System and method for characterizing particulates in a fluid sample
A system for characterizing at least one particle from a fluid sample is disclosed. The system includes a filter disposed upstream of an outlet, and a luminaire configured to illuminate the at least one particle at an oblique angle. An imaging device is configured to capture and process images of the illuminated at least one particle as it rests on the filter for characterizing the at least one particle. A system for characterizing at least one particle using bright field illumination is also disclosed. A method for characterizing particulates in a fluid sample using at least one of oblique angle and bright field illumination is also disclosed.
1. A microscopy system for characterizing at least one particle from a fluid sample comprising:
a membrane filter disposed upstream of an outlet;
a luminaire configured to illuminate the at least one particle using bright field illumination;
a vacuum manifold connected to a negative pressure source and configured for fluid communication with the membrane filter, the vacuum manifold comprising a contact element wicking material configured to contact a bottom surface of the membrane filter to draw liquid below and through pores of the membrane filter and dry the membrane filter by wicking the liquid away from the membrane filter after an application of vacuum pressure has ended; and
an imaging device configured to capture and process images of the illuminated at least one particle as it rests on the dry membrane filter for characterizing the at least one particle.
2. The microscopy system of claim 1 further comprising:
a luminaire configured to illuminate the at least one particle at an angle coplanar with a flat plane of the filter.
3. The microscopy system of claim 1 , wherein the luminaire comprises a plurality of illuminating devices.
4. The microscopy system of claim 3 , wherein the plurality of illuminating devices are disposed radially around and directed inwardly towards the filter.
5. The microscopy system of claim 1 further comprising:
a luminaire configured to illuminate the at least one particle at an oblique angle.
6. The microscopy system of claim 1 , wherein the imaging system is configured to generate a composite image comprising oblique angle illumination and bright field illumination.
7. The microscopy system of claim 6 , wherein the imaging system is configured to characterize a plurality of particles based on a combination of oblique angle illumination and bright field illumination.
8. The microscopy system of claim 1 further comprising a well plate having a plurality of wells that each terminate on a filter.
9. The microscopy system of claim 8 , wherein the filter is a membrane.
10. The microscopy system of claim 8 , wherein the membrane surface has a low surface roughness.
11. The microscopy system of claim 8 , wherein the well plate comprises a transparent material.
12. The microscopy system of claim 1 , wherein the imaging device is configured to characterize and identify a material type of the at least one particle using a machine learning algorithm.
13. The microscopy system of claim 12 , wherein the machine learning algorithm uses observed features including at least one of size, shape, texture, light scattering intensity and fluorescence of particles to build models.
14. The microscopy system of claim 1 , wherein the imaging device is configured to characterize and identify a material type of the at least one particle as it rests on the filter using fluorescent imaging.
15. The microscopy system of claim 14 , the fluorescence imaging comprises intrinsic multi-channel based fluorescence.
16. The microscopy system of claim 14 , wherein the fluorescence imaging comprises labeled multi-channel based fluorescence.
17. The microscopy system of claim 1 , wherein the imaging device is configured to image the filter both before and after the at least one particle is captured on the filter.
18. The microscopy system of claim 17 , wherein the before and after images are processed together using algorithms that processes them to find differences.
19. The microscopy system of claim 1 , wherein the imaging device is configured to take a plurality of images at a plurality of heights above the filter.
20. The microscopy system of claim 17 , wherein the before and after images are mathematically registered.
21. The microscopy system of claim 14 , wherein the fluorescence imaging comprises UV fluorescence.
22. The microscopy system of claim 1 , wherein the filter is a membrane comprising a material to increase a signal to noise ratio of the imaged at least one particle.
23. The microscopy system of claim 22 , wherein the material is a thin metallic layer coating.
24. The microscopy system of claim 23 , wherein the thin metallic layer coating comprises one of gold, chromium or aluminum.
25. The microscopy system of claim 14 , wherein the imaging device is configured to distinguish proteinaceous and non-proteinaceous particles via fluorescence.
26. A microscopy system for characterizing at least one particle from a fluid sample comprising:
a membrane filter disposed upstream of an outlet;
a luminaire configured to illuminate the at least one particle using bright field illumination;
a vacuum manifold connected to a negative pressure source and configured for fluid communication with the membrane filter, the vacuum manifold comprising a contact element wicking material configured to contact a bottom surface of the membrane filter to draw liquid below and through pores of the membrane filter and dry the membrane filter by wicking the liquid away from the membrane filter after an application of vacuum pressure has ended; and
an imaging device configured to capture a before image of the filter before any particles are introduced, and an after image of the illuminated at least one particle as it rests on the dry membrane filter, wherein the before and after images are processed together using algorithms that processes them to find differences for characterizing at least one particle.