Hybridization fin reveal for uniform fin reveal depth across different fin pitches
A semiconductor device having a uniform height across different fin densities includes a semiconductor substrate having fins etched therein and including dense fin regions and isolation regions without fins. One or more dielectric layers are formed at a base of the fins and the isolation regions and have a uniform height across the fins and the isolation regions. The uniform height includes a less than 2 nanometer difference across the one or more dielectric layers.
1. A semiconductor device having a uniform height across different fin densities, comprising:
a semiconductor substrate having fins etched therein and including dense fin regions having respective groups of the fins and dielectric material and isolation regions including the dielectric material without fins, at least two of the isolation regions having different lengths including a first isolation region having a first length defined between a first dense fin region and a second dense fin region, and a second isolation region having a second length defined between the second dense fin region and a third dense fin region; and
one or more dielectric layers formed at a base of the fins in respective ones of the dense fin regions and the isolation regions and each having a uniform height across the dense fin regions and the isolation regions, the uniform height including a less than 2 nanometer difference across the one or more dielectric layers.
2. The device as recited in claim 1 , wherein the one or more dielectric layers include a same dielectric material formed by a different process.
3. The device as recited in claim 1 , wherein one of the one or more dielectric layers includes a different dielectric material than at least another one of the one or more dielectric layers.
4. The device as recited in claim 1 , further comprising a liner formed below the one or more dielectric materials.
5. The device as recited in claim 1 , wherein a fin reveal depth includes a linear relationship with space between the fins.
6. The device as recited in claim 1 , wherein a normalized fin reveal depth includes negligible variation over spacings from about 0 nm to about 1000 nm.
7. The device as recited in claim 1 , wherein the uniform height includes a less than 1 nanometer difference across the one or more dielectric layers.
8. A semiconductor device having a uniform height across different fin densities, comprising:
a semiconductor substrate having fins etched therein and including dense fin regions having respective groups of the fins and dielectric material and isolation regions including the dielectric material without fins, at least two of the isolation regions having different lengths including a first isolation region having a first length defined between a first dense fin region and a second dense fin region, and a second isolation region having a second length defined between the second dense fin region and a third dense fin region;
a liner formed over the semiconductor substrate; and
one or more dielectric layers formed at a base of the fins in respective ones of the dense fin regions and the isolation regions and each having a uniform height across the dense fin regions and the isolation regions, the uniform height including a less than 2 nanometer difference across the one or more dielectric layers.
9. The device as recited in claim 8 , wherein the one or more dielectric layers include a same dielectric material formed by a different process.
10. The device as recited in claim 9 , wherein one of the one or more dielectric layers includes a different dielectric material than at least another one of the one or more dielectric layers.
11. The device as recited in claim 9 , wherein a fin reveal depth includes a linear relationship with space between the fins.
12. The device as recited in claim 9 , wherein a normalized fin reveal depth includes negligible variation over spacings from about 0 nm to about 1000 nm.
13. The device as recited in claim 9 , wherein the uniform height includes a less than 1 nanometer difference across the one or more dielectric layers.
14. A semiconductor device having a uniform height across different fin densities, comprising:
a semiconductor substrate having fins etched therein and including dense fin regions having respective groups of the fins and dielectric material and isolation regions including the dielectric material without fins; and
one or more dielectric layers formed at a base of the fins in respective ones of the dense fin regions and the isolation regions and each having a uniform height across the dense fin regions and the isolation regions, the uniform height including a less than 2 nanometer difference across the one or more dielectric layers, and one of the one or more dielectric layers includes a different dielectric material than at least another one of the one or more dielectric layers.
15. The device as recited in claim 14 , further comprising a liner formed below the one or more dielectric materials.
16. The device as recited in claim 14 , wherein a fin reveal depth includes a linear relationship with space between the fins.
17. The device as recited in claim 14 , wherein a normalized fin reveal depth includes negligible variation over spacings from about 0 nm to about 1000 nm.
18. The device as recited in claim 14 , wherein the uniform height includes a less than 1 nanometer difference across the one or more dielectric layers.