-line operably coupled to the second electrode of the selected RRAM device.
17. The method of claim 16 , wherein a difference between the first non-zero voltage and the non-zero bias voltage is approximately equal to a difference between the first non-zero set voltage and the substantially zero set voltage.
18. An integrated chip, comprising:
an RRAM array comprising a plurality of RRAM cells;
a word-line decoder configured to apply a first read voltage to a word-line coupled to a row of RRAM cells within the RRAM array, wherein the row of RRAM cells comprises a selected RRAM device;
a bit-line decoder configured to apply a second read voltage to a bit-line coupled to a first electrode of the selected RRAM device; and
a bias element configured to apply a non-zero bias voltage to bit-lines and select-lines coupled to RRAM cells, within the row of RRAM cells, which have unselected RRAM devices.
19. The integrated chip of claim 18 , further comprising:
a select-line decoder configured to apply a third read voltage to a select-line operably coupled to a second electrode of the selected RRAM device, wherein the second read voltage is larger than the third read voltage.
20. The integrated chip of claim 19 , further comprising:
a control unit configured to provide an address to the bit-line decoder and the select-line decoder, wherein the address defines a location of the selected RRAM device within the RRAM array; and
wherein the bias element comprises a bias element decoder configured to receive the address from the control unit and to selectively apply the non-zero bias voltage to the bit-lines and the select-lines coupled to the unselected RRAM devices based upon the address.