Stimulating an optical sensor using optical radiation pressure
A method of stimulating a MicroElectroMechanical Systems (MEMS) structure (e.g. a cantilever), and an optical sensor for use in such a method, using optical radiation pressure instead of electrostatic pressure, or the like. An optical pulse creates optical radiation pressure which stimulates movement of the MEMS structure and then movement of the MEMS structure may be measures. An interrogating light may be input after the optical pulse to measure movement of the MEMS structure. Advantageously, the same light source can be utilized to stimulate movement of the MEMS structure and to measure movement of the MEMS structure.
1. A method of stimulating a MicroElectroMechanical Systems (MEMS) structure, the method including the steps of:
inputting an optical pulse into an input grating coupler;
coupling the optical pulse via a waveguide into an interrogating grating coupler the interrogating grating coupler being arranged to form a resonant cavity with the MEMS structure;
creating optical radiation pressure within the cavity from the optical pulse;
stimulating a movement of the MEMS structure with the optical radiation pressure; and
outputting the optical pulse from an output grating coupler.
2. The method of claim 1 , wherein the step of stimulating a movement of the MEMS structure with the optical radiation pressure includes stimulating a movement of the MEMS structure primarily with the optical radiation pressure.
3. The method of claim 1 , wherein the method further includes the step of inputting an interrogating light into the interrogating grating coupler after the optical pulse for measuring a deflection of the MEMS structure.
4. The method of claim 3 , further including the step of resonating the interrogating light in the optical cavity between the MEMS structure and the interrogating grating coupler.
5. The method of claim 4 , further including the step of outputting and analysing the interrogating light.
6. The method of claim 3 , further including the step of adjusting an amplitude of a light source to produce both the interrogating light and the optical pulse.
7. The method of claim 1 , further including the step of measuring static or dynamic nanometer and subnanometer movements in air, vacuum, or liquids.
8. The method of claim 1 , wherein the MEMS structure has an analyte selective coating applied to all or part of its surface and the method further includes changing the mass of the MEMS structure by adsorbing analytes.
9. The method of claim 1 , wherein the MEMS structure is a cantilever.
10. The method of claim 1 , wherein the MEMS structure is a beam.
11. The method of claim 1 , wherein the MEMS structure is a membrane.
12. The method of claim 1 , further including the step of resonating the optical pulse within the resonant cavity and increasing a finesse of the optical cavity such that the optical radiation pressure increases and a greater force acts on the MEMS structure to move the MEMS structure.
13. The method of claim 1 wherein the MEMS structure and interrogating grating coupler form part of an optical sensor.
14. An optical sensor including:
a MEMS structure;
an input grating coupler for inputting the optical pulse into the optical sensor;
an output grating coupler for outputting the optical pulse form the optical sensor; and
an interrogating grating coupler positioned under the MEMS structure and a substrate; wherein
the input grating coupler, the interrogating grating coupler and the output grating coupler are optically coupled using waveguides, and
the MEMS structure and the interrogating grating coupler form a resonant cavity; and
the MEMS structure and interrogating grating coupler are configured such that an optical pulse input to the interrogating grating coupler creates an optical radiation pressure that stimulates a movement of the MEMS structure.
15. The optical sensor of claim 14 , wherein the MEMS structure is a cantilever.
16. The optical sensor of claim 14 , wherein the MEMS structure is a beam.
17. The optical sensor of claim 14 , wherein the MEMS structure is a membrane.
18. The optical sensor of claim 14 , wherein the MEMS structure includes an analyte selective coating.
19. The optical sensor of claim 14 , wherein the interrogating grating coupler is one dimensional.
20. The optical sensor of claim 14 , wherein the interrogating grating coupler is two dimensional.
21. The optical sensor of claim 20 , wherein the interrogating grating coupler includes an array of holes.
22. The optical sensor of claim 14 , further including an analyser that analyses light output from the interrogating grating coupler.