Inspection apparatus and inspection method

1. An inspection apparatus for inspecting an appearance of an object having a satin-finished area on its surface, comprising:

a stage on which an object is placed;

a plurality of light source parts disposed diagonally with respect to said stage and arranged circumferentially about a central axis of said stage at a predetermined angular interval so that said plurality of light source parts irradiate said object from respective directions;

an image pickup part for acquiring 1) a first picked-up image of a predetermined object area while irradiating said object area with light from only one direction using a first lighting part being one of said plurality of light source parts and 2) a second picked-up image of said object area while irradiating said object area with light from two or more directions using a second lighting part being two or more of said plurality of light source parts;

a defect candidate detection part for 1) detecting an area of a defect candidate in said object area as a first defect candidate area by comparing the first picked-up image acquired while irradiating said object area with the light from only one direction using said first lighting part, with a first reference image corresponding to said first picked-up image, and 2) detecting an area of a defect candidate in said object area as a second defect candidate area by comparing the second picked-up image acquired while irradiating said object area with the light from the two or more directions using said second lighting part, with a second reference image corresponding to said second picked-up image; and

a defect specifying part for specifying an overlapping area as a defect area in said object area, said overlapping area being an area where said first defect candidate area and said second defect candidate area overlap each other, an area where said first defect candidate area and said second defect candidate area do not overlap each other being specified as a non-defect area.

2. The inspection apparatus according to claim 1 , further comprising:

a control part sequentially using each of the two or more of said plurality of light source parts of the second lighting part as said first lighting part, to cause said image pickup part to acquire a plurality of first picked-up images,

wherein said defect candidate detection part compares said plurality of first picked-up images with a plurality of first reference images corresponding to said plurality of first picked-up images, respectively, to generate a plurality of first defect candidate images each representing a first defect candidate area, and

said defect specifying part specifies an overlapping area in said first defect candidate area represented by each first defect candidate image and said second defect candidate area, as a defect area in said object area.

3. The inspection apparatus according to claim 2 , wherein

the number of said plurality of light source parts is not less than 3.

4. The inspection apparatus according to claim 1 , wherein

the number of said plurality of light source parts is not less than 3.

5. The inspection apparatus according to claim 1 , wherein

said plurality of light source parts are arranged circumferentially at an angular interval of 45 degrees.

6. The inspection apparatus according to claim 1 , wherein

said image pickup part includes a plurality of oblique image pickup parts disposed around said stage and arranged circumferentially about said central axis of said stage at a predetermined angular interval, and

said second picked-up image of an object area is acquired in each of said plurality of oblique image pickup parts while irradiating said object area with light from a plurality of different directions by light source parts included in said plurality of light source parts.

7. The inspection apparatus according to claim 1 , wherein

intensity of light emitted from each of the two or more of said plurality of light source parts of said second lighting part in acquiring said second picked-up image is lower than intensity of light emitted from said first lighting part in acquiring said first picked-up image.

8. An inspection method of inspecting an appearance of an object having a satin-finished area on its surface, the inspection method comprising:

a) acquiring, using an image pickup part, a first picked-up image of a predetermined object area on a surface of an object placed on a stage while irradiating said object area with light from only one direction using a first lighting part, the first lighting part being one of a plurality of light source parts, said plurality of light source parts disposed diagonally with respect to said stage and arranged circumferentially about a central axis of said stage at a predetermined angular interval so that said plurality of light source parts irradiate said object from respective directions;

b) acquiring, using the said image pickup part, a second picked-up image of the predetermined object area on the surface of the object placed on the stage while irradiating said object area with light from two or more directions using a second lighting part, the second lighting part being two or more of the plurality of light source parts;

c) detecting an area of a defect candidate in said object area as a first defect candidate area by comparing said first picked-up image with a first reference image corresponding to said first picked-up image;

d) detecting an area of a defect candidate in said object area as a second defect candidate area by comparing said second picked-up image with a second reference image corresponding to said second picked-up image; and

e) specifying an overlapping area as a defect area in said object area, said overlapping area being an area where said first defect candidate area and said second defect candidate area overlap each other, an area where said first defect candidate area and said second defect candidate area do not overlap each other being specified as a non-defect area.

9. The inspection method according to claim 8 , wherein

a plurality of first picked-up images are acquired in said image pickup part by sequentially using each of the two or more of said plurality of light source parts of said second lighting part as said first lighting part in said operation a),

a plurality of first defect candidate images each representing a first defect candidate area are generated by comparing said plurality of first picked-up images with a plurality of first reference images corresponding to said plurality of first picked-up images, respectively, in said operation c), and

an overlapping area in said first defect candidate area represented by each first defect candidate image and said second defect candidate area is specified as a defect area in said object area in said operation e).

10. The inspection method according to claim 9 , wherein

the number of said plurality of light source parts is not less than 3.

11. The inspection method according to claim 8 , wherein

the number of said plurality of light source parts is not less than 3.

12. The inspection method according to claim 8 , wherein

said plurality of light source parts are arranged circumferentially at an angular interval of 45 degrees.

13. The inspection method according to claim 8 , wherein

said image pickup part includes a plurality of oblique image pickup parts disposed around said stage and arranged circumferentially about said central axis of said stage at a predetermined angular interval, and

in said operation b), said second picked-up image of an object area is acquired in each of said plurality of oblique image pickup parts while irradiating said object area with light from a plurality of different directions by light source parts included in said plurality of light source parts.

14. The inspection method according to claim 8 , wherein

intensity of light emitted from each of the two or more of said plurality of light source parts of said second lighting part in acquiring said second picked-up image is lower than intensity of light emitted from said first lighting part in acquiring said first picked-up image.