Structure status determination device, status determination system, and status determination method
The purpose of the present invention is to accurately detect, from a remote location without contact, a structure's defects such as cracking, separation, and internal cavities by distinguishing therebetween. The status determination device includes: a displacement calculation unit that, from time-series images of a structure surface before and after loading application, calculates a two-dimensional spatial distribution of a displacement of the time-series images; a depth moving amount calculation unit that calculates a moving amount of the structure surface in a normal direction due to the loading application, from the two-dimensional spatial distribution of the displacement of the time-series images; a displacement separation unit that calculates a correction amount based on the moving amount, and separates a two-dimensional spatial distribution of a displacement of the structure surface, by subtracting the correction amount from the two-dimensional spatial distribution of the displacement of the time-series images; and an abnormality determination unit that identifies a defect of the structure, based on comparison of the two-dimensional spatial distribution of the displacement of the structure surface and the moving amount, with a spatial distribution of a displacement having been prepared in advance and a threshold value for the moving amount.
1. A status determination device comprising:
a displacement calculation circuit that, from time-series images of a structure surface before and after loading application, calculates a two-dimensional spatial distribution of a displacement of the time-series images;
a depth moving amount calculation circuit that calculates a moving amount of the structure surface in a normal direction due to the loading application, from the two-dimensional spatial distribution of the displacement of the time-series images;
a displacement separation circuit that calculates a correction amount based on the moving amount, and separates a two-dimensional spatial distribution of a displacement of the structure surface, by subtracting the correction amount from the two-dimensional spatial distribution of the displacement of the time-series images; and
an abnormality determination circuit that identifies a defect of the structure, based on comparison of the two-dimensional spatial distribution of the displacement of the structure surface and the moving amount, with a spatial distribution of a displacement having been prepared in advance and a threshold value for the moving amount.
2. The status determination device according to claim 1 , wherein
the depth moving amount calculation circuit estimates a tilt angle of the structure from the time-series images, and calculates the moving amount corrected using the tilt angle.
3. The status determination device according to claim 1 , comprising:
a differential displacement calculation circuit that calculates a two-dimensional differential spatial distribution from the two-dimensional spatial distribution of the displacement of the structure surface, wherein
the abnormality determination circuit identifies a defect of the structure, based on comparison between the two-dimensional differential spatial distribution and a differential spatial distribution of a differential displacement having been prepared in advance.
4. The status determination device according to claim 1 , wherein
the abnormality determination circuit identifies a defect of the structure, based on a temporal change of the two-dimensional spatial distribution of the displacement of the structure surface.
5. The status determination device according to claim 3 , wherein
the abnormality determination circuit identifies a defect of the structure, based on a temporal change of the two-dimensional differential spatial distribution.
6. The status determination device according to claim 1 , comprising:
an abnormality map creation circuit that creates an abnormality map that represents a location and a type of the defect, based on a determination result of the abnormality determination circuit.
7. A status determination system comprising:
a status determination device according to claim 1 ; and
an image-capture device that captures the time-series images and provides the status determination device with the time-series images.
8. A status determination method comprising:
calculating, from time-series images of a structure surface before and after loading application, a two-dimensional spatial distribution of a displacement of the time-series images;
calculating a moving amount of the structure surface in a normal direction due to the loading application, from the two-dimensional spatial distribution of the displacement of the time-series images;
calculating a correction amount based on the moving amount;
separating a two-dimensional spatial distribution of a displacement of the structure surface, by subtracting the correction amount from the two-dimensional spatial distribution of the displacement of the time-series images; and
identifying a defect of the structure, based on comparison of the two-dimensional spatial distribution of the displacement of the structure surface and the moving amount, with a spatial distribution of a displacement having been prepared in advance and a threshold value for the moving amount.
9. A status determination device comprising:
a displacement calculation circuit that, from time-series images of a structure surface before and after loading application, calculates a two-dimensional spatial distribution of a displacement of the time-series images;
a depth moving amount calculation circuit that calculates a moving amount of the structure surface in a normal direction due to the loading application, from the two-dimensional spatial distribution of the displacement of the time-series images;
a displacement separation circuit that calculates a correction amount based on the moving amount, and separates a two-dimensional spatial distribution of a displacement of the structure surface, by subtracting the correction amount from the two-dimensional spatial distribution of the displacement of the time-series images; and
an abnormality determination circuit that identifies a defect of the structure, based on comparison between the moving amount and a threshold value for the moving amount having been prepared in advance.