Method for increasing driving current of junctionless transistor
Provided is a method for increasing a driving current of a junctionless transistor that includes: a substrate; a source region and a drain region which are formed on the substrate and are doped with the same type of dopant; a nanowire channel region which connects the source region and the drain source and is doped with the same type dopant as that of the source region and the drain region; a gate insulation layer which is formed to surround the nanowire channel region; and a gate electrode which is formed on the gate insulation layer and is formed to surround the nanowire channel region. An amount of current flowing through the nanowire channel region is increased by joule heat generated by applying a voltage to the source region and the drain region.
1. A method for increasing a driving current of a junctionless transistor which comprises:
a substrate;
a source region and a drain region which are formed on the substrate and are doped with the same type of dopant;
a nanowire channel region which connects the source region and the drain source and is doped with the same type dopant as that of the source region and the drain region;
a gate insulation layer which is formed to surround the nanowire channel region; and
a gate electrode which is formed on the gate insulation layer and is formed to surround the nanowire channel region,
wherein a concentration of the dopant doped in the source region and the drain region is higher than that of the dopant doped in the nanowire channel region, the method comprising:
increasing an amount of current flowing through the nanowire channel region by joule heat generated by applying a voltage to the source region and the drain region.
2. The method of claim 1 , wherein a plurality of the nanowire channel regions are formed and wherein the plurality of the nanowire channel regions are stacked in a direction vertical to the ground, so that a vertically stacked transistor is formed.
3. The method of claim 1 , wherein the junctionless transistor comprises at least one of a transistor formed by using group III-V elements, a transistor comprising germanium elements, a transistor formed by using two dimensional materials, a three dimensional transistor, a transistor comprising a High-k dielectric material and a metal gate electrode, a transistor comprising a polymer organic material, and a transistor formed by using a silicon-on-insulator wafer.
4. The method of claim 3 ,
wherein the junctionless transistor is the three dimensional transistor, and
wherein the three dimensional transistor comprises at least one of a fin transistor, a gate-all-around transistor, a double-gate transistor, a tri-gate transistor, or an omega-gate transistor.
5. The method of claim 3 ,
wherein the junctionless transistor is the transistor comprising the High-k dielectric material and the metal gate electrode, and
wherein, in the transistor comprising the High-k dielectric material and the metal gate electrode, a dielectric constant of the dielectric material is greater than 4.
6. The method of claim 3 ,
wherein the junctionless transistor is the transistor formed by using a silicon-on-insulator wafer, and
wherein the transistor formed by using a silicon-on-insulator wafer comprises at least one of strained silicon-on-insulator, germanium-on-insulator, strained germanium-on-insulator, or silicon germanium-on-insulator.
7. The method of claim 1 , wherein the gate electrode comprises at least one of polycrystalline silicon, high concentration N type doped polycrystalline silicon, high concentration P type doped polycrystalline silicon, Au, TaN, Al, Mo, Mg, Cr, Pd, Pt, and Ti.