Soiling measurement device for photovoltaic arrays
View Patent ↗A soiling measurement device for PV arrays, comprising a clean PV device and a soiled PV device, wherein the soiled PV device is exposed to accumulate soiling, and wherein the clean PV device is maintained clean by a movable cover which normally shields it from accumulation of soiling, and wherein the movable cover opens automatically at periodic intervals for measurement, after which it closes again, and wherein soiling is determined by comparison of measurements from the soiled PV device and the clean PV device. In one embodiment, incident irradiance is measured from the clean device, with or without the presence of the soiled PV device.
1. A soiling measurement device comprising a clean PV device and a soiled PV device, wherein the soiled PV device is exposed to accumulate soiling, and wherein the clean PV device is maintained clean by a movable cover which normally shields it from accumulation of soiling, and wherein the movable cover opens automatically at periodic intervals for measurements, after which it closes again, and wherein a measurement and control system measures electrical outputs of said clean PV device and said soiled PV device, wherein said electrical outputs comprise at least a short-circuit current of said clean PV device and a short-circuit current of said soiled PV device, and wherein said measurement and control system determines a soiling impact analysis by calculating at least a soiling ratio equal to said short-circuit current of said soiled PV device divided by said short-circuit current of said clean PV device multiplied by a normalization constant chosen so that when both said soiled PV device and said clean PV device are clean, said soiling ratio is unity.
2. The device of claim 1 , wherein said clean PV device and said soiled PV device each comprise a PV cell.
3. The device of claim 1 , further comprising at least one temperature sensor to measure a temperature of said clean PV device and/or said soiled PV device, and wherein measurements of said temperature are used to temperature-correct electrical measurements of said clean PV device and/or said soiled PV device.
4. The device of claim 1 , wherein said measurement and control system causes said measurements to be performed or analyzed only during a limited time interval during the day when a solar angle of incidence on the device is less than a pre-determined value.
5. The device of claim 1 , wherein said measurement and control system causes said measurements to be performed or analyzed only during a time period from three hours before to three hours after local solar noon.
6. The device of claim 1 , wherein said measurement and control system causes said measurements to be performed or analyzed only when said electrical output of said soiled PV device is within a pre-determined range.
7. The device of claim 1 , wherein said measurement and control system causes said measurements to be performed or analyzed only when a rate of change of said electrical output of said soiled PV device is within a pre-determined range.
8. The device of claim 1 , wherein said measurement and control system averages said measurements over the course of a day to provide a single result characteristic of the day, wherein said averaging is performed either directly or as an irradiance-weighted average.
9. The device of claim 1 , wherein said movable cover automatically retracts to a closed position whenever power is removed.
10. The device of claim 1 , wherein said movable cover may be opened manually without operation of an actuator.
11. The device of claim 1 , wherein said soiled PV device is a PV module.
12. The device of claim 1 , wherein said soiled PV device is housed in a separate enclosure from said clean PV device.
13. The device of claim 1 , wherein said measurement and control system and said clean PV device are housed in a single enclosure.