IP Library › Granted Patent US 10,290,391
Granted Patent B2
US 10,290,391 · App. 15/576,383 · Granted May 14, 2019

Transparent conductive film

Inventors: Daiki Kato (Ibaraki, JP); Nozomi Fujino (Ibaraki, JP); Tomotake Nashiki (Ibaraki, JP)
Assignee: NITTO DENKO CORPORATION
H01B5/14B32B7/02G06F3/041B32B2307/202B32B2307/412
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,290,391
App. No.
15/576,383
Granted
May 14, 2019
Kind
B2
Abstract

A transparent conductive film includes: a transparent substrate film; an antistripping layer with a thickness of 1.5 nm to 8 nm formed on one main surface of the substrate film; an optical adjustment layer with a thickness of 10 nm to 25 nm formed on the antistripping layer; and a transparent conductor layer with a pattern formed on the optical adjustment layer. The transmission Y value measured from a side of the transparent conductor layer is 88.0 or more and the reflection color difference ΔE between a pattern portion and a non-pattern portion is 7.0 or less.

Claims (30)

1. A transparent conductive film comprising:

a transparent substrate film;

an antistripping layer formed on one main surface of the substrate film;

an optical adjustment layer including an inorganic oxide formed on the antistripping layer; and

a transparent conductor layer having a pattern formed on the optical adjustment layer,

wherein the pattern includes a pattern portion with the transparent conductor layer and a non-pattern portion without the transparent conductor layer,

the antistripping layer has a thickness of 1.5 nm to 8 nm,

the substrate film has a thermal shrinkage of −0.5% to +1.5% in the main surface;

a transmission Y value measured from a side of the transparent conductor layer is 88.0 or more, and

a reflection color difference ΔE between the pattern portion and the non-pattern portion represented by the following formula (1) is 7.0 or less:

Δ E =[( L* 1 −L* 2 ) 2 +( a* 1 −a* 2 ) 2 +( b* 1 −b* 2 ) 2 ] 0.5   (1)

wherein L* 1 represents a reflection L* value of the pattern portion, L* 2 represents a reflection L* value of the non-pattern portion, a* 1 represents a reflection a* 1 value of the pattern portion, a* 2 represents a reflection a* 2 value of the non-pattern portion, b* 1 represents a reflection b* 1 value of the pattern portion, and b* 2 represents a reflection value b* 2 of the non-pattern portion.

2. The transparent conductive film according to claim 1 , wherein the optical adjustment layer has a thickness of 10 nm to 25 nm.

3. The transparent conductive film according to claim 1 , wherein the antistripping layer includes a non-stoichiometric inorganic compound.

4. The transparent conductive film according to claim 1 , wherein the antistripping layer includes silicon atoms.

5. The transparent conductive film according to claim 1 , wherein the antistripping layer includes a silicon compound.

6. The transparent conductive film according to claim 4 , wherein bond energy of a Si2p bond has an area of 98.0 eV or more to less than 103.0 eV.

7. The transparent conductive film according to claim 1 , wherein the antistripping layer includes a silicon oxide.

8. The transparent conductive film according to claim 1 , further comprising a hard coat layer formed between the substrate film and the antistripping layer.

9. The transparent conductive film according to claim 8 , wherein the hard coat layer has a refractive index of 1.60 to 1.70 and a thickness of 250 nm to 2,000 nm.

10. The transparent conductive film according to claim 8 , wherein the hard coat layer contains any one of zirconium oxide ZrO 2 , silicon dioxide SiO 2 , titanium oxide TiO 2 , tin oxide SnO 2 , aluminum oxide Al 2 O 3 or at least two kinds of inorganic fine particles of these.

11. The transparent conductive film according to claim 1 , further comprising a functional layer formed on the other main surface of the substrate film located on a side opposite to the transparent conductor layer.

12. The transparent conductive film according to claim 11 , wherein the functional layer is composed of an anti-blocking hard coat layer.

13. The transparent conductive film according to claim 2 , wherein the antistripping layer includes a non-stoichiometric inorganic compound.

14. The transparent conductive film according to claim 5 , wherein bond energy of a Si2p bond has an area of 98.0 eV or more to less than 103.0 eV.

15. The transparent conductive film according to claim 2 , wherein the antistripping layer includes a silicon oxide.

16. The transparent conductive film according to claim 2 , wherein the substrate film has a thermal shrinkage of −0.5% to +1.5% in the main surface.

17. The transparent conductive film according to claim 9 , wherein the hard coat layer contains any one of zirconium oxide ZrO2, silicon dioxide SiO 2 , titanium oxide TiO 2 , tin oxide SnO 2 , aluminum oxide Al 2 O 3 or at least two kinds of inorganic fine particles of these.

18. The transparent conductive film according to claim 2 , further comprising a functional layer formed on the other main surface of the substrate film located on a side opposite to the transparent conductor layer.

19. The transparent conductive film according to claim 18 , wherein the functional layer is composed of an anti-blocking hard coat layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 22, 2017
From: KATO, DAIKI; FUJINO, NOZOMI; NASHIKI, TOMOTAKE
To: NITTO DENKO CORPORATION
Reel/Frame 044198/0442 →
Priority Claims (2)
JP 2015-106977 · May 27, 2015 · national
JP 2015-203516 · Oct 15, 2015 · national
Continuity (1)
Related Publication 20180211744A1 · Jul 26, 2018