Semiconductor device with power on reset circuitry
A semiconductor device which makes it possible to reduce a wasteful standby time at power-on is provided. In this semiconductor device, a reset of an internal circuit is canceled as described below. When a data signal stored in a storage section is at “0,” the reset is canceled by bringing an internal reset signal to the “H” level when a relatively short time has passed after the rising edge of a power on reset signal. When the data signal is at “1,” the reset is canceled by bringing the internal reset signal to the “H” level when a relatively long time has passed after the rising edge of the power on reset signal. Therefore, a wasteful standby time at power-on can be reduced by writing the data signal logically equivalent to the rise time of supply voltage to the storage section.
1. A semiconductor device comprising:
a power-on-reset circuit that sets an internal reset signal to reset an internal circuit when a power supply voltage is lower than a threshold voltage, and
a storage unit that stores a value indicating a rise time of the power supply voltage, wherein
when the semiconductor device receives an external reset signal which indicates an inactive value and the power supply voltage is equal to or higher than the threshold voltage, the internal reset signal is cancelled after a period since the power supply voltage reaches the threshold voltage passes, the period being determined in accordance with the value.
2. The semiconductor device according to claim 1 , wherein when the external reset signal indicates an active value after the cancellation of the internal reset signal, the internal reset signal is set and cancelled without a delay in accordance with the value.
3. The semiconductor device according to claim 1 , wherein when the external reset signal indicates an active value after the power supply voltage is equal to or higher than the threshold voltage, the internal reset signal is cancelled after the period since the external reset signal turns to an inactive value from the active value passes.
4. The semiconductor device according to claim 1 , wherein the storage unit is a flash memory.
5. The semiconductor device according to claim 1 , the value is readable when the power supply voltage is equal to or higher than the threshold voltage.
6. The semiconductor device according to claim 1 , further comprising a delay circuit to cancel the internal reset signal after the period.