Viscoelasticity calculation system and viscoelasticity measurement method
An object of the present invention is to provide a technique of quantitatively measuring physical properties including both of viscosity and elasticity. A viscoelasticity measurement system includes a measurement apparatus, a processor, and a display apparatus. The measurement apparatus includes a movable unit continuously pressed against a measurement object, a first sensor outputting acceleration information corresponding to an acceleration of pressing-directional movement of a contact portion of the movable unit with respect to the measurement object, and a second sensor outputting reactive force information corresponding to a reactive force applied to the contact portion of the movable unit with respect to the measurement object. The processor calculates first information on an elasticity component of the measurement object and second information on a viscosity component of the measurement object based on the acceleration information and the reactive force information. The display apparatus displays the first information and the second information.
1. A viscoelasticity measurement system comprising:
a measurement apparatus including a movable unit continuously pressed against a measurement object, a first sensor outputting acceleration information corresponding to an acceleration of pressing-directional movement of a contact portion of the movable unit with respect to the measurement object, and a second sensor outputting reactive force information corresponding to a reactive force applied to the contact portion of the movable unit with respect to the measurement object;
a processor calculating first information on an elasticity component of the measurement object and second information on a viscosity component of the measurement object based on the acceleration information and the reactive force information; and
a display apparatus displaying the first information and the second information,
wherein the processor calculates a complex elastic modulus of the measurement object by using an acceleration waveform acquired as the acceleration information and a second-order differential waveform of a voltage waveform acquired as the reactive force information,
the processor calculates a phase difference between the acceleration waveform and the second-order differential waveform by using the acceleration waveform and the second-order differential waveform, and
the processor calculates the first information and the second information by using the complex elastic modulus and the phase difference.
2. The viscoelasticity measurement system according to claim 1 ,
wherein the processor calculates a delay time difference between the acceleration waveform and the second-order differential waveform based on a cross-correlation function of the acceleration waveform and the second-order differential waveform, and
the processor converts the delay time difference into the phase difference by using a frequency at which the movable unit is pressed against the measurement object.
3. The viscoelasticity measurement system according to claim 1 ,
wherein the processor calculates a delay time difference between the acceleration waveform and the second-order differential waveform based on a cross-power spectrum phase function between the acceleration waveform and the second-order differential waveform, and
the processor converts the delay time difference into the phase difference by using a frequency at which the movable unit is pressed against the measurement object.
4. The viscoelasticity measurement system according to claim 1 ,
wherein the processor calculates a delay time difference between a maximum changing point of the second-order differential waveform and a maximum changing point of the acceleration waveform, and
the processor converts the delay time difference into the phase difference by using a frequency at which the movable unit is pressed against the measurement object.
5. The viscoelasticity measurement system according to claim 4 ,
wherein the processor divides the second-order differential waveform and the acceleration waveform into a plurality of intervals by using a first-order differential waveform of the voltage waveform, and
the processor calculates the maximum changing point of the second-order differential waveform and the maximum changing point of the acceleration waveform for each of the plurality of intervals.
6. The viscoelasticity measurement system according to claim 1 ,
wherein the processor calculates a voltage/displacement conversion coefficient indicating a ratio of a magnitude of the acceleration waveform to a magnitude of the second-order differential waveform, and
the processor calculates the complex elastic modulus by dividing, by the voltage/displacement conversion coefficient, a voltage/pressure conversion coefficient to be previously obtained.
7. A viscoelasticity measurement system comprising:
a measurement apparatus including a movable unit continuously pressed against a measurement object, a first sensor outputting acceleration information corresponding to an acceleration of pressing-directional movement of a contact portion of the movable unit with respect to the measurement object, and a second sensor outputting reactive force information corresponding to a reactive force applied to the contact portion of the movable unit with respect to the measurement object;
a processor calculating first information on an elasticity component of the measurement object and second information on a viscosity component of the measurement object based on the acceleration information and the reactive force information; and
a display apparatus displaying the first information and the second information,
wherein the processor divides an acceleration waveform acquired as the acceleration information into a plurality of intervals by using a first-order differential waveform of a voltage waveform acquired as the reactive force information,
the processor obtains a first time zone corresponding to pressing of the measurement apparatus and a second time zone corresponding to releasing of the measurement apparatus in the plurality of intervals of the acceleration waveform, and
the processor calculates the second information from a ratio between a change amount of the voltage waveform in the first time zone and a change amount of the voltage waveform in the second time zone.
8. A viscoelasticity measurement system comprising:
a measurement apparatus including a movable unit continuously pressed against a measurement object, a first sensor outputting acceleration information corresponding to an acceleration of pressing-directional movement of a contact portion of the movable unit with respect to the measurement object, and a second sensor outputting reactive force information corresponding to a reactive force applied to the contact portion of the movable unit with respect to the measurement object;
a processor calculating first information on an elasticity component of the measurement object and second information on a viscosity component of the measurement object based on the acceleration information and the reactive force information; and
a display apparatus displaying the first information and the second information,
wherein the processor divides an acceleration waveform acquired as the acceleration information into a plurality of intervals by using a first-order differential waveform of a voltage waveform acquired as the reactive force information,
the processor obtains a first time zone corresponding to pressing of the measurement apparatus and a second time zone corresponding to releasing of the measurement apparatus in the plurality of intervals of the acceleration waveform, and
the processor calculates the second information from a ratio between a change amount of the acceleration waveform in the first time zone and a change amount of the acceleration waveform in the second time zone.
9. A viscoelasticity measurement system comprising:
A measurement apparatus including a movable unit continuously pressed against a measurement object, a first sensor outputting acceleration information corresponding to an acceleration of pressing-directional movement of a contact portion of the movable unit with respect to the measurement object, and a second sensor outputting reactive force information corresponding to a reactive force applied to the contact portion of the movable unit with respect to the measurement object;
a processor calculating first information on an elasticity component of the measurement object and second information on a viscosity component of the measurement object based on the acceleration information and the reactive force information; and
a display apparatus displaying the first information and the second information,
wherein the processor obtains an ascending interval and a descending interval of a voltage waveform acquired as the reactive force information by using a first-order differential waveform of the voltage waveform, and
the processor calculates the second information from a ratio between a time of the ascending interval and a time of the descending interval.