IP Library Granted Patent US 10,408,777
Granted Patent B2
US 10,408,777 · App. 15/510,363 · Granted Sep 10, 2019

Density measurement system and method

Inventors: Changhua Qiu (Manchester, GB); Kenneth Primrose (Manchester, GB)
Assignee: Industrial Tomography Systems PLC
G01N27/04G01N9/00G01N27/026G01N33/2823G05D7/0617E02F5/006G01N2011/0066
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Quick Facts
Patent No.
US 10,408,777
App. No.
15/510,363
Granted
Sep 10, 2019
Kind
B2
Abstract

A density measurement system for measuring the density of a material within a region, the density measurement system comprises: a plurality of electrodes arranged around the region; an energization source arranged to apply an electrical signal to at least one of said electrodes; a monitor arranged to monitor an electrical parameter at at least one of said electrodes, the monitored electrical parameter being caused to change in response to flow of electrical current within the region; and a processor arranged to: generate data indicative of the complex impedance of the material within the region based upon the monitored electrical parameter; and generate data indicative of the density of the material based upon the data indicative of the complex impedance of the material.

Claims (52)

1. A slurry density measurement system for measuring the density of a slurry within a region, the slurry density measurement system comprising:

a plurality of electrodes arranged around the region;

an energisation source arranged to apply an electrical signal to at least one of said electrodes;

a monitor arranged to monitor an electrical parameter at at least one of said electrodes, the monitored electrical parameter being caused to change in response to flow of electrical current within the region;

a processor arranged to:

generate data indicative of the complex impedance of the slurry within the region based upon the monitored electrical parameter; and

generate data indicative of the slurry density of the slurry based upon the data indicative of the complex impedance of the slurry; and

a gas fraction probe, the gas fraction probe being configured to generate data indicative of the proportion of gas within the region.

2. The slurry density measurement system according to claim 1 , wherein generating the data indicative of the complex impedance of the material is further based upon reference data, said reference data comprising an expected value of the monitored electrical parameter, the expected value being based upon a reference material having a predetermined electrical characteristic affecting said electrical parameter.

3. The slurry density measurement system according to claim 2 , wherein generating data indicative of the slurry density of the slurry based upon the monitored electrical parameter comprises generating data indicative of the relative difference between the monitored electrical parameter and the expected value of the monitored electrical parameter.

4. The slurry density measurement system according to claim 2 , wherein generating data indicative of the complex impedance of the material based upon the monitored electrical parameter comprises generating data indicative of the relative impedance of the material compared to the reference material.

5. The slurry density measurement system according to claim 1 , wherein generating data indicative of the slurry density of the slurry based upon the data indicative of the complex impedance of the slurry comprises:

generating data indicative of the concentration of a first component within the slurry based upon the complex impedance of the slurry and the complex impedance of the first component.

6. The slurry density measurement system according to claim 5 , wherein generating data indicative of the slurry density of the slurry is further based upon the complex impedance of a second component.

7. The slurry density measurement system according to claim 1 , wherein generating data indicative of composition of the slurry comprises generating data indicative of the modulus of the complex impedance of the slurry.

8. The slurry density measurement system according to claim 1 , further comprising at least one sensor arranged to generate data indicative of a property of the slurry within the region, wherein generating data indicative of the slurry density of the slurry within the region is further based upon the data indicative of a property of the slurry.

9. The slurry density measurement system according to claim 8 , wherein the sensor is a temperature sensor or a conductivity sensor.

10. The slurry density measurement system according to claim 1 , wherein the data indicative of the slurry density of the slurry is generated based upon the data indicative of the proportion of gas within the region.

11. The slurry density measurement system according to claim 1 , wherein data indicative of the slurry density of the slurry comprises a plurality values, each value being associated with a respective one of a plurality of sub-regions within the region.

12. The slurry density measurement system according to claim 1 , wherein data indicative of the slurry density of the slurry comprises a spatial average of a plurality of values, each of the plurality of values being associated with a respective one of a plurality of sub-regions within the region.

13. The slurry density measurement system according to claim 1 , wherein the energisation source is arranged to apply an alternating electrical signal between at least a first pair of said electrodes.

14. The slurry density measurement system according to claim 13 , wherein the monitor is arranged to monitor a potential difference between at least a second pair of said electrodes, whilst the electrical signal is applied between the first pair of said electrodes.

