Methods, systems, and media for programming a storage device
Methods, systems, and machine-readable storage medium for programming a storage device are disclosed. In some embodiments, the methods include: performing a verify operation on a plurality of storage elements of the storage device to determine whether the plurality of storage elements have been programmed to a first program state; determining a first number of failing bits corresponding to the first program state based on the verify operation; comparing the first number of failing bits with a first threshold of failing bits corresponding to the first program state; and determining a second threshold of failing bits based at least in part on the first number of failing bits and the comparison, wherein the second threshold of failing bits corresponds to a second program state.
1. A method for programming a storage device, comprising:
performing a verify operation on a plurality of storage elements of the storage device to determine whether the plurality of storage elements have been programmed to a first program state;
determining a first number of failing bits corresponding to the first program state based on the verify operation;
comparing the first number of failing bits with a first threshold of failing bits corresponding to the first program state; and
determining a second threshold of failing bits based at least in part on the first number of failing bits and the comparison, wherein the second threshold of failing bits corresponds to a second program state.
2. The method of claim 1 , further comprising determining a second number of failing bits representative of a difference between the first number of failing bits and the first threshold of failing bits.
3. The method of claim 2 , wherein determining the second threshold failing bits further comprises combining an initial value of the second threshold of failing bits and the second number of failing bits.
4. The method of claim 2 , further comprising determining whether a threshold of program pulses have been applied to the plurality of storage elements.
5. The method of claim 1 , wherein performing the verify operation comprises applying a verify pulse to the plurality of storage elements.
6. The method of claim 1 , wherein performing the verify operation comprises:
determining a plurality of threshold voltages corresponding to the plurality of storage elements; and
determining whether the plurality of threshold voltages have reached a target threshold voltage distribution.
7. The method of claim 1 , wherein determining the first number of failing bits based on the verify operation comprises determining a number of the plurality of storage elements that have not been programmed to the first program state.
8. A non-transitory machine-readable storage medium storing instructions which, when executed, cause a processor to:
perform a verify operation on a plurality of storage elements of the storage device to determine whether the plurality of storage elements have been programmed to a first program state;
determine a first number of failing bits corresponding to the first program state based on the verify operation;
compare the first number of failing bits with a first threshold of failing bits corresponding to the first program state; and
determine a second threshold of failing bits based at least in part on the first number of failing bits and the comparison, wherein the second threshold of failing bits corresponds to a second program state.
9. The non-transitory machine-readable storage medium of claim 8 , wherein the processor is further to determine a second number of failing bits representative of a difference between the first number of failing bits and the first threshold of failing bits.
10. The non-transitory machine-readable storage medium of claim 9 , wherein updating the second threshold of failing bits comprises combining an initial value of the second threshold of failing bits and the second number of failing bits.
11. The non-transitory machine-readable storage medium of claim 10 , wherein the processor is further to determine whether a threshold of program pulses have been applied to the plurality of storage elements.
12. The non-transitory machine-readable storage medium of claim 10 , wherein to perform the verify operation, the processor is further to apply a verify pulse to the plurality of storage elements.
13. The non-transitory machine-readable storage medium of claim 10 , wherein, to perform the verify operation, the processor is further to:
determine a plurality of threshold voltages corresponding to the plurality of storage elements; and
determine whether the plurality of threshold voltages have reached a target threshold voltage distribution.
14. The non-transitory machine-readable storage medium of claim 10 , wherein to determine the first number of failing bits based on the verify operation, the processor is further to determine a number of the plurality of threshold voltages that have not been programmed to the first program state.
15. A system for programming a storage device, comprising:
at least one processor, to:
perform a verify operation on a plurality of storage elements of the storage device to determine whether the plurality of storage elements have been programmed to a first program state;
determine a first number of failing bits corresponding to the first program state based on the verify operation;
compare the first number of failing bits with a first threshold of failing bits corresponding to the first program state; and
determine a second threshold of failing bits based at least in part on the first number of failing bits and the comparison, wherein the second threshold of failing bits corresponds to a second program state.
16. The system of claim 15 , wherein the processor is further to determine a second number of failing bits representative of a difference between the first number of failing bits and the first threshold of failing bits.
17. The system of claim 15 , wherein to update the second threshold of failing bits, the processor is further to combine an initial value of the second threshold of failing bits and the second number of failing bits.
18. The system of claim 15 , wherein the processor is further to determine whether a threshold of program pulses have been applied to the plurality of storage elements.
19. The system of claim 15 , wherein, to perform the verify operation, the processor is further to:
determine a plurality of threshold voltages corresponding to the plurality of storage elements; and
determine whether the plurality of threshold voltages have reached a target threshold voltage distribution.
20. The system of claim 15 , wherein to determine the first number of failing bits based on the verify operation, the processor is further to determine a number of the plurality of threshold voltages that have not been programmed to the first program state.