IP Library Granted Patent US 10,418,802
Granted Patent B2
US 10,418,802 · App. 15/478,335 · Granted Sep 17, 2019

Methods and apparatus for voltage and current calibration

Inventors: Atsushi Kamei (Maebashi, JP); Yasuaki Hayashi (Oura-Gun, JP); Katsumi Yamamoto (Kokubunji, JP)
Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
H02H7/18H01M10/425H01M10/48
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,418,802
App. No.
15/478,335
Granted
Sep 17, 2019
Kind
B2
Abstract

A calibration circuit according to various aspects of the present invention comprises a battery pack, a protection IC, and a power source. The power source may have a predetermined voltage and may be selectively coupled to the protection IC. The power source may be capable of providing a current to the protection IC through one of a first current loop and a second current loop, wherein the current through the first current loop generates a first voltage across a first and second terminal of the protection IC, and the current through the second current loop generates a second voltage across the first and second terminals that is substantially equal to the voltage of the power source.

Claims (44)

1. A calibration circuit for calibrating a battery pack having a negative pack terminal and a negative battery terminal and a protection IC comprising a first terminal and a second terminal, comprising:

a power source configured to provide a predetermined voltage and selectively coupled to the protection IC and capable of providing a current to the protection IC through one of a first current loop and a second current loop;

wherein:

the current through the first current loop generates a first voltage across the first and second terminals; and

the current through the second current loop generates a second voltage across the first and second terminals that is substantially equal to the voltage of the power source.

2. The calibration circuit according to claim 1 , further comprising a first switching device to selectively couple the power source to the protection IC.

3. The calibration circuit according to claim 2 , wherein the first switching device is configured to select between the first current loop and the second current loop.

4. The calibration circuit according to claim 1 , wherein the second current loop comprises a sense resistor coupled between the power source and the second terminal of the protection IC.

5. The calibration circuit according to claim 4 , wherein the first current loop bypasses the sensor resistor.

6. The calibration circuit according to claim 1 , further comprising a current source coupled between the negative pack terminal and the negative battery terminal to form a third current loop through the battery pack.

7. The calibration circuit according to claim 6 , further comprising a switchable bypass controlled by a second switching device current loop coupled to the current source, wherein current flows through the bypass current loop and bypasses the battery pack.

8. A method for calibration of a protection IC coupled to a power supply, a current source, and a transistor, comprising:

initializing the protection IC, comprising:

selectively coupling the power source to the protection IC through one of a first current loop and a second current loop; and

trimming data bits, comprising:

selectively coupling the current source to the protection IC through a third current loop;

determining the transistor operating state;

setting a current data bit to one of a high value and a low value based on the operating state;

determining a binary position of the current data bit;

selectively coupling the current source to a bypass loop, wherein the bypass loop bypasses the protection IC; and

setting a subsequent bit to the high value.

9. The method for calibration according to claim 8 , wherein initializing the protection IC further comprises:

coupling the power source to the protection IC through the first current loop; and

coupling the current source to the bypass loop.

10. The method for calibration according to claim 8 , wherein initializing the protection IC further comprises:

coupling the power source to the protection IC through the second current loop; and

coupling the current source to the bypass loop.

11. The method for calibration according to claim 8 , wherein initializing the protection IC further comprises applying a test signal to the protection IC from a pulse generator coupled to the protection IC when the current source is coupled to the bypass loop.

12. The method for calibration according to claim 8 , wherein the second current loop comprises a sense resistor coupled between the power source and the second terminal of the protection IC.

13. The method for calibration according to claim 10 , wherein trimming data bits comprises an iterative process for each of the plurality of bits.

14. A calibration system, comprising:

a battery pack comprising a protection IC comprising a first terminal and a second terminal;

a power source, having a predetermined voltage, selectively coupled to the protection IC and capable of providing a current to the protection IC through one of a first current loop and a second current loop;

a current source coupled between the negative pack terminal and the negative battery terminal to form a third current loop through the battery pack;

a pulse generator coupled to the protection IC and capable of providing a test signal to the protection IC;

wherein:

current through the first current loop generates a first voltage across the first and second terminals; and

current through the second current loop generates a second voltage across the first and second terminals that is substantially equal to the voltage of the power source.

15. The calibration system of claim 14 , further comprising a first switching device to selectively couple the power source to the protection IC.

16. The calibration system of claim 14 , wherein the second current loop comprises a sense resistor coupled between the power source and the second terminal of the protection IC.

17. The calibration system of claim 16 , wherein the first current loop bypasses the sense resistor and directly couples the second terminal of the protection IC to the power source.

18. The calibration system of claim 14 , further comprising a switchable bypass controlled by a second switching device current loop coupled to the current source, wherein current flows through the bypass current loop and bypasses the battery pack.

19. The calibration system of claim 14 , further comprise a third terminal configured to calibrate the current of the protection IC.

20. The calibration system of claim 14 , wherein the power source, the current source, and the pulse generator are disposed exterior of the battery pack.

Assignments (3)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 044481, FRAME 0594 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: FAIRCHILD SEMICONDUCTOR CORPORATION; SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 064074/0363 →
PATENT SECURITY AGREEMENT Recorded Nov 17, 2017
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 044481/0594 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 4, 2017
From: KAMEI, ATSUSHI; HAYASHI, YASUAKI; YAMAMOTO, KATSUMI
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 041840/0588 →
Continuity (1)
Related Publication 20180287373A1 · Oct 4, 2018