15. An industrial processing apparatus, the industrial processing apparatus comprising a slurry density measurement system for measuring the density of a slurry within a region, the slurry density measurement system comprising:

a plurality of electrodes arranged around the region;

an energisation source arranged to apply an electrical signal to at least one of said electrodes;

a monitor arranged to monitor an electrical parameter at at least one of said electrodes, the monitored electrical parameter being caused to change in response to flow of electrical current within the region; and

a processor arranged to:

generate data indicative of the complex impedance of the slurry within the region based upon the monitored electrical parameter; and

generate data indicative of the slurry density of the slurry based upon the data indicative of the complex impedance of the slurry.

16. The industrial processing apparatus according to claim 15 , wherein the industrial processing apparatus is a hydraulic conveying apparatus.

17. A method for measuring the slurry density of a slurry within a region, the method comprising:

providing: a plurality of electrodes around the region; an energisation source; a monitor; and a processor;

applying an electrical signal to at least one of said electrodes by the energisation source;

monitoring an electrical parameter at at least one of said electrodes, the electrical parameter being caused to change in response to flow of electrical current within the region;

generating, by the processor, data indicative of the complex impedance of the slurry within the region based upon the monitored electrical parameter;

generating data indicative of the slurry density of the slurry based upon the data indicative of the complex impedance of the slurry; and

controlling an industrial process based upon the data indicative of the slurry density of the slurry.

18. A method for measuring the slurry density of a slurry within a region, the method comprising: a

providing: a plurality of electrodes around the region; an energisation source; a monitor; and a processor;

applying an electrical signal to at least one of said electrodes by the energisation source;

monitoring an electrical parameter at at least one of said electrodes, the electrical parameter being caused to change in response to flow of electrical current within the region;

generating, by the processor, data indicative of the complex impedance of the slurry within the region based upon the monitored electrical parameter;

generating data indicative of the slurry density of the slurry based upon the data indicative of the complex impedance of the slurry; and

controlling hydraulic conveying based upon the data indicative of the slurry density of the slurry.

19. A slurry density measurement system for measuring the density of a slurry within a region, the slurry density measurement system comprising:

a plurality of electrodes arranged around the region;

an energisation source arranged to apply an electrical signal to at least one of said electrodes;

a monitor arranged to monitor an electrical parameter at at least one of said electrodes, the monitored electrical parameter being caused to change in response to flow of electrical current within the region; and

a processor arranged to:

generate data indicative of the complex impedance of the slurry within the region based upon the monitored electrical parameter; and

generate data indicative of the slurry density of the slurry based upon the data indicative of the complex impedance of the slurry, wherein data indicative of the slurry density of the slurry comprises a spatial average of a plurality of values, each of the plurality of values being associated with a respective one of a plurality of sub-regions within the region.

20. The slurry density measurement system according to claim 19 , wherein generating the data indicative of the complex impedance of the material is further based upon reference data, said reference data comprising an expected value of the monitored electrical parameter, the expected value being based upon a reference material having a predetermined electrical characteristic affecting said electrical parameter.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2025
From: INDUSTRIAL TOMOGRAPHY SYSTEMS LIMITED
To: PROCESS FLOW INTELLIGENCE LTD
Reel/Frame 071931/0180 →
CHANGE OF NAME Recorded Jun 29, 2021
From: INDUSTRIAL TOMOGRAPHY SYSTEMS PLC
To: INDUSTRIAL TOMOGRAPHY SYSTEMS LIMITED
Reel/Frame 056712/0581 →
CORRECTIVE ASSIGNMENT TO CORRECT THE FIRST INVENTOR NAME PREVIOUSLY RECORDED AT REEL: 041538 FRAME: 0371. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT . Recorded Feb 14, 2018
From: QIU, CHANGHUA; PRIMROSE, KENNETH
To: INDUSTRIAL TOMOGRAPHY SYSTEMS PLC
Reel/Frame 045337/0450 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 10, 2017
From: QUI, CHANGHUA; PRIMROSE, KENNETH
To: INDUSTRIAL TOMOGRAPHY SYSTEMS PLC
Reel/Frame 041538/0371 →
Priority Claims (1)
GB 1416182.2 · Sep 12, 2014 · national
Continuity (1)
Related Publication 20170241929A1 · Aug 24, 2017