IP Library Granted Patent US 10,725,376
Granted Patent B2
US 10,725,376 · App. 15/460,477 · Granted Jul 28, 2020

Pattern-forming method

Inventors: Hisashi Nakagawa (Tokyo, JP); Takehiko Naruoka (Tokyo, JP); Motohiro Shiratani (Tokyo, JP)
Assignee: JSR CORPORATION
G03F7/0044G03F7/0042G03F7/0045G03F7/038G03F7/162G03F7/168G03F7/2004G03F7/2037G03F7/322G03F7/325
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Quick Facts
Patent No.
US 10,725,376
App. No.
15/460,477
Granted
Jul 28, 2020
Kind
B2
Abstract

A pattern-forming method includes applying a radiation-sensitive composition comprising a complex on a substrate to provide a film on the substrate. The film is exposed. The film exposed is developed. The complex includes: a metal-containing component that is a transition metal compound having a hydrolyzable group, a hydrolysis product of the transition metal compound having a hydrolyzable group, a hydrolytic condensation product of the transition metal compound having a hydrolyzable group, or a combination thereof; and an organic compound represented by formula (1). In the formula (1), R 1 represents an organic group having a valency of n, n being an integer of 1 to 4. In a case where n is 1, X represents —COOH. In a case where n is 2 to 4, X represents —OH, —COOH, —NCO, —NHR a , —COOR A or —CO—C(R L ) 2 —CO—R A . R 1 X) n   (1)

Claims (37)

1. A pattern-forming method comprising:

applying a radiation-sensitive composition comprising a complex on a substrate to provide a film on the substrate;

exposing the film via a mask which has a predetermined pattern; and

developing the film exposed to form a pattern in the film,

wherein the complex is a reaction product from a mixture of:

a metal-containing component that is a transition metal compound having a hydrolyzable group, a hydrolysis product of the transition metal compound having a hydrolyzable group, a hydrolytic condensation product of the transition metal compound having a hydrolyzable group, or a combination thereof, wherein the transition metal compound is represented by formula (2-1); and

an organic compound represented by formula (1):

R 1 X) n   (1)

MY b   (2-1)

wherein in the formula (1), R 1 represents an alkyl group, an alkanediyl group, an alkanetriyl group, or an alkanetetrayl group,

wherein the alkyl group, the alkanediyl group, the alkanetriyl group, or the alkanetetrayl group represented by R 1 is optionally substituted with a halogen atom, an alkoxy group, an alkoxycarbonyl group, an acyl group, a cyano group or a nitro group,

wherein:

in a case where n is 1, X represents —COOH;

in a case where n is 2 to 4, X represents —COOH, —NCO, —COOR A or —CO—C(R L ) 2 —CO—R A ,

R A each independently representing a monovalent organic group, and

R L each independently representing a hydrogen atom or a monovalent organic group; and

in a case where n is no less than 2, a plurality of Xs are identical or different, and

wherein in the formula (2-1): M represents a transition metal atom; Y represents the hydrolyzable group selected from the group consisting of a halogen atom, an alkoxy group and a carboxylate group; and b is an integer of 2 to 6, wherein a plurality of Ys are identical or different.

2. The pattern-forming method according to claim 1 , wherein the metal-containing component is a metal alkoxide that is neither hydrolyzed nor hydrolytically condensed.

3. The pattern-forming method according to claim 1 , wherein in the formula (1), X represents —COOH, and n is 1.

4. The pattern-forming method according to claim 1 , wherein the radiation-sensitive composition further comprises a radiation-sensitive acid generating agent.

5. The pattern-forming method according to claim 1 , wherein the developing is carried out by using an alkaline solution to form a negative tone pattern.

6. The pattern-forming method according to claim 1 , wherein the developing is carried out by using an organic solvent to form a negative tone pattern.

7. The pattern-forming method according to claim 1 , wherein the exposing is carried out by irradiation with an extreme ultraviolet ray or an electron beam.

8. The pattern-forming method according to claim 1 , wherein the transition metal compound comprises at least one transition metal selected from the groups 4 to 6 and 8 in the periodic table.

9. The pattern-forming method according to claim 1 , wherein the transition metal compound comprises at least one transition metal selected from titanium, zirconium, hafnium, tantalum, tungsten and iron.

10. The pattern-forming method according to claim 1 , wherein the transition metal compound comprises at least one transition metal selected from titanium, zirconium, hafnium and iron.

11. The pattern-forming method according to claim 1 , wherein an amount of the organic compound with respect to 1 mol of a transition metal in the metal-containing compound is from 0.01 to 30 mol %.

12. The pattern-forming method according to claim 1 , wherein an amount of the organic compound with respect to 1 mol of a transition metal in the metal-containing compound is from 0.1 to 20 mol %.

13. The pattern-forming method according to claim 1 , wherein an amount of the organic compound with respect to 1 mol of a transition metal in the metal-containing compound is from 0.1 to 15 mol %.

14. The pattern-forming method according to claim 1 , wherein the radiation-sensitive composition further comprises a solvent.

15. The pattern-forming method according to claim 1 , wherein the radiation-sensitive composition further comprises a surfactant.

16. The pattern-forming method according to claim 1 , wherein a solid content of the radiation-sensitive composition is from 0.1 to 50 mass %.

17. The pattern-forming method according to claim 1 , wherein a solid content of the radiation-sensitive composition is from 0.5 to 30 mass %.

18. The pattern-forming method according to claim 1 , wherein a solid content of the radiation-sensitive composition is from 1 to 20 mass %.

19. The pattern-forming method according to claim 1 , wherein a solid content of the radiation-sensitive composition is from 1.5 to 10 mass %.

20. The pattern-forming method according to claim 1 , wherein in the formula (1), in a case where n is 2, at least one X represents NCO, —COOR A or —CO—C(R L ) 2 —CO—R A .

Assignments (3)
MERGER Recorded Mar 23, 2026
From: JSR CORPORATION
To: JICC-02, CO., LTD
Reel/Frame 075191/0149 →
CHANGE OF NAME Recorded Mar 23, 2026
From: JICC-02 CO., LTD
To: JSR CORPORATION
Reel/Frame 075192/0023 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 16, 2017
From: NAKAGAWA, HISASHI; NARUOKA, TAKEHIKO; SHIRATANI, MOTOHIRO
To: JSR CORPORATION
Reel/Frame 041599/0547 →
Priority Claims (1)
JP 2014-189178 · Sep 17, 2014 · national
Continuity (2)
Continuation PCTJP2015076203 · Sep 15, 2015
Related Publication 20170184961A1 · Jun 29, 2017