Device and method for locating a radiation emitting source via angular dependence using a single detection crystal

1. A device for sensing, locating, and characterizing a radiation emitting source, comprising:

a detection crystal having dimensions great enough such that regional differences in radiation response are generated in the detection crystal by radiation impinging on one or more opposed surfaces of the detection crystal, wherein the detection crystal is a single detection crystal; and

a plurality of detectors one or more of coupled adjacent to and disposed on a plurality of opposed surfaces of the detection crystal operable for detecting the regional differences in radiation response generated in the detection crystal by the radiation impinging on the one or more opposed surfaces of the detection crystal.

2. The device of claim 1 , wherein the detection crystal comprises one or more of a neutron detection crystal and a gamma detection crystal.

3. The device of claim 1 , wherein the detection crystal comprises one or more of a scintillating detection crystal, a semiconducting detection crystal, and a charge collecting detection crystal.

4. The device of claim 1 , wherein the detection crystal comprises one of LiInSe2, BP, BN, LiF, a Si-coated material, NaI, CsI2, BGO, and SrI2.

5. The device of claim 1 , wherein the detection crystal comprises one of a plate-shaped crystal, a prismatic crystal, a cubic crystal, a rectangular crystal, a tetrahedral crystal, a tetragonal crystal, and a spherical crystal.

6. The device of claim 1 , wherein the detection crystal comprises at least one dimension with a thickness equal to or greater than the radiation absorption depth of its constituent material.

7. The device of claim 1 , wherein the plurality of detectors comprise a plurality of photodetectors.

8. The device of claim 1 , wherein the plurality of detectors comprise a plurality of PMTs, SiPMs, or APDs.

9. The device of claim 1 , further comprising a substrate coupled to the detection crystal and the plurality of detectors.

10. The device of claim 1 , further comprising a radiation transparent housing disposed about the detection crystal and the plurality of detectors.

11. The device of claim 1 , further comprising a common processor coupled to the plurality of detectors.

12. A method for sensing, locating, and characterizing a radiation emitting source, comprising:

providing a detection crystal having dimensions great enough such that regional differences in radiation response are generated in the detection crystal by radiation impinging on one or more opposed surfaces of the detection crystal, wherein the detection crystal is a single detection crystal;

providing a plurality of detectors one or more of coupled adjacent to and disposed on a plurality of opposed surfaces of the detection crystal operable for detecting the regional differences in radiation response generated in the detection crystal by the radiation impinging on the one or more opposed surfaces of the detection crystal;

exposing the detection crystal and the plurality of detectors to radiation from the radiation emitting source; and

obtaining a relative response signal from each of the plurality of detectors.

13. The method of claim 12 , wherein the detection crystal comprises one or more of a neutron detection crystal and a gamma detection crystal.

14. The method of claim 12 , wherein the detection crystal comprises one or more of a scintillating detection crystal, a semiconducting detection crystal, and a charge collecting detection crystal.

15. The method of claim 12 , wherein the detection crystal comprises one of LiInSe2, BP, BN, LiF, a Si-coated material, NaI, CsI2, BGO, and SrI2.

16. The method of claim 12 , wherein the detection crystal comprises one of a plate-shaped crystal, a prismatic crystal, a cubic crystal, a rectangular crystal, a tetrahedral crystal, a tetragonal crystal, and a spherical crystal.

17. The method of claim 12 , wherein the detection crystal comprises at least one dimension with a thickness equal to or greater than the radiation absorption depth of its constituent material.

18. The method of claim 12 , wherein the plurality of detectors comprise a plurality of photodetectors.

19. The method of claim 12 , wherein the plurality of detectors comprise a plurality of PMTs, SiPMs, or APDs.

20. The method of claim 12 , further comprising, after obtaining the relative response signal from each of the plurality of detectors, realigning the detection crystal relative to the radiation emitting source and again obtaining a relative response signal from each of the plurality of detectors.