Cointegration of optical waveguides, microfluidics, and electronics on sapphire substrates
A method of forming a semiconductor structure includes forming a first optical waveguide and a second optical waveguide on a sapphire substrate. The first optical waveguide and the second optical waveguide each include a core portion of gallium nitride (GaN), and a cladding layer laterally surrounding the core portion. The cladding layer includes a material having a refractive index less than a refractive index of the sapphire substrate. The method further includes etching a portion of the cladding layer to form a microfluidic channel therein and forming a capping layer on a top surface of the first optical waveguide, the second optical waveguide and the microfluidic channel.
1. A method of forming a semiconductor structure, said method comprising:
forming a first optical waveguide and a second optical waveguide on a sapphire substrate, wherein the first optical waveguide and the second optical waveguide each include a core portion of gallium nitride (GaN), and a cladding layer laterally surrounding the core portion, wherein the cladding layer includes a material having a refractive index less than a refractive index of the sapphire substrate;
etching a portion of the cladding layer to form a microfluidic channel in the cladding layer; and
forming a capping layer on a top surface of the first optical waveguide, the second optical waveguide and the microfluidic channel.
2. The method of claim 1 , wherein the cladding layer and the capping layer each include one of silicon oxide (SiO 2 ) or glass.
3. The method of claim 1 , wherein the first optical waveguide and the second optical waveguide are configured in an L-shape.
4. The method of claim 1 , wherein the cladding material has a topmost surface that is coplanar with a topmost surface of the core portion of the first and second optical waveguides.
5. The method of claim 1 , further comprising forming a light source on the sapphire substrate, wherein the light source is located at an outlet of the first optical waveguide.
6. The method of claim 5 , wherein the light source comprises a seed layer, a lower GaN layer of a first conductivity type located on the seed layer, an upper GaN layer of a second conductivity type that is opposite from the first conductivity type located on the lower GaN layer.
7. The method of claim 5 , wherein the forming the light source is performed prior to forming the microfluidic channel.
8. The method of claim 5 , wherein the forming the light source comprises:
etching a region of the cladding layer to expose a portion of the top surface of the sapphire substrate;
depositing a seed layer on the exposed portion of the top surface of the sapphire substrate;
forming a lower GaN layer having a first conductivity type on the seed layer;
forming an upper GaN layer having a second conductivity type, which differs from the first conductivity type, on the lower GaN layer;
etching a portion of the upper GaN layer to expose a portion of a top surface of the lower GaN layer; and
forming, in any order, a first contact on the upper GaN layer and a second contact on the lower GaN layer.
9. The method of claim 5 , further comprising forming a photodetector on the sapphire substrate, wherein the photodetector is located at a physically exposed sidewall of the second optical waveguide.
10. The method of claim 9 , wherein the forming the photodetector is performed prior to forming the microfluidic channel.
11. The method of claim 1 , wherein the microfluidic channel has a bottommost surface defined by a portion of a topmost surface of the sapphire substrate and a topmost surface defined by a portion of a bottommost surface of the cover structure.
12. The method of claim 1 , further comprising forming at least one analyte in the microfluidic channel.
13. The method claim 12 , further comprising attaching a particle to the at least one analyte.
14. The method of claim 13 , wherein the particle emits fluorescent light.
15. The method of claim 1 , wherein the microfluidic channel has a depth from 10 micrometers to 500 micrometers.
16. The method of claim 1 , wherein each of the first and second waveguides has a size from 1 micrometer to 50 micrometers.
17. A method of forming a semiconductor structure, said method comprising:
forming a first optical waveguide and a second optical waveguide on a sapphire substrate, wherein the first optical waveguide and the second optical waveguide each include a core portion of gallium nitride (GaN), and a cladding layer laterally surrounding the core portion, wherein the cladding layer includes a material having a refractive index less than a refractive index of the sapphire substrate;
etching a portion of the cladding layer to form a microfluidic channel in the cladding layer; and
forming a capping layer entirely above a top surface of the first optical waveguide, the second optical waveguide and the microfluidic channel.