Repairing methods of organic light emitting display panels and organic light emitting display panels

1. A repairing method of an organic light emitting display panel, comprising:

a plurality of display pixels arranged in matrix, wherein each of the display pixels is configured with at least one organic light emitting diode (OLED) having a cathode connecting with a first reference voltage;

a driving circuit configured with at least one transistor, wherein a first route end of the transistor connects with power supply wires and connects to a second reference voltage via the power supply wires;

a second route end of the transistor connects with an anode of the OLED;

a control end of the OLED connects with a scanning line to selectively connect the anode of the OLED with the second reference voltage according to control signals applied on the scanning line;

the OLED stays at a dark state in response to a configuration of the first reference voltage and the second reference voltage; and

the repairing method comprises:

identifying unusual light spots on the organic light emitting display panel and determining at least one display pixel corresponding to the unusual light spot as a display pixel required to be repaired;

breaking down a connection between the control end of the transistor on the display pixel required to be repaired and the scanning line by conducting a laser cutting process;

connecting the first route end of the transistor on the display pixel required to be repaired and the second route end, and applying the second reference voltage continuously to the anode of the OLED on the display pixel required to be repair.

2. The repairing method according to claim 1 , wherein the transistor is a thin film transistor (TFT); the control end is a gate of the TFT; the first route end is one of a source and a drain of the TFT and the second route end is the other one of the source and the drain of the TFT;

the gate and the scanning line are arranged on the same layer; the gate protrudes from the scanning line; and

the step of breaking down the connection between the control end of the transistor on the display pixel required to be repaired and the scanning line further comprises:

cutting off a protrusive portion of the gate with respect to the scanning line to break down the connection between the gate and the scanning line.

3. The repairing method according to claim 2 , wherein the TFT further comprise a semiconductor pattern insulated from and overlapped with the gate, and the source and the drain electrically connect with the semiconductor pattern configured on two sides of the gate respectively; and

the step of connecting the first route end of the transistor on the display pixel required to be repaired and the second route end further comprises:

electrically connecting the gate and a breakdown portion of the scanning line with the semiconductor pattern configured on the two sides of the gate respectively.

4. The repairing method according to claim 3 , wherein the semiconductor pattern comprises a first pattern area; an extending direction of the first pattern area is parallel to an extending direction of the scanning line; the gate is perpendicular to the extending direction of the scanning line, and the gate protrudes from the scanning line and partially overlaps with the first pattern area; and

the step of cutting off the protrusive portion of the gate with respect to the scanning line to break down the connection between the gate and the scanning line further comprises:

breaking down the gate within an interval area between the first pattern area of the semiconductor pattern and the scanning line.

5. The repairing method according to claim 4 , wherein an extending direction of power supply wires and the extending direction of the scanning line are parallel with each other;

the semiconductor pattern further comprises a second pattern area, and a first end of the first pattern area connects with a first end of the second pattern area, wherein the first end of the first pattern area and the first end of the second pattern area are adjacent with each other; a second end of the first pattern area connects with the anode via the drain, and a second end of the second pattern area connects with the power supply wires via the source;

the second end of the first pattern area and the second end of the second pattern area face away from each other.

6. The repairing method according to claim 5 , wherein the extending direction of the second pattern area is perpendicular to the first pattern area to form the L-shaped semiconductor pattern.

7. The repairing method according to claim 3 , wherein the anode and the power supply wires are on the same layer, and the gate is configured on a top of the semiconductor pattern in a top-gate form.

8. A repairing method of an organic light emitting display panel, comprising:

a plurality of display pixels arranged in matrix, wherein each of the display pixels is configured with at least one OLED having a cathode connecting with a first reference voltage;

a driving circuit configured with at least one transistor, wherein a first route end of the transistor connects with power supply wires and connects to a second reference voltage via the power supply wires;

a second route end of the transistor connects with an anode of the OLED;

a control end of the OLED connects with a scanning line to selectively connect the anode of the OLED with the second reference voltage according to control signals applied on the scanning line;

the OLED stays at a dark state in response to a configuration of the first reference voltage and the second reference voltage; and

the repairing method comprises:

identifying the display pixels required to be repaired;

breaking down a connection between the control end of the transistor on the display pixel required to be repaired and the scanning line;

connecting the first route end of the transistor on the display pixel required to be repaired and the second route end, and applying the second reference voltage continuously to the anode of the OLED on the display pixel required to be repair.

9. The repairing method according to claim 8 , wherein the step of identifying the display pixels required to be repaired further comprises:

identifying unusual light spots on the organic light emitting display panel;

determining at least one display pixel corresponding to the unusual light spot as a display pixel required to be repaired.

10. The repairing method according to claim 8 , wherein the step of breaking down the connection between the control end of the transistor on the display pixel required to be repaired and the scanning line further comprises:

cutting off a connection between the control end of the transistor on the display pixel required to be repaired and the scanning line by conducting a laser cutting process; and

the step of connecting the first route end of the transistor on the display pixel required to be repaired and the second route end, and applying the second reference voltage continuously to the anode of the OLED on the display pixel required to be repair further comprises:

connecting the first route end of the transistor on the display pixel required to be repaired and the second route end by conducting a laser welding process.

11. The repairing method according to claim 8 , wherein the transistor is a TFT; the control end is a gate of the TFT; the first route end is one of a source and a drain of the TFT and the second route end is the other one of the source and the drain of the TFT; the gate and the scanning line are arranged on the same layer; the gate protrudes from the scanning line;

and the step of breaking down the connection between the control end of the transistor on the display pixel required to be repaired and the scanning line further comprises:

cutting off a protrude portion of the gate with respect to the scanning line to break down the connection of the gate and the scanning line.

12. The repairing method according to claim 11 , wherein the TFT further comprise a semiconductor pattern insulated from and overlapped with the gate, and the source and the drain electrically connect with the semiconductor pattern configured on two sides of the gate respectively; and

the step of connecting the first route end of the transistor on the display pixel required to be repaired and the second route end, and applying the second reference voltage continuously to the anode of the OLED on the display pixel required to be repair further comprises:

electrically connecting the gate and a breakdown portion of the scanning line with the semiconductor pattern configured on the two sides of the gate respectively.

13. The repairing method according to claim 12 , wherein the semiconductor pattern comprises a first pattern area; an extending direction of the first pattern area is parallel to an extending direction of the scanning line; the gate is perpendicular to the extending direction of the scanning line, and the gate protrudes from the scanning line and partially overlaps with the first pattern area; and

the step of cutting off the protrude portion of the gate with respect to the scanning line to break down the scanning line further comprises:

cutting off the gate within an interval area between the first pattern area of the semiconductor pattern and the scanning line.

14. The repairing method according to claim 13 , wherein an extending direction of power supply wires and the extending direction of the scanning line are parallel with each other;

the semiconductor pattern further comprises a second pattern area, and a first end of the first pattern area connects with a first end of the second pattern area, wherein the first end of the first pattern area and the first end of the second pattern area are adjacent with each other;

a second end of the first pattern area connects with the anode via the drain, and a second end of the second pattern area connects with the power supply wires via the source;

the second end of the first pattern area and the second end of the second pattern area face away from each other.

15. The repairing method according to claim 14 , wherein the extending direction of the second pattern area is perpendicular to the first pattern area to form the L-shaped semiconductor pattern.

16. The repairing method according to claim 12 , wherein the anode and the power supply wires are on the same layer, and the gate is configured on a top of the semiconductor pattern in a top-gate form.

17. An organic light emitting display panel, comprising:

a plurality of display pixels arranged in matrix, wherein each of the display pixels is configured with at least one organic light emitting diode (OLED) having a cathode connecting with a first reference voltage;

a driving circuit configured with at least one transistor, wherein a first route end of the transistor connects with power supply wires and connects to a second reference voltage via the power supply wires;

a second route end of the transistor connects with an anode of the OLED;

a connection between the control end of the transistor and the scanning line is broken down, and the first route end of the transistor is connected to the second route end to apply the second reference voltage continuously to the anode of the OLED on the display pixel.