Method and device for using an organic underlayer to enable crystallization of disordered organic thin films
Measurements on organic single crystals reveal remarkable optical and electrical characteristics compared to disordered films but practical device applications require uniform, pinhole-free films. Disclosed herein is a process to reliably convert as-deposited amorphous thin films to ones that are highly crystalline, with grains on the order of hundreds of microns. The disclosed method results in films that are pinhole-free and that possess grains that individually are single crystal domains.
1. A film structure, comprising:
An underlayer comprising a first organic material having a first glass transition temperature; and
a first layer at least partially connected to at least one surface of the underlayer, the first layer comprising a polycrystalline organic material;
wherein the underlayer has a first glass transition temperature between and including 70 to 90 degrees C., and
wherein the first layer has a mean thickness between and including 10 and 100 nm, and wherein the first layer comprises single colored grains as determined using a polarized optical microscope, each grain having a size between and including 100 micron and 10 mm.
2. The film structure according to claim 1 , wherein the first organic material is at least one of Tris[4-(5-phenylthiophen-2-yl)phenyl]amine (TPTPA), 4,4″,4″-Tris[phenyl(m-tolyl)amino]triphenylamine (m-MTDATA).
3. The film structure according to claim 1 , wherein the polycrystalline organic material is selected from the group consisting of rubrene or subphthalocyanine chloride (SubPc).
4. The film structure according to claim 1 further comprising a second layer comprising a crystalline material at least partially connected to a surface of the first layer, the second layer having a grain size between and including 100 nm to 10 mm.
5. The film structure according to claim 4 , wherein the crystalline material is C 60 .