Method and structure to enable dual channel Fin critical dimension control
A method for manufacturing a semiconductor device includes forming a first semiconductor layer on a substrate having a {100} crystallographic surface orientation, forming a second semiconductor layer on the substrate, patterning the first semiconductor layer and the second semiconductor layer into a first plurality of fins and a second plurality of fins, respectively, wherein the first and second plurality of fins extend vertically with respect to the substrate, covering the first plurality of fins and a portion of the substrate corresponding to the first plurality of fins, and epitaxially growing semiconductor layers on exposed portions of the second plurality of fins and on exposed portions of the substrate, wherein the epitaxially grown semiconductor layers on the exposed portions of the second plurality of fins increase a critical dimension of each of the second plurality of fins.
1. A semiconductor device, comprising:
a substrate having a {100} crystallographic surface orientation;
a first plurality of fins comprising a first semiconductor material; and
a second plurality of fins comprising a second semiconductor material different from the first semiconductor material, wherein:
the first and second plurality of fins extend vertically with respect to the substrate;
the second plurality of fins each comprise a conformal semiconductor layer on lateral sides thereof; and
the first plurality of fins has the same or substantially the same lateral critical dimension as the second plurality of fins combined with the conformal semiconductor layer on the lateral sides thereof.
2. The semiconductor layer according to claim 1 , wherein the conformal semiconductor layer extends onto the substrate adjacent each of the second plurality of fins.
3. The semiconductor layer according to claim 1 , wherein a thickness of the conformal semiconductor layer on the lateral sides of a given fin of the second plurality of fins is the same or substantially the same as a difference between the lateral critical dimension of the first plurality of fins and the second plurality of fins.
4. The semiconductor device according to claim 1 , wherein the first plurality of fins comprise silicon.
5. The semiconductor device according to claim 1 , wherein the second plurality of fins comprise silicon germanium.
6. The semiconductor device according to claim 5 , wherein the conformal semiconductor layer comprises silicon germanium.
7. The semiconductor device according to claim 6 , wherein the conformal semiconductor layer comprises a different concentration of germanium than the second plurality of fins.
8. The semiconductor device according to claim 6 , wherein the conformal semiconductor layer comprises the same silicon germanium composition as the second plurality of fins.
9. The semiconductor device according to claim 1 , further comprising a gate structure on a portion of each of the first plurality of fins and the second plurality of fins.
10. The semiconductor device according to claim 1 , further comprising a contact region between each of the first and second plurality of fins.
11. A semiconductor device, comprising:
a substrate;
a first plurality of fins comprising a first semiconductor material; and
a second plurality of fins comprising a second semiconductor material different from the first semiconductor material, wherein:
the first and second plurality of fins extend vertically with respect to the substrate;
the second plurality of fins each comprise a conformal semiconductor layer on lateral sides thereof; and
the first plurality of fins has the same or substantially the same lateral critical dimension as the second plurality of fins combined with the conformal semiconductor layer on the lateral sides thereof.
12. The semiconductor layer according to claim 11 , wherein the conformal semiconductor layer extends onto the substrate adjacent each of the second plurality of fins.
13. The semiconductor layer according to claim 11 , wherein a thickness of the conformal semiconductor layer on the lateral sides of a given fin of the second plurality of fins is the same or substantially the same as a difference between the lateral critical dimension of the first plurality of fins and the second plurality of fins.
14. The semiconductor device according to claim 11 , wherein the first plurality of fins comprise silicon.
15. The semiconductor device according to claim 11 , wherein the second plurality of fins comprise silicon germanium.
16. The semiconductor device according to claim 15 , wherein the conformal semiconductor layer comprises silicon germanium.
17. The semiconductor device according to claim 16 , wherein the conformal semiconductor layer comprises a different concentration of germanium than the second plurality of fins.
18. The semiconductor device according to claim 16 , wherein the conformal semiconductor layer comprises the same silicon germanium composition as the second plurality of fins.
19. The semiconductor device according to claim 11 , further comprising a gate structure on a portion of each of the first plurality of fins and the second plurality of fins.
20. The semiconductor device according to claim 11 , further comprising a contact region between each of the first and second plurality of fins.