Sapphire collector for reducing mechanical damage during die level laser lift-off
In a Sapphire Collector (SC), one or more features, both structural and parametric, are included for capturing the die-size sapphire chips that are removed from a semiconductor structure during die-level laser lift-off (LLO). These features are designed to increase the likelihood that each sapphire chip is securely captured by the Sapphire Collector immediately after it is released from the semiconductor structure. The Sapphire Collector includes a vacuum-enhance collector with a pickup element that lifts each released chip into the collector, and air pushers that direct the chips further into the collection tunnel leading to a discard bin.
1. A collection system, comprising:
a container comprising:
a top surface defining a first opening,
a bottom surface defining a second opening,
a first side surface defining a third opening in a top half of the container and a fourth opening in a bottom half of the container,
a second side surface defining a fifth opening,
a cavity extending between the first opening and the second opening;
a first tunnel extending between the third opening and the cavity,
a second tunnel extending between the fourth opening and the cavity, and
a third tunnel extending between the fifth opening and the cavity;
a first nozzle at least partially in the first tunnel and angled toward the bottom surface of the container, the first nozzle having a slit formed therethrough, the slit having a thickness between 25 μm and 75 μm; and
a second nozzle at least partially in the second tunnel and angled toward the top surface of the container, the second nozzle having a slit formed therethrough, the slit having a thickness between 25 μm and 75 μm.
2. The collection system of claim 1 , wherein the third tunnel comprises:
a first portion adjacent the fifth opening that has a uniform diameter, and
a second flared portion between the first portion and the cavity that has a diameter that tapers outward from the first portion toward the cavity and joins with the first opening in the top surface of the container and the second opening in the bottom surface of the container.
3. The collection system of claim 1 , further comprising a chamfered pickup element, coupled to the cavity, that extends from the bottom surface of the container and includes sloped walls forming an opening through which chips enter the cavity, the sloped walls angling outward from the opening.
4. The collection system of claim 1 , wherein the cavity is configured to receive chips that are released from a submount via laser liftoff.
5. The collection system of claim 1 , wherein the first nozzle is angled toward the bottom surface of the container at an angle of ≤90° and the second nozzle is angled toward the top surface of the container at an angle of ≤90°.
6. The collection system of claim 1 , wherein the first nozzle and the second nozzle each have a slit formed therethrough, and the slit has a thickness between 25 μm and 75 μm.
7. The collection system of claim 1 , wherein the first tunnel is configured to receive an air flow during operation of the system, and the second tunnel is configured to be held in a vacuum during operation of the system.
8. The collection system of claim 7 , wherein the air flow has a pressure >−0.6 Mpa during operation, and the vacuum is >−6 kPa during operation of the system.
9. A collection system comprising:
a container comprising:
a top surface defining a first opening,
a bottom surface defining a second opening,
a first side surface defining a third opening in a top half of the container and a fourth opening in a bottom half of the container,
a second side surface defining a fifth opening,
a cavity extending between the first opening and the second opening;
a first tunnel extending between the third opening and the cavity,
a second tunnel extending between the fourth opening and the cavity, and
a third tunnel extending between the fifth opening and the cavity;
a first nozzle at least partially in the first tunnel and angled toward the bottom surface of the container;
a second nozzle at least partially in the second tunnel and angled toward the top surface of the container; and
at least one of a lens and a grate over or in the first opening in the top surface of the container.
10. A collection system, comprising:
a container comprising:
a top surface defining a first opening,
a bottom surface defining a second opening,
a first side surface defining a third opening,
a second side surface defining a fourth opening,
a cavity extending through the container between the first opening and the second opening
a first tunnel extending between the third opening and the cavity, and
a second tunnel extending between the fourth opening and the cavity, the second tunnel comprising:
a first portion adjacent the fourth opening that has a uniform diameter, and
a second flared portion between the first portion and the cavity that has a diameter that tapers outward continuously between the first section and the first opening in the top surface of the container and the second opening in the bottom surface of the container.
11. The collection system of claim 10 , further comprising a chamfered pickup element, coupled to the cavity, that extends from an underside of the collector system and includes sloped walls forming an opening through which chips enter the cavity, the sloped walls angling outward from the opening.
12. The collection system of claim 10 , wherein the diameter of the second flared portion tapers at an angle of ≤45°.
13. The collection system of claim 10 , wherein the cavity is configured to receive chips that are released from a submount via laser liftoff.
14. The collection system of claim 10 , wherein the uniform diameter of the first portion is greater than or equal to a width of the second opening.
15. The collection system of claim 10 , wherein the second tunnel is configured to be held in a vacuum during operation of the system.
16. The collection system of claim 10 , further comprising an air pusher, extended into the cavity, that provides an air flow into the cavity, the air pusher being located at least partially in the first tunnel in an upper half of the cavity opposite the second tunnel.
17. The collection system of claim 16 , wherein the air pusher is angled toward the bottom surface of the container.
18. The collection system of claim 16 , wherein the first side surface further defines a fifth opening in a lower half of the container, and the collection system further comprises:
a third tunnel in the container extending between the fifth opening and cavity; and
another air pusher, extended into the cavity, that provides another air flow into the cavity, said another air pusher being located at least partially in the third tunnel.
19. The collection system of claim 18 , wherein the another air pusher is angled toward the top surface of the container.
20. The collection system of claim 18 , wherein the uniform diameter of the first portion is greater than or equal to a distance between the air pusher and the another air pusher along an axis of the cavity